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Electronic apparatus and methods of forming the electronic apparatus include a lanthanum aluminum oxynitride film on a substrate for use in a variety of electronic systems. The lanthanum aluminum oxynitride film may be structured as one or more monolayers. The lanthanum aluminum oxynitride film may

Electronic apparatus and methods of forming the electronic apparatus include a lanthanum aluminum oxynitride film on a substrate for use in a variety of electronic systems. The lanthanum aluminum oxynitride film may be structured as one or more monolayers. The lanthanum aluminum oxynitride film may be formed by atomic layer deposition.

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What is claimed is: 1. A method comprising: forming a lanthanum aluminum oxynitride film in an integrated circuit on a substrate including forming the lanthanum aluminum oxynitride film by atomic layer deposition, the atomic layer deposition having one or more cycles, each cycle including: performi

What is claimed is: 1. A method comprising: forming a lanthanum aluminum oxynitride film in an integrated circuit on a substrate including forming the lanthanum aluminum oxynitride film by atomic layer deposition, the atomic layer deposition having one or more cycles, each cycle including: performing one or more lanthanum/oxygen sequences; performing one or more aluminum/oxygen sequences; and performing one or more nitrogen/oxygen sequences using a nitrogen precursor and an oxygen reactant precursor to the nitrogen precursor in the nitrogen/oxygen sequences. 2. The method of claim 1, wherein forming the lanthanum aluminum oxynitride film by atomic layer deposition includes forming the lanthanum aluminum oxynitride film as multiple layers of lanthanum aluminum oxynitride, each layer formed by atomic layer deposition, in which at least one layer has a nitrogen content different from the other layers of the lanthanum aluminum oxynitride film. 3. The method of claim 1, wherein forming the lanthanum aluminum oxynitride film includes forming LaAlO3(1-y/2)Ny, where 0.23 precursor in the atomic layer deposition. 5. The method of claim 1, wherein forming the lanthanum aluminum oxynitride film by atomic layer deposition includes using a trisethylcyclopentadionatolanthanum precursor in the atomic layer deposition. 6. The method of claim 1, wherein forming the lanthanum aluminum oxynitride film by atomic layer deposition includes using a trisdipyvaloylmethanatolanthanum precursor in the atomic layer deposition. 7. The method of claim 1, wherein forming the lanthanum aluminum oxynitride film by atomic layer deposition includes using tris (2,2,6,6-tetramethyl-3,5-heptanedionato)lanthanum (III) tetraglyme adduct as a precursor in the atomic layer deposition. 8. The method of claim 1, wherein forming the lanthanum aluminum oxynitride film by atomic layer deposition includes using an adduct of alane and dimethylethylamine as a precursor in the atomic layer deposition. 9. The method of claim 1, wherein forming the lanthanum aluminum oxynitride film by atomic layer deposition includes using a trimethylaluminum precursor in the atomic layer deposition. 10. The method of claim 1, wherein forming the lanthanum aluminum oxynitride film by atomic layer deposition includes forming the lanthanum aluminum oxynitride film using plasma-assisted atomic layer deposition. 11. The method of claim 1, wherein forming the lanthanum aluminum oxynitride film by atomic layer deposition includes using a nitrogen-containing precursor in the atomic layer deposition. 12. The method of claim 1, wherein forming the lanthanum aluminum oxynitride film by atomic layer deposition includes using an ammonia precursor in the atomic layer deposition. 13. The method of claim 1, wherein the method includes forming a transistor having a gate dielectric containing the lanthanum aluminum oxynitride film. 14. The method of claim 1, wherein the method includes forming a capacitor having a capacitor dielectric containing the lanthanum aluminum oxynitride film. 15. The method of claim 1, wherein the method includes forming a memory device containing the lanthanum aluminum oxynitride film. 16. The method of claim 1, wherein the method includes forming a conductive path to a conductive layer on and contacting the lanthanum aluminum oxynitride film to provide a signal to the conductive layer to operate in an electronic system. 17. A method comprising: forming a lanthanum aluminum oxynitride film in an integrated circuit on a substrate including forming the lanthanum aluminum oxynitride film by atomic layer deposition using a tert-butylamine precursor in the atomic layer deposition. 18. A method comprising: forming a lanthanum aluminum oxynitride film in an integrated circuit on a substrate including forming the lanthanum aluminum oxynitride film by atomic layer deposition using an allylamine precursor in the atomic layer deposition. 19. A method comprising: forming a lanthanum aluminum oxynitride film in an integrated circuit on a substrate including forming the lanthanum aluminum oxynitride film by atomic layer deposition using a 1,1-dimethylhydrazine precursor in the atomic layer deposition. 20. A method comprising: forming a first electrode on a substrate; forming a dielectric layer containing a lanthanum aluminum oxynitride film, including forming the lanthanum aluminum oxynitride film by atomic layer deposition, the atomic layer deposition having one or more cycles, each cycle including: performing one or more lanthanum/oxygen sequences; performing one or more aluminum/oxygen sequences; and performing one or more nitrogen/oxygen sequences using a nitrogen precursor and an oxygen reactant precursor to the nitrogen precursor in the nitrogen/oxygen sequences, the dielectric layer disposed on and contacting the first electrode; and forming a second electrode on and contacting the dielectric layer. 