Method to evaluate whether a time delay is better than a time limit
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G04F-013/00
G06F-019/00
H04B-007/216
H04B-007/204
출원번호
US-0531865
(2003-10-01)
등록번호
US-7424390
(2008-09-09)
우선권정보
EP-02023410(2002-10-18)
국제출원번호
PCT/EP03/010873
(2003-10-01)
§371/§102 date
20051229
(20051229)
국제공개번호
WO04/036945
(2004-04-29)
발명자
/ 주소
Maucksch,Thomas
출원인 / 주소
Rohde & Schwarz GmbH & Co. KG
대리인 / 주소
Ditthavong Mori & Steiner, P.C.
인용정보
피인용 횟수 :
0인용 특허 :
4
초록▼
A method for testing the time delay error ratio ER of a device against a maximal allowable time delay error ratio ERlimit with an early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability D. ns time delays TD of the
A method for testing the time delay error ratio ER of a device against a maximal allowable time delay error ratio ERlimit with an early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability D. ns time delays TD of the device are measured, thereby ne bad time delays of these ns time delays TD are detected. PDhigh and/or PDlow are obtained, whereby PDhigh is the worst possible likelihood distribution and PDlow is the best possible likelihood distribution containing the measured ne bad time delays with the probability D. The average numbers of erroneous bits NEhigh and NElow for PDhigh and PDlow are obtained. NEhigh and NElow are compared with NElimit=ERlimit ns. If NElimit is higher than NEhigh or NElimit is lower than NElow the test is stopped.
대표청구항▼
The invention claimed is: 1. A method for testing a time delay error ratio ER of a device against a maximal allowable time delay error ratio ERlimit with an early pass criterion, whereby the early pass criterion is allowed to be wrong only by a first probability D1, comprising the following steps:
The invention claimed is: 1. A method for testing a time delay error ratio ER of a device against a maximal allowable time delay error ratio ERlimit with an early pass criterion, whereby the early pass criterion is allowed to be wrong only by a first probability D1, comprising the following steps: measuring ns time delays (TD) of the device, thereby detecting ne bad time delays, which exceed a certain time limit, of these us time delays (TD), estimating a likelihood distribution giving a distribution of a number ni of bad time delays in a fixed number of samples of time delays (TD) as PD(ni, NE), wherein NE is the average number of bad time delays, obtaining PDhigh from wherein PDhigh is the worst possible likelihood distribution containing the measured ne bad time delays with the probability D1, obtaining the average number NEhigh of bad time delays for the worst possible likelihood distribution PDhigh, comparing NEhigh with NElimit=ERlimit��ns, if NElimit is higher than NEhigh stopping the test and deciding that the device has early passed the test and if NElimit is smaller than NEhigh continuing the test whereby increasing ns. 2. A method according to claim 1, wherein the likelihood distribution PDhigh (ni, NE) is a Poisson distribution. 3. A method according to claim 1, wherein the likelihood distribution PDhigh (ni, NE) is a binomial distribution. 4. A method according to claim 1, wherein, for avoiding an undefined situation for ne=0 starting the test with an artificial bad time delay ne=1, not incrementing ne when a first error occurs. 5. A computer readable medium having stored thereon program code for causing a programmable computer or digital signal processor to perform the method of claim 1. 6. A machine readable data carrier having stored thereon program code for causing a programmable computer or digital signal processor to perform the method of claim 1. 7. A method for testing a time delay error ratio ER of a device against a maximal allowable time delay error ratio ERlimit with an early pass criterion, whereby the early pass criterion is allowed to be wrong only by a first probability F1 for the entire test, comprising the following steps: measuring ns time delays (TD) of the device, thereby detecting ne bad time delays, which exceed a certain time limit, of these ns time delays (TD), estimating a likelihood distribution giving a distribution of a number ni of bad time delays in a fixed number of samples of time delays (TD) as PD(ni, NE), wherein NE is the average number of bad time delays, obtaining PDhigh from wherein PDhigh is the worst possible likelihood distribution containing the measured ne bad time delays with a single step wrong decision probability D1 for a preliminary error ratio ER stage, whereby using a single step wrong decision probability D1 smaller than the probability F1 for the entire test, obtaining the average number of NEhigh of bad time delays for the worst possible likelihood distribution PDhigh, comparing NEhigh with NElimit=ERlimit��ns, if NElimit is higher than NEhigh stopping the test and deciding that the device has early passed the test and if NElimit is smaller than NEhigh continuing the test whereby increasing ns. 8. A method according to claim 7 wherein the single step wrong decision probability D1 is in the range of F1>D1≧1-(1-F1)1/ne . 9. A method for testing a time delay error ratio ER of a device against a maximal allowable time delay error ratio ERlimit with an early fail criterion, whereby the early fail criterion is allowed to be wrong only by a first probability D2, comprising the following steps: measuring ns time delays (TD) of the device, thereby detecting ne bad time delays, which exceed a certain time limit, of these ns time delays (TD), estimating a likelihood distribution giving a distribution of a number ni of bad time delays in a fixed number of samples of time delays (TD) as PD(ni, NE), wherein NE is the average number of bad time delays, obtaining PDlow from wherein PDlow is the best possible likelihood distribution containing the measured ne bad time delays with the probability D2, obtaining the average number NElow of bad time delays for the best possible likelihood distribution PDlow, comparing NElow with NElimit=ERlimit��ns, if NElimit is smaller than NElow stopping the test and deciding that the device has early passed the test and if NElimit is higher than NElow continuing the test whereby increasing ns. 10. A method according to claim 9, wherein the likelihood distribution PDlow (ni, NE) is a Poisson distribution. 