초록 ▼

Device for determining the properties of surfaces having at least one first radiation means having at least one first radiation source which directs a predetermined radiation towards a measurement surface; at least one first radiation detector means which captures at least a portion of the radiation

Device for determining the properties of surfaces having at least one first radiation means having at least one first radiation source which directs a predetermined radiation towards a measurement surface; at least one first radiation detector means which captures at least a portion of the radiation reflected and/or diffused off the measurement surface and emits at least one measurement signal which is characteristic of the reflected and/or diffused radiation, wherein at least one second radiation means is provided which directs at least partially directional radiation at a predetermined angle towards the measurement surface, and at least one second radiation detector means having a predetermined radiation detector surface, which at least partially captures the radiation emitting from the second radiation means and reflected off the measurement surface, and determines its position on the detector surface.

대표청구항 ▼

The invention claimed is: 1. A device for determining the properties of surfaces having: at least one first radiation means having at least one first radiation source which directs a predetermined radiation towards a measurement surface; at least one first radiation detector means which captures at

The invention claimed is: 1. A device for determining the properties of surfaces having: at least one first radiation means having at least one first radiation source which directs a predetermined radiation towards a measurement surface; at least one first radiation detector means which captures at least a portion of the radiation reflected and/or diffused off the measurement surface and emits at least one measurement signal which is characteristic of the reflected and/or diffused radiation, wherein said device includes at least one measurement means which determines an angular position of the device relative to the measurement surface, said measurement means is composed of at least one second radiation means which directs at least partially directional radiation at a predetermined angle towards the measurement surface; and at least one second radiation detector means having a predetermined radiation detector surface which at least partially captures the radiation emitting from said second radiation means and reflected off the measurement surface and determines its position on the second radiation detector surface, wherein only selected areas of the second radiation detector surface are irradiated with radiation with radiation from the second radiation means, wherein the location of said irradiated areas depends on the angular position of the device relative to the measurement surface. 2. The device according to claim 1: wherein said device comprises at least one distance measurement means for determining the distance of a predetermined geometrical location of the device from the measurement surface. 3. The device according to claim 1, wherein it comprises at least one adjustment means by means of which the angular position of the device relative the measurement surface can be varied. 4. The device according to claim 1, wherein the predetermined radiation detector surface is irradiated not uniformly by radiation emitted from the second radiation means. 5. The device according to claim 1, wherein individual areas of said radiation detector surface are irradiated with radiation emitted from said second radiation means, and the location of said areas substantially depends on the angular position of the device relative the measuring surface. 6. The device according to claim 1, wherein said device comprises a plurality of adjusting means by means of which it is positioned relative the measurement surface in a preferred angular direction. 7. The device according to claim 1, wherein said second radiation detector means comprises a plurality of image-capturing components. 8. The device according to claim 1, wherein said plurality of image-capturing components of said second radiation detector means is distributed substantially concentrically around a predetermined geometrical center. 9. The device according to claim 1, wherein said second radiation detector means emits a signal which serves to adjust the angular position of said device relative the measurement surface. 10. The device according to claim 1, wherein said device comprises a measurement aperture through which the radiation impinging on the measurement surface passes. 11. The device according to claim 10, wherein a plurality of distance measurement means is provided which are positioned at predetermined positions relative the measurement aperture. 12. The device according to claim 2, wherein at least one distance measurement means comprises at least one component from a group of components including radiation sources, magnetic components, in particular but not exclusively magnet coils, and components utilizing the Hall effect. 13. The device according to claim 2, wherein each distance measurement means emits a signal characteristic of the distance from the predetermined geometrical location of the device to the measurement surface. 14. The device according to claim 1, wherein said second radiation means comprises at least one radiation source selected from a group of radiation sources comprising lasers, coherent and non-coherent semiconductor radiation sources, thermal radiation sources, in particular but not exclusively light bulbs, and halogen light bulbs. 15. The device according to claim 1, wherein the radiation emitted from said first radiation means is at least partially collimated by at least one radiation directing means. 16. The device according to claim 1, wherein at least one radiation directing means comprises at least one radiation directing component selected from a group of radiation directing components comprising lens elements, micro lens elements, micro lens arrays, diffracting components, reflector components, in particular but not exclusively parabolic reflectors, grating components, volume grating components, and holographic components. 17. The device according to claim 1, wherein at least said second radiation means comprises diaphragm means. 18. The device according to claim 1, wherein the radiation emitting from said second radiation means is repeatedly reflected in its optical path to the second radiation detector means. 19. The device according to claim 1, wherein the predetermined angle at which the radiation emitting from said second radiation means impinges on the measurement surface, is between 0 degrees and 90 degrees, preferred between 0 degrees and 60 degrees, particularly preferred between 0 degrees and 45 degrees and in particular between 0 degrees and 30 degrees. 20. The device according to claim 1, wherein at least said first radiation means comprises a radiation diffusor means selected from a group of radiation diffusor means comprising radiation diffusor disks, frosted glass disks, and diffusor films. 