21. The method of claim 20, wherein forming the lanthanum aluminum oxynitride film by atomic layer deposition includes using a La(thd)3 precursor, a DMEAA precursor, and nitrogen in the atomic layer deposition. 22. The method of claim 20, wherein the method includes forming the first electrode, the dielectric layer, and the second electrode as a capacitor in a dynamic random access memory. 23. The method of claim 20, wherein the method includes forming the first electrode, the dielectric layer, and the second electrode as a capacitor in an analog integrated circuit. 24. The method of claim 20, wherein the method includes forming the first electrode, the dielectric layer, and the second electrode as a capacitor in a radio frequency integrated circuit. 25. The method of claim 20, wherein the method includes forming the first electrode, the dielectric layer, and the second electrode as a capacitor in a mixed signal integrated circuit. 26. The method of claim 20, wherein forming a dielectric layer includes forming the dielectric layer having multiple layers of dielectrics within which the lanthanum aluminum oxynitride film is disposed. 27. The method of claim 20, wherein forming the dielectric layer having multiple layers of dielectrics includes forming a nanolaminate. 28. The method of claim 20, wherein forming the lanthanum aluminum oxynitride film by atomic layer deposition includes forming the lanthanum aluminum oxynitride film as multiple layers of lanthanum aluminum oxynitride, each layer formed by atomic layer deposition, in which at least one layer of the multiple layers has a nitrogen content different from the other layers of the lanthanum aluminum oxynitride film. 29. The method of claim 20, wherein forming the lanthanum aluminum oxynitride film includes forming LaAlO3(1-y/2)Ny, where 0.23 precursor, a trimethylaluminum precursor, and nitrogen in the atomic layer deposition. 32. The method of claim 30, wherein the method includes forming the dielectric layer as a gate insulator in a transistor of a CMOS device. 33. The method of claim 30, wherein forming a dielectric layer includes forming the dielectric layer as a gate dielectric contacting the channel. 34. The method of claim 30, wherein forming a dielectric layer includes forming the dielectric layer as a tunnel gate insulator contacting the channel. 35. The method of claim 30, wherein forming a dielectric layer includes forming the dielectric layer on and contacting a floating gate. 36. The method of claim 30, wherein the method includes forming the dielectric layer as a tunnel insulator contacting the channel and forming a floating gate dielectric on and contacting a floating gate, the floating gate dielectric containing a lanthanum aluminum oxynitride film. 37. The method of claim 30, wherein forming the lanthanum aluminum oxynitride film by atomic layer deposition includes forming the lanthanum aluminum oxynitride film as multiple layers of lanthanum aluminum oxynitride, each layer formed by atomic layer deposition, in which at least one layer of the multiple layers has a nitrogen content different from the other layers of the lanthanum aluminum oxynitride film. 38. The method of claim 30, wherein forming the lanthanum aluminum oxynitride film includes forming LaAlO3(1-y/2)Ny, where 0.23 precursor, a trimethylaluminum precursor, and a nitrogen-containing precursor in the atomic layer deposition. 41. The method of claim 39, wherein the method includes forming the dielectric layer as a gate insulator of a transistor in a memory device. 42. The method of claim 39, wherein the method includes forming the dielectric layer as a tunnel gate insulator in a flash memory. 43. The method of claim 39, wherein the method includes forming the dielectric layer as an inter-gate insulator in a flash memory. 44. The method of claim 39, wherein the method includes forming the dielectric layer as a dielectric of a capacitor in a memory cell. 45. The method of claim 39, wherein the method includes forming a dynamic random access memory. 46. The method of claim 39, wherein the method includes forming the dielectric layer as a nanolaminate dielectric. 47. The method of claim 39, wherein the method includes forming the dielectric layer as a nanolaminate dielectric in a NROM flash memory. 48. The method of claim 39, wherein forming the lanthanum aluminum oxynitride film by atomic layer deposition includes forming the lanthanum aluminum oxynitride film as multiple layers of lanthanum aluminum oxynitride, each layer formed by atomic layer deposition, in which at least one layer of the multiple layers has a nitrogen content different from the other layers of the lanthanum aluminum oxynitride film. 49. The method of claim 39, wherein forming the lanthanum aluminum oxynitride film includes forming LaAlO3(1-y/2)Ny, where 0.23 precursor, an Al(CH3)3 precursor, and nitrogen in the atomic layer deposition. 52. The method of claim 50, wherein forming the lanthanum aluminum oxynitride film by atomic layer deposition includes forming the lanthanum aluminum oxynitride film as multiple layers of lanthanum aluminum oxynitride, each layer formed by atomic layer deposition, in which at least one layer of the multiple layers has a nitrogen content different from the other layers of the lanthanum aluminum oxynitride film. 53. The method of claim 50, wherein forming the lanthanum aluminum oxynitride film includes forming LaAlO3(1-y/2)Ny, where 0.2