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Semiconductor device and method of fabricating same 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-027/14
출원번호 US-0712062 (2003-11-14)
등록번호 US-7427780 (2008-09-23)
우선권정보 JP-8-026210(1996-01-19); JP-8-026037(1996-01-20); JP-8-032874(1996-01-26); JP-8-032875(1996-01-26); JP-8-032981(1996-01-27); JP-8-058334(1996-02-20); JP-8-088759(1996-03-17); JP-8-326068(1996-11-21)
발명자 / 주소
  • Yamazaki,Shunpei
  • Teramoto,Satoshi
  • Koyama,Jun
  • Ogata,Yasushi
  • Hayakawa,Masahiko
  • Osame,Mitsuaki
  • Ohtani,Hisashi
  • Hamatani,Toshiji
출원인 / 주소
  • Semiconductor Energy Laboratory Co., Ltd.
대리인 / 주소
    Robinson,Eric J.
인용정보 피인용 횟수 : 13  인용 특허 : 287

초록

There is disclosed a method of fabricating a thin-film transistor having excellent characteristics. Nickel element is held in contact with selected regions of an amorphous silicon film. Then, thermal processing is performed to crystallize the amorphous film. Subsequently, thermal processing is carri

대표청구항

What is claimed is: 1. A semiconductor device comprising: a channel region provided over a substrate and between a source region and a drain region; a gate electrode provided over said substrate and provided adjacent to said channel region with a gate insulating film between said gate electrode and

이 특허에 인용된 특허 (287)

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  201. Yamazaki Shunpei,JPX ; Zhang Hongyong,JPX, Semiconductor device and method for forming the same.
  202. Koyama Jun,JPX ; Suzawa Hideomi,JPX ; Teramoto Satoshi,JPX, Semiconductor device and method for its fabrication.
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  218. Zhang Hongyong,JPX, Semiconductor device and method of manufacturing the same.
  219. Takemura Yasuhiko (Kanagawa JPX) Adachi Hiroki (Kanagawa JPX), Semiconductor device and process for fabricating the same.
  220. Zhang Hongyong (Kanagawa JPX) Koyama Jun (Kanagawa JPX) Teramoto Satoshi (Kanagawa JPX), Semiconductor device and process for fabricating the same.
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  224. Makita Naoki (Nara JPX) Yamamoto Yoshitaka (Yamatokoriyama JPX), Semiconductor device formed with seed crystals on a layer thereof.
  225. Hongyong Zhang JP; Toru Takayama JP; Yasuhiko Takemura JP; Akiharu Miyanaga JP; Hisashi Ohtani JP, Semiconductor device forming method.
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  227. Yamazaki Shunpei,JPX ; Takemura Yasuhiko,JPX ; Zhang Hongyong,JPX ; Takayama Toru,JPX ; Uochi Hideki,JPX, Semiconductor device having a catalyst enhanced crystallized layer.
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  229. Takemura Yasuhiko (Kanagawa JPX), Semiconductor device having a crystallized silicon thin film in which the crystallization direction is oriented either v.
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  231. Takayama Toru (Kanagawa JPX) Takemura Yasuhiko (Atsugi JPX), Semiconductor device having a thin film transistor and thin film diode.
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  233. Zhang Hongyong,JPX, Semiconductor device having an insulated gate field effect thin film transistor.
  234. Takemura Yasuhiko (Kanagawa JPX), Semiconductor device having at least two thin film transistors.
  235. Zhang Hongyong (Kanagawa JPX) Takayama Toru (Kanagawa JPX) Takemura Yasuhiko (Kanagawa JPX), Semiconductor device having crystalline thin film transistors.
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  240. Yamazaki Shunpei (Tokyo JPX) Teramoto Satoshi (Kanagawa JPX), Semiconductor device including a silicon film having an irregular surface.
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  243. Yamazaki Shunpei (Tokyo JPX) Mase Akira (Aichi JPX) Hamatani Toshiji (Kanagawa JPX), Semiconductor device with oxide layer.
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  245. Takayama Toru,JPX ; Takemura Yasuhiko,JPX, Semiconductor device/circuit having at least partially crystallized semiconductor layer.
  246. Yamazaki Shunpei,JPX ; Zhang Hongyong,JPX ; Kusumoto Naoto,JPX ; Takemura Yasuhiko,JPX, Semiconductor material and method for forming the same and thin film transistor.
  247. Yamazaki Shunpei,JPX ; Miyanaga Akiharu,JPX ; Teramoto Satoshi,JPX, Semiconductor material, a semiconductor device using the same, and a manufacturing method thereof.
  248. Chen Chien-Fong,TWX ; Cheng Chia-Chun,TWX ; Chang Chi-Fu,TWX ; Chuang Kuo-Sheng,TWX, Semiconductor substrate dry cleaning method.
  249. Asakawa Toshifumi (Yamato JPX) Kosaka Daisuke (Takarazuka JPX) Nakayama Haruo (Kawanishi JPX), Semiconductor substrate manufacturing by recrystallization using a cooling medium.
  250. Yamazaki Shunpei,JPX, Semiconductor thin film and semiconductor device.
  251. Yamazaki Shunpei (Tokyo JPX) Takemura Yasuhiko (Kanagawa JPX) Zhang Hongyong (Kanagawa JPX) Takayama Toru (Kanagawa JPX) Uochi Hideki (Atsugi JPX), Semiconductor, semiconductor device, and method for fabricating the same.
  252. Yamazaki Shunpei (Tokyo JPX) Takemura Yasuhiko (Kanagawa JPX) Zhang Hongyong (Kanagawa JPX) Takayama Toru (Kanagawa JPX) Uochi Hideki (Atsugi JPX), Semiconductor, semiconductor device, and method for fabricating the same.
  253. Yamazaki Shunpei,JPX ; Takemura Yasuhiko,JPX ; Zhang Hongyong,JPX ; Takayama Toru,JPX ; Uochi Hideki,JPX, Semiconductor, semiconductor device, and method for fabricating the same.
  254. Yamazaki Shunpei,JPX ; Takemura Yasuhiko,JPX ; Zhang Hongyong,JPX ; Takayama Toru,JPX ; Uochi Hideki,JPX, Semiconductor, semiconductor device, and method for fabricating the same.
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  259. Tang Ching Wan (Rochester NY) Hseih Biay Cheng (Pittsford NY), TFT-el display panel using organic electroluminescent media.
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  261. Yamazaki Shunpei,JPX ; Koyama Jun,JPX ; Ohtani Hisashi,JPX, Thin film circuit with improved carrier mobility.
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  264. Kusumoto, Naoto; Takemura, Yasuhiko; Ohtani, Hisashi, Thin film semiconductor device and production method for the same.
  265. Serikawa Tadashi (Higashimurayama JPX) Shirai Seiichi (Higashimurayama JPX) Okamoto Akio (Higashimurayama JPX) Suyama Shirou (Iruma JPX), Thin film silicon semiconductor device and process for producing thereof.
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  269. Arai Michio,JPX ; Sugiura Kazushi,JPX ; Takayama Ichiro,JPX ; Yamauchi Yukio,JPX ; Kobori Isamu,JPX ; Codama Mitsufumi,JPX ; Sakamoto Naoya,JPX, Thin film transistor for controlling a device such as a liquid crystal cell or electroluminescent element.
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