Conductive pad with ion exchange membrane for electrochemical mechanical polishing
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
B23H-005/06
B23H-005/00
B23H-003/00
B24D-011/02
C25F-003/30
C25F-003/00
B24B-049/00
H05K-003/07
출원번호
US-0555145
(2006-10-31)
등록번호
US-7344432
(2008-03-18)
발명자
/ 주소
Chen,Liang Yun
Wang,Yuchun
Wang,Yan
Duboust,Alain
Carl,Daniel A.
Wadensweiler,Ralph
Birang,Manoocher
Butterfield,Paul D.
Mavliev,Rashid A.
Tsai,Stan D.
Wang,You
Diao,Jie
Jia,Renhe
Karuppiah,Lakshmanan
Ewald,Robert
출원인 / 주소
Applied Materials, Inc.
대리인 / 주소
Patterson & Sheridan
인용정보
피인용 횟수 :
0인용 특허 :
155
초록▼
An article of manufacture and apparatus are provided for processing a substrate surface. In one aspect, an article of manufacture is provided for polishing a substrate including polishing article comprising a body having at least a partially conductive polishing surface. An electrode is disposed bel
An article of manufacture and apparatus are provided for processing a substrate surface. In one aspect, an article of manufacture is provided for polishing a substrate including polishing article comprising a body having at least a partially conductive polishing surface. An electrode is disposed below the polishing surface having a dielectric material therebetween. A plurality of apertures may be formed in the polishing surface and the dielectric material to at least partially expose the electrode to the polishing surface. A membrane may be disposed between the electrode and the polishing surface that is permeable to ions and current to promote continuity between the electrode and the polishing surface.
대표청구항▼
What is claimed is: 1. An article of manufacture for polishing a substrate, comprising: a polishing surface adapted to contact the substrate; an electrode disposed below the polishing surface; and a planar membrane disposed between the polishing surface and the electrode, wherein the polishing sur
What is claimed is: 1. An article of manufacture for polishing a substrate, comprising: a polishing surface adapted to contact the substrate; an electrode disposed below the polishing surface; and a planar membrane disposed between the polishing surface and the electrode, wherein the polishing surface is at least partially conductive. 2. The article of claim 1, wherein the polishing surface is coupled to a power source. 3. The article of claim 1, wherein the polishing surface comprises a conductive film. 4. The article of claim 1, wherein the polishing surface comprises a tin material. 5. The article of claim 1, wherein the polishing surface includes a plurality of perforations formed therein, a plurality of grooves disposed therein, or both. 6. The article of claim 5, wherein at least a portion of the plurality of grooves intersect with at least a portion of a plurality of perforations disposed in the polishing surface of the polishing article. 7. The article of claim 1, wherein the membrane is permeable to ions. 8. The article of claim 1, wherein the membrane comprises a sulfonated tetrafluoroethylene material. 9. The article of claim 1, further comprising: a membrane support member between the membrane and the electrode. 10. The article of claim 9, wherein the membrane support member includes a plurality of channels and a plurality of perforations. 11. The article of claim 10, wherein at least one of the plurality of channels intersects with at least one of the plurality of perforations. 12. An article of manufacture for polishing a substrate, comprising: a perforated dielectric support layer; a perforated conductive material layer disposed on the perforated dielectric support layer; an electrode disposed below the dielectric support layer; and a membrane disposed between the electrode and the perforated dielectric support layer, wherein the membrane is substantially parallel to one of the conductive material layer, or the electrode. 13. The article of claim 12, wherein the membrane comprises a sulfonated tetrafluoroethylene material. 14. The article of claim 12, wherein the membrane is permeable to ions. 15. The article of claim 12, wherein the membrane is permeable to cations. 16. The article of claim 12, further comprising: a membrane support member disposed between the membrane and the electrode, wherein the membrane support member includes a plurality of perforations. 17. The article of claim 16, wherein the membrane support member comprises a plurality of channels in communication with at least one of the plurality of perforations. 18. The article of claim 16, wherein the membrane support member includes a center hole which intersects with a portion of the plurality of channels. 19. An article of manufacture for polishing a substrate, comprising: a polishing surface adapted to contact the substrate; an electrode disposed below the polishing surface; and a membrane disposed between the polishing surface and the electrode, wherein the membrane is permeable to ions and is in a substantially parallel orientation relative to the electrode. 20. The article of claim 19, wherein the polishing surface is at least partially conductive. 21. The article of claim 19, wherein the polishing surface is coupled to a power source. 22. The article of claim 19, wherein the polishing surface comprises a conductive film. 23. The article of claim 19, wherein the polishing surface comprises a tin material. 24. The article of claim 19, wherein the polishing surface includes a plurality of perforations formed therein, a plurality of grooves disposed therein, or both. 25. The article of claim 24, wherein at least a portion of the plurality of grooves intersect with at least a portion of a plurality of perforations disposed in the polishing surface of the polishing article. 26. The article of claim 19, wherein the membrane is permeable to ions. 27. The article of claim 19, wherein the membrane comprises a sulfonated tetrafluoroethylene material. 28. The article of claim 19, further comprising: a membrane support member between the membrane and the electrode. 29. The article of claim 28, wherein the membrane support member includes a plurality of channels and a plurality of perforations. 30. The article of claim 29, wherein at least one of the plurality of channels intersects with at least one of the plurality of perforations.
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