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An optical device with a focusing optic that focuses a light beam in a focal plane and brings about a phase shift between a first part of the light beam and a second part of the light beam. The optical device has a first interface and a second interface, the first interface retlects the first part o

An optical device with a focusing optic that focuses a light beam in a focal plane and brings about a phase shift between a first part of the light beam and a second part of the light beam. The optical device has a first interface and a second interface, the first interface retlects the first part of the light beam, and the second interface reflects the second part of the light beam.

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What is claimed is: 1. An optical device comprising: a means for creating a phase shift between a central part of a light beam and a peripheral part of the light beam, comprising: a first interface and a second interface, wherein the first interface reflects the central part of the light beam, wher

What is claimed is: 1. An optical device comprising: a means for creating a phase shift between a central part of a light beam and a peripheral part of the light beam, comprising: a first interface and a second interface, wherein the first interface reflects the central part of the light beam, wherein the second interface reflects the peripheral part of the light beam, wherein the first interface is an interface between a first material and a second material, wherein the second interface is an interface between the first material and a third material, and wherein a refractive index transition at the first interface differs from a refractive index transition at the second interface, the difference resulting in the phase shift. 2. The optical device according to claim 1, wherein the reflection of the central or the peripheral part of the light beam is a total reflection. 3. The optical device according to claim 1, wherein the first material or the second material or the third material has a low dispersion. 4. The optical device according to claim 3, wherein the third material is a gas or a gas mixture. 5. The optical device according to claim 1, wherein the phase shift is largely independent of the wavelength λ, and wherein the phase shift is approximately λ/2 or λ/4. 6. The optical device according to claim 1, wherein the light beam has several wavelengths, and wherein the phase shift for each wavelength λ is λ/2 or λ/4. 7. The optical device according to claim 1, wherein the light beam is s-polarized with regard to the reflection. 8. The optical device according to claim 1, wherein the reflection at the first interface occurs at the same angle as the reflection at the second interface and the phase shift can be adjusted by changing the angle of reflection. 9. The optical device according to claim 8, further comprising a rotational device to rotate or swivel the first material and the second material. 10. The optical device according to claim 9, wherein the first material, the second material, or the third material exhibit has a substructure. 11. A scanning microscope comprising: a means for creating a phase shift between a central part of the a light beam and a peripheral part of the light beam, comprising: a first interface and a second interface, wherein the first interface reflects the central part of the light beam, wherein the second interface reflects the peripheral part of the light beam, wherein the first interface is an interface between a first material and a second material, wherein the second interface is an interface between the first material and a third material, and wherein a refractive index transition at the first interface differs from a refractive index transition at the second interface, the difference resulting in the phase shift. 12. The scanning microscope according to claim 11, wherein the reflection of the second the central or the peripheral part of the light beam is a total reflection. 13. The scanning microscope according to claim 12, wherein the second material is a coating on the first material. 14. The scanning microscope according to claim 11, wherein the first material or the second material or the third material has a low dispersion. 15. The scanning microscope according to claim 11, wherein the third material is a gas or a gas mixture. 16. The scanning microscope according to claim 11, wherein the light beam is s-polarized with regard to the reflection. 17. The scanning microscope according to claim 11, wherein the reflection at the first interface occurs at the same angle as the reflection at the second interface and the phase shift is adjustable by changing the angle of reflection. 18. The scanning microscope according to claim 11, wherein the scanning microscope optically excites a sample in a region of the sample with an excitation light beam. 19. The scanning microscope according to claim 18, wherein the light beam generates stimulated emission in the excited region of the sample or in a part of the excited region of the sample. 20. The scanning microscope according to claim 18, wherein the light beam generates a further excitation of the sample. 21. A phase filter creating a phase shift between a central part of a light beam and a peripheral part of a light beam, comprising: a first interface and a second interface, wherein the first interface reflects the central part of the light beam. and wherein the second interface reflects the peripheral part of the light beam, wherein the first interface is an interface between a first material and a second material, wherein the second interface is an interface between the first material and a third material, and wherein a refractive index transition at the first interface differs from a refractive index transition at the second interface, the difference resulting in the phase shift. 22. The phase filter according to claim 21, wherein the reflection of the central or the peripheral part of the light beam is a total reflection. 23. The phase filter according to claim 21, wherein the second material is a coating on the first material. 24. The phase filter according to claim 21, wherein the first material has a low dispersion. 25. The phase filter according to claim 21, wherein the first material forms a three-dimensional geometric figure, a prism, or rhomboid, or a cuboid. 26. The phase filter according to claim 25, wherein one part of a surface of the three-dimensional geometric figure borders the second material, and another part of the surface borders the third material. 27. The phase filter according to claim 21, wherein the third material is a gas or a gas mixture. 28. The phase filter according to claim 21, wherein the phase shift is largely independent of the wavelength λ, and wherein the phase shift is approximately λ/2 or λ/4. 29. The phase filter according to claim 21, wherein the light beam exhibits several wavelengths, and wherein the phase shift for each wavelength λ is λ/2 or λ/4. 30. The phase filter according to claim 21, wherein the reflection at the first interface occurs at the same angle as the reflection at the second interface and the phase shift is adjustable by changing the angle of reflection. 31. The phase filter according to claim 30, further comprising a rotational device to rotate or swivel the first material and the second material.