21. The device according to claim 1, wherein at least said first and said second radiation means are positioned in a housing above the measurement surface. 22. The device according to claim 1, wherein at least said first radiation source is variable in one radiation parameter which is selected from a group of parameters comprising radiation intensity, radiation wavelength, direction of radiation polarization, and temporal radiation intensity modulation. 23. The device according to claim 1, wherein said device is movable relative the measurement surface such that the distance between the radiation means and the measurement surface remains substantially constant. 24. The device according to claim 1, wherein at least one distance measurement means is provided which emits at least one measurement signal which is characteristic of the distance traveled of the relative movement between the device and the measurement surface. 25. The device according to claim 1, wherein at least one coating-thickness measurement means is provided for determining the coating thickness of the surface to be examined comprising at least one coating thickness sensor which emits a measurement signal representative of the coating thickness to be determined. 26. The device according to claim 25, wherein at least one processor means is provided which allows an allocation of the measurement signals of at least one of said radiation detector means, said distance measurement means, and said coating-thickness measurement means. 27. A method for determining the properties of surfaces including the following steps: emitting radiation onto a measurement surface through the second radiation means according to claim 1, wherein; capturing the radiation reflected off the measurement surface by means of the second radiation detector means according to claim 1; determining the location on the second radiation detector surface on which a predetermined portion of the radiation impinges; outputting at least one measurement number which is characteristic of the location on the second radiation detector surface on which the predetermined portion of the radiation impinges; displaying on an indicator means the measurement number which is characteristic of the location on the second radiation detector surface on which the predetermined portion of the radiation impinges; and varying the angular position of the device according to claim 1 relative to the measurement surface by at least one adjusting means, such that the predetermined portion of the radiation which is displayed as a measurement number on the indicator means impinges on a predetermined location on said second radiation detector surface. 28. The method according to claim 27, wherein the predetermined portion of the radiation is a major portion of the total of the radiation impinging on said second radiation detector means. 29. The method according to claim 27, wherein the radiation is of maximum intensity at the location on which a predetermined portion of the radiation impinges. 30. A method for determining the quality of surfaces wherein at least one distance measurement means according to at least one of the preceding claim 2 serves to determine the distance of a predetermined geometrical location between the device and the measurement surface, and in reaction to the determined distance the angular position of the device relative the measurement surface is adjusted to a predetermined value. 31. A device for determining the properties of surfaces having: at least one first radiation means having at least one first radiation source which directs a predetermined radiation towards a measurement surface; at least one first radiation detector means which captures at least a portion of the radiation reflected and/or diffused off the measurement surface and emits at least one measurement signal which is characteristic of the reflected and/or diffused radiation, wherein said device includes at least one measurement means which determines an angular position of the device relative to the measurement surface, said measurement means is composed of at least one second radiation means which directs at least partially directional radiation at a predetermined angle towards the measurement surface; and at least one second radiation detector means having a predetermined radiation detector surface which at least partially captures the radiation emitting from said second radiation means and reflected off the measurement surface and determines its position on the second radiation detector surface, wherein only selected areas of the second radiation detector surface are irradiated with radiation from the second radiation means, wherein the location of said irradiated areas depends on the angular position of the device relative to the measurement surface; and wherein at least one adjustment means is provided by means of which the angular position of the device relative to the measurement surface can be varied. 32. A device for determining the properties of surfaces having: at least one first radiation means having at least one first radiation source which directs a predetermined radiation towards a measurement surface; at least one first radiation detector means which captures at least a portion of the radiation reflected and/or diffused off the measurement surface and emits at least one measurement signal which is characteristic of the reflected and/or diffused radiation, wherein at least one adjustment means is provided by means of which the angular position of the device relative to the measurement surface can be varied; wherein said device includes at least one measurement means which determines an angular position of the device relative to the measurement surface, said measurement means is composed of at least one second radiation means which directs at least partially directional radiation at a predetermined angle towards the measurement surface; at least one second radiation means is provided which directs at least partially directional radiation at a predetermined angle towards the measurement surface; at least one second radiation detector means having a predetermined radiation detector surface which at least partially captures the radiation emitting from said second radiation means and reflected off the measurement surface and determines its position on the second radiation detector surface, wherein only selected areas of the second radiation detector surface are irradiated with radiation from the second radiation means, wherein the location of said irradiated areas depends on the angular position of the device relative to the measurement surface; and at least one indicator means connected to said second radiation detector means which outputs a measure for the location on said second radiation detector means on which a predetermined portion of radiation emitted from said second radiation detector means impinges, so as to enable a operator to set the adjustment means and thus adjust the device relative to the measurement surface such that it is tangential to the measurement surface in which position the radiation of the second radiation detector means impinging on the center of the second radiation detector surface and thus the indicator means display the radiation impinging on the center of the second radiation detector surface.