11. A method according to claim 9, wherein the likelihood distribution PDlow (ni, NE) is a binomial distribution. 12. A method according to claim 9, wherein for avoiding a undefined situation for ne1, further comprising: estimating a likelihood distribution giving a distribution of a number of bad time delays ni in a fixed number of samples of time delays (TD) as PD(ni, NE), wherein NE is the average number of bad time delays, obtaining PDhigh from wherein PDhigh is the worst possible likelihood distribution containing the measured ne bad time delays with the probability D1, obtaining the average number NEhigh of bad time delays for the worst possible likelihood distribution PDhigh, comparing NEhigh with NElimit=ERlimit��ns, if NElimit is higher than NEhigh stopping the test and deciding that the device has early passed the test and if NElimit is smaller than NEhigh continuing the test, whereby increasing ns. 14. A method according to claim 13, wherein the probability D1 for the wrong early pass criterion and the probability D2 for the wrong early fail criterion are equal (D1=D2). 15. A method according to claim 9, characterized by an additional early pass criterion, whereby the early pass criterion is allowed to be wrong only by first probability D1, further comprising: estimating a likelihood distribution giving a distribution of the number of bad time delays ni in a fixed number of samples of time delays (TD) is PD(ni, NE), wherein NE is the average number of bad time delays, obtaining PDhigh from wherein PDhigh is the worst possible likelihood distribution containing the measured ne bad time delays with the probability D1, obtaining the average number NEhigh of bad time delays for the worst possible likelihood distribution PDhigh, comparing NEhigh with NElimit,M=ER limit��M��ns, where M is a variable with M>1, if NElimit,M is higher than NEhigh stopping the test and deciding that the device has early passed the test and if NElimit,M is smaller than NEhigh continuing the test, whereby increasing ns. 16. A method according to claim 9, characterized by an additional early pass criterion, whereby the early pass criterion is allowed to be wrong only by a first probability F1 for the entire test, further comprising: estimating a likelihood distribution giving a distribution of the number of bad time delays ni in a fixed number of samples of time delays (TD) as PD(ni, NE), wherein NE is the average number of bad time delays, obtaining PDhigh from wherein PDhigh is the worst possible likelihood distribution containing the measured ne bad time delays with a single step wrong decision probability D1 for a preliminary error ratio ER stage, whereby using a single step wrong decision probability D1 smaller than the probability F1 for the entire test, obtaining the average number of NEhigh of bad time delays for the worst possible likelihood distribution PDhigh, comparing NEhigh with NElimit=ERlimit��ns, if NElimit is higher than NEhigh stopping the test and deciding that the device has early passed the test and if NElimit is smaller than NEhigh continuing the test, whereby increasing ns. 17. A method according to claim 16, wherein the probability F1 for the wrong early pass criterion and the probability F2 for the wrong early fail criterion are equal (F1=F2). 18. A method according to claim 9, characterized by an additional early pass criterion, whereby the early pass criterion is allowed to be wrong only by a first probability F1 for the entire test, further comprising: estimating a likelihood distribution giving a distribution of the number of bad time delays ni in a fixed number of samples of time delays (TD) is PD(ni, NE), wherein NE is the average number of bad time delays, obtaining PDhigh from wherein PDhigh is the worst possible likelihood distribution containing the measured ne bad time delays with a single step wrong decision probability D1 for a preliminary error ratio ER stage, whereby using a single step wrong decision probability D1 smaller than the probability F1 for the entire test, obtaining the average number NEhigh of bad time delays for the worst possible likelihood distribution PDhigh, comparing NEhigh with NElimit,M=ERlimit��M��ns, where M is a variable with M>1, if NElimit,M is higher than NEhigh stopping the test and deciding that the device has early passed the test and if NElimit,M is smaller than NEhigh continuing the test, whereby increasing ns. 19. A method according to claim 9, wherein for avoiding a undefined situation for ne=0 starting the test with an artificial bad time delay ne=1 not incrementing ne when a first error occurs. 20. A computer readable medium having stored thereon program code for causing a programmable computer or digital signal processor to perform the method of claim 9. 21. A machine readable data carrier having stored thereon program code for causing a programmable computer or digital signal processor to perform the method of claim 9. 22. A method for testing a time delay error ratio ER of a device against a maximal allowable time delay error ratio ERlimit with an early fail criterion, whereby the early fail criterion is allowed to be wrong only by a first probability F2 for the entire test, comprising the following steps: measuring ns time delays (TD) of the device, thereby detecting ne bad time delays, which exceed a certain time limit, of these ns time delays (TD), estimating likelihood distribution giving a distribution of a number ni of bad time delays in a fixed number of samples of time delays (TD) as PD(ni, NE), wherein NE is the average number of bad time delays, obtaining PDlow from wherein PDlow is the best possible likelihood distribution containing the measured ne bad time delays with a single step wrong decision probability D2 for a preliminary error ratio ER stage, whereby using a single step wrong decision probability D2 smaller than the probability F2 for the entire test, obtaining the average number of NElow of bad time delays for the best possible likelihood distribution PDlow, comparing NElow with NElimit=ERlimit��ns, if NElimit is smaller than NElow stopping the test and deciding that the device has early passed the test and if NElimit is higher than NElow continuing the test whereby increasing ns. 23. A method according to claim 22, wherein the single step wrong decision probability D2 is in the range of F2>D2≧1-(1-F2)1/ne .
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