최소 단어 이상 선택하여야 합니다.
최대 10 단어까지만 선택 가능합니다.
다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
NTIS 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
DataON 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
Edison 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
Kafe 바로가기국가/구분 | United States(US) Patent 등록 |
---|---|
국제특허분류(IPC7판) |
|
출원번호 | US-0223863 (2002-08-19) |
등록번호 | US-7355420 (2008-04-08) |
발명자 / 주소 |
|
출원인 / 주소 |
|
대리인 / 주소 |
|
인용정보 | 피인용 횟수 : 9 인용 특허 : 798 |
A membrane probing assembly includes a probe card with conductors supported thereon, wherein the conductors include at least a signal conductor located between a pair of spaced apart guard conductors. A membrane assembly includes a membrane with contacts thereon, and supporting at least a signal co
A membrane probing assembly includes a probe card with conductors supported thereon, wherein the conductors include at least a signal conductor located between a pair of spaced apart guard conductors. A membrane assembly includes a membrane with contacts thereon, and supporting at least a signal conductor located between a pair of spaced apart guard conductors. The guard conductors of the probe card are electrically interconnected proximate the interconnection between the probe card and the membrane assembly. The guard conductors of the membrane assembly are electrically interconnected proximate the interconnection between the probe card and the membrane assembly.
The invention claimed is: 1. A probing assembly for probing an electrical device comprising: (a) a support; (b) a membrane in overlying relationship to said support; (c) a first elongate conductor supported by said membrane; (d) a first contact supported by said membrane, said contact electrically
The invention claimed is: 1. A probing assembly for probing an electrical device comprising: (a) a support; (b) a membrane in overlying relationship to said support; (c) a first elongate conductor supported by said membrane; (d) a first contact supported by said membrane, said contact electrically connected to said first elongate conductor and having a first contact thickness measured perpendicularly from said membrane to the outermost point on a contacting surface of said first contact; (e) a pair of additional conductors supported by said membrane, where said first elongate conductor is located between said pair of additional conductors, where said pair of additional conductors are at a guard potential with respect to said first elongate conductor; (f) said pair of additional conductors are electrically interconnected together in a manner extending around an end of said first elongate conductor; and (g) a second contact electrically connected to a second elongate conductor and having a second contact thickness measured perpendicularly from said membrane to the outermost point on a contacting surface of said second contact, where said second contact thickness is different from said first contact thickness. 2. The probing assembly of claim 1 wherein said first elongate conductor and said pair of additional conductors are on the same plane. 3. The probing assembly of claim 1 wherein said pair of additional conductors are non-symmetrical with respect to said first conductor. 4. The probing assembly of claim 1 wherein said pair of additional conductors have different widths proximate said end of said first conductor. 5. The probing assembly of claim 1 further comprising a second elongate conductor supported by said membrane and said second elongate conductor is located between said pair of additional conductors. 6. The probing assembly of claim 5 wherein said first conductor is a force connection and said second conductor is a sense connection.
Copyright KISTI. All Rights Reserved.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.