Fourier transform spectrometry with a single-aperture interferometer
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01J-003/45
G01B-009/02
출원번호
US-0066384
(2005-02-28)
등록번호
US-7352470
(2008-04-01)
발명자
/ 주소
Kendrick,Richard Lee
Smith,Eric H.
출원인 / 주소
Lockheed Martin Corporation
대리인 / 주소
McDermott Will & Emery LLP
인용정보
피인용 횟수 :
2인용 특허 :
10
초록▼
A spectrometer that implements the functionality of a Fizeau interferometer, the spectrometer including a collection device that is configured to collect a wavefront, a deformable mirror disposed at an image plane of the collection device, the deformable mirror having a plurality of sections, at lea
A spectrometer that implements the functionality of a Fizeau interferometer, the spectrometer including a collection device that is configured to collect a wavefront, a deformable mirror disposed at an image plane of the collection device, the deformable mirror having a plurality of sections, at least one of which is deformed to form interference patterns on the wavefront at the image plane, and a Fourier transformation module configured to derive spectral information from the interference patterns.
대표청구항▼
What is claimed is: 1. A spectrometer comprising: a collection device that is configured to collect a wavefront, the collection device having an entrance pupil; a deformable mirror disposed at an image of the entrance pupil, the deformable mirror having a plurality of sections, at least one of whic
What is claimed is: 1. A spectrometer comprising: a collection device that is configured to collect a wavefront, the collection device having an entrance pupil; a deformable mirror disposed at an image of the entrance pupil, the deformable mirror having a plurality of sections, at least one of which is deformed to form interference patterns at an image plane of the collection device; and a Fourier transformation module configured to derive spectral information from the interference patterns. 2. The spectrometer of claim 1, wherein the at least one deformed section introduces a changed path length to a corresponding section of the wavefront so as to form an interference pattern. 3. The spectrometer of claim 1, wherein the deformable mirror is a deformable continuous face sheet mirror. 4. The spectrometer of claim 1, wherein the deformable mirror is comprised of a plurality of deformable mirror segments. 5. The spectrometer of claim 1, wherein the deformable mirror is comprised of a liquid crystal variable-phase retarding element. 6. The spectrometer of claim 1, wherein each of the plurality of sections of the deformable mirror is deformable in accordance with an input signal provided by a controller. 7. The spectrometer of claim 6, wherein the controller controls the input signals to deform the plurality of sections in accordance with one of a plurality of predetermined patterns. 8. The spectrometer of claim 1, wherein the Fourier transformation module is configured to Fourier transform the interference patterns to derive the spectral information. 9. The spectrometer of claim 8, wherein, to derive the spectral information, the Fourier transform module is configured to Fourier transform the interference patterns while the plurality of sections are consecutively deformed in accordance with a plurality of predetermined deformation patterns. 10. The spectrometer of claim 1, wherein the Fourier transformation module is configured to generate a spectrogram of the wavefront. 11. The spectrometer of claim 1, wherein the Fourier transformation module includes an image-capture array disposed at the image plane configured to capture images of the interference pattern. 12. The spectrometer of claim 11, wherein the image-capture array includes a charge-coupled device (CCD) array or a complimentary metal oxide (CMOS) array. 13. The spectrometer of claim 1, wherein the Fourier transformation module executes software code configured to perform the Fourier transformation. 14. The spectrometer of claim 1, wherein the Fourier transformation module includes an electronic hardware configured to perform the Fourier transformation. 15. The spectrometer of claim 1, wherein the collection device is a telescope. 16. The spectrometer of claim 1, wherein the spectrometer is configured to be deployed in space. 17. The spectrometer of claim 1, wherein each section of the deformable mirror is configured to collect a select portion of the wavefront, and the Fourier transformation module is configured to derive spectral information of the wavefront from interference patterns of the select portions of the wavefront. 18. A method for deriving a spectral information from a wavefront, the method comprising the steps of: collecting a wavefront with a collection device, the collection device having an entrance pupil; interfering the collected wavefront with a deformable mirror disposed at an image of the entrance pupil to form interference patterns at an image plane of the collection device, the deformable mirror having a plurality of sections, at least one of which is deformed; and Fourier transforming the interference patterns to derive spectral information for the wavefront. 19. The method of claim 18, further comprising the step of generating a spectrogram from the spectral information. 20. The method of claim 18, further comprising the step of collecting images of the interference pattern with an imaging array. 21. The method of claim 20, wherein Fourier transforming the interference patterns includes Fourier transforming interference patterns of the interference patterns collected by the imaging array. 22. The method of claim 20, wherein the imaging array is disposed at the image plane of the collection device. 23. The method of claim 18, wherein the sections of the deformable mirror are consecutively deformed in accordance with a plurality of predetermined deformation patterns. 24. The method of claim 23, wherein the Fourier transform module is configured to Fourier transform the interference patterns of the wavefront corresponding to each predetermined deformation pattern. 25. The method of claim 18, wherein the at least one deformed section introduces a changed path length to a corresponding section of the wavefront so as to form an interference pattern on the wavefront.
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이 특허에 인용된 특허 (10)
Fender Janet S. (Albuquerque NM) Avizonis Petras V. (Albuquerque NM), Dynamically matched optical filtering in a multiple telescope imaging system.
Wirth,Allan, Optical instrument employing a wavefront sensor capable of coarse and fine phase measurement capabilities during first and second modes of operation.
Lyon, Richard G.; Leisawitz, David T.; Rinehart, Stephen A.; Memarsadeghi, Nargess, Systems, computer-implemented methods, and tangible computer-readable storage media for wide-field interferometry.
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