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Process for fabricating thin film transistors 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-027/01
출원번호 US-0919657 (2004-08-17)
등록번호 US-7365394 (2008-04-29)
발명자 / 주소
  • Denis,Kevin L
  • Chen,Yu
  • Drzaic,Paul S
  • Jacobson,Joseph M
  • Kazlas,Peter T
출원인 / 주소
  • E Ink Corporation
대리인 / 주소
    Cole,David J.
인용정보 피인용 횟수 : 91  인용 특허 : 234

초록

Transistors are formed by depositing at least one layer of semiconductor material on a substrate comprising a polyphenylene polyimide. The substrate permits the use of processing temperatures in excess of 300�� C. during the processes used to form the transistors, thus allowing the formation of high

대표청구항

What we claim is: 1. An electrophoretic display comprising, in order: a metal layer; a polyimide substrate; at least one transistor on the polyimide substrate; and an electrophoretic medium having a plurality of electrophoretic particles dispersed in a suspending fluid and capable of moving thereth

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