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Non-corrosive cleaning composition for removing plasma etching residues 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/461
  • H01L-021/02
출원번호 US-0305794 (2005-12-16)
등록번호 US-7402552 (2008-07-22)
발명자 / 주소
  • Honda,Kenji
  • Elderkin,Michelle
  • Leon,Vincent
출원인 / 주소
  • Fujifilm Electronic Materials U.S.A., Inc.
대리인 / 주소
    Fish & Richardson P.C.
인용정보 피인용 횟수 : 0  인용 특허 : 73

초록

A non-corrosive cleaning composition for removing residues from a substrate. The composition comprises: (a) water; (b) at least one hydroxylammonium compound; (c) at least one basic compound, preferably selected from the group consisting of amines and quaternary ammonium hydroxides; (d) at least one

대표청구항

What is claimed is: 1. A method for cleaning residue from a substrate, which comprises the step of: applying a cleaning composition to said substrate, wherein said composition consists of: (a) water; (b) at least one hydroxylammonium compound; (c) at least one basic compound, and (d) at least one o

이 특허에 인용된 특허 (73)

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