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In a method for estimating a condition of an electronic device, a model correlating at least one utilization metric of a component of the electronic device and the condition of the component to be estimated is formulated. In addition, the at least one utilization metric of the component is detected

In a method for estimating a condition of an electronic device, a model correlating at least one utilization metric of a component of the electronic device and the condition of the component to be estimated is formulated. In addition, the at least one utilization metric of the component is detected and the condition of the component and the electronic device are estimated based upon the formulated model with the detected at least one utilization metric as an input to the formulated model.

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What is claimed is: 1. A method for estimating a condition of an electronic device, said method comprising: identifying a nonlinear relationship between at least one utilization metric of a component of the electronic device and the condition of a component to be estimated, wherein the condition co

What is claimed is: 1. A method for estimating a condition of an electronic device, said method comprising: identifying a nonlinear relationship between at least one utilization metric of a component of the electronic device and the condition of a component to be estimated, wherein the condition comprises at least one of a power consumption level and a temperature of the component; formulating a linear model correlating the at least one utilization metric of the component of the electrical device and the at least one of the power consumption level and the temperature of the component to be estimated from the nonlinear relationship; detecting the at least one utilization metric of the component; estimating the at least one of the power consumption level and the temperature of the component based upon the formulated model with the detected at least one utilization metric as an input to the formulated model, and estimating at least one of a power consumption level and a temperature of the electronic device from the estimated at least one of the power consumption level and the temperature of the component. 2. The method according to claim 1, wherein formulating the linear model further comprises: determining trends in the nonlinear relationships between the at least one utilization metric and the at least one power consumption level and the temperature of the component to be estimated; and formulating the linear model based upon the trends in the nonlinear relationship. 3. The method according to claim 1, wherein detecting the at least one utilization metric further comprises detecting the at least one utilization metric with at least one of equipment and software originally supplied with the component of the electronic device. 4. The method according to claim 1, wherein detecting the at least one utilization metric comprises detecting at least one of CPU utilization, memory utilization, disk traffic, and network traffic. 5. The method according to claim 1, wherein the component comprises a processor having multiple power states, and wherein formulating the linear model further comprises utilizing a different weighting factor for each of the multiple power states, wherein the different weighting factors define the linear model from the nonlinear relationship between the at least one utilization metric and the at least one of the power consumption and the temperature of the processor. 6. The method according to claim 1, wherein the component comprises a disk drive, and wherein the at least one utilization metric comprises a data transfer rate of the disk drive, and wherein estimating the condition further comprises estimating at east one of a power consumption level and a temperature of the disk drive. 7. The method according to claim 1, further comprising: identifying nonlinear relationships between a plurality of utilization metrics of a plurality of components of the electronic device and the at least one of power consumption levels and temperatures of the plurality of components to be estimated; formulating linear models correlating the plurality of utilization metrics of a plurality of components to be estimated; detecting the plurality of utilization metrics for the plurality of components; estimating at least one of the power consumption levels and the temperatures of the plurality of components based upon the formulated models with the detected plurality of utilization metrics as inputs to the formulated models; and summing the estimated at least one of the power consumption levels and the temperatures of the plurality of components to estimate the at least one of the power consumption level and the temperature of the electronic device. 8. The method according to claim 1, wherein the electronic device comprises a blade server, and wherein estimating the at least one of the power consumption level and the temperature of the electronic device further comprises estimating at least one of a power consumption level and a temperature of the blade server. 9. The method according to claim 8, wherein the blade server comprises a plurality of processors, each of said plurality of processors having multiple power states, said method further comprising: formulating a linear model for each of the plurality of processors utilizing different weighting factors for each of the multiple power states, wherein the different weighting factors define a linear model from the nonlinear relationships between each of the at least one utilization metric and at least one of a power consumption level and a temperature of each of the processors. 10. A computer implemented system for estimating a condition of an electronic device, said system comprising: a module for identifying a nonlinear relationship between at least one utilization metric of a component of the electronic device and the condition of a component to be estimated, wherein the condition comprises at least one of a power consumption level and a temperature of the components; a module for formulating a linear model correlating the at least one utilization metric and the at least one of the power consumption level and the temperature of the component to be estimated from the nonlinear relationship; a module for estimating the at least one of the power consumption level and the temperature of the component; at least one of equipment and software for detecting the at least one utilization metric, wherein the at least one of the equipment and the software is originally supplied with the component of the electronic; and a controller for implementing the linear model formulation module to formulate the linear model, and wherein the controller is further configured to implement the module for estimating the at least one of the power consumption level and the temperature of the component based upon the formulated linear model with the at least one utilization metric detected by the at least one of equipment and software for monitoring as an input to the formulation model, and wherein the controller is further configured to estimate at least one of a power consumption level and a temperature of the electronic device from the estimated at least one of the power consumption level and the temperature of the component. 11. The system according to claim 10, wherein the controller is further configured to implement the correlation determination module to determine trends in correlations between the at least one utilization metric and the at least one of the power consumption level and the temperature of the component to be estimated and to formulate the linear model based upon the determined trends. 12. The system according to claim 10, wherein the at least one utilization metric comprises at least one of CPU utilization, memory utilization, disk traffic, and network traffic. 13. The system according to claim 10, wherein the module for estimating the condition comprises at least one of a power consumption estimation module and a temperature estimation module. 14. The system according to claim 10, wherein the module for estimating the condition comprises a module for estimating power consumption and wherein the controller is further configured to implement the module for estimating power consumption to estimate the power consumption level of the component. 15. The system according to claim 10, wherein the module for estimating the condition comprises a module for estimating temperature and wherein the controller is further configured to implement the module for estimating temperature to estimate the temperature of the component. 16. The system according to claim 10, wherein the component comprises a processor of the electronic device, wherein the process has multiple power states, and wherein the controller is configured to implement the linear model formulating module to utilize different weighting factors for each of the multiple power states, wherein the different weighting factors define the linear model from the nonlinear relationship between the at least one utilization metric and the at least one of a power consumption level and a temperature of the processor. 17. The system according to claim 16, wherein the at least one utilization metric comprises load on the processor. 18. The system according to claim 10, wherein the component comprises a memory of the electronic device, and wherein the controller is configured to estimate at least one of a power consumption level and a temperature of the processor. 19. The system according to claim 18, wherein the at least one utilization metric comprises a data transfer rate of the disk drive. 20. A computer program product embodied on a computer-readable medium and comprising code that, when executed, causes a computer to perform the following: identifying a nonlinear relationship between at least one utilization metric of a component of the electrical device and the condition of a component to be estimated, wherein the condition comprises at least one of a power consumption level and a temperature of the component; formulating a linear model correlating the at least one utilization metric of the component of the electronic device and the at least one of the power consumption level and the temperature of the component to be estimated from the nonlinear relationship; detecting the at least one utilization metric of the component with at least one of equipment and software originally supplied with the component; estimating the at least one of the power consumption level and the temperature of the component based upon the formulated model with the detected at least one utilization metric as an input to the formulated model; and estimating at least one of a power consumption and a temperature of the electronic device from the estimated at least one of the power consumption level and the temperature of the component.