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특허 상세정보

Method for the growth of large low-defect single crystals

특허상세정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판) C30B-025/12    C30B-025/14   
미국특허분류(USC) 117/084; 117/093; 117/108; 117/109
출원번호 US-0633111 (2006-12-02)
등록번호 US-7449065 (2008-11-11)
발명자 / 주소
출원인 / 주소
대리인 / 주소
    McMahon,John P
인용정보 피인용 횟수 : 20  인용 특허 : 10
초록

A method and the benefits resulting from the product thereof are disclosed for the growth of large, low-defect single-crystals of tetrahedrally-bonded crystal materials. The process utilizes a uniquely designed crystal shape whereby the direction of rapid growth is parallel to a preferred crystal direction. By establishing several regions of growth, a large single crystal that is largely defect-free can be grown at high growth rates. This process is particularly suitable for producing products for wide-bandgap semiconductors, such as SiC, GaN, AlN, and d...

대표
청구항

What we claim is: 1. A method for crystal growth of a low-defect, tetrahedrally-bonded, single crystal comprising the steps of: a) providing a crystal seed having a defined vertical central axis with said central axis having a top and said central axis being parallel within 5 degrees to a selected crystal direction, with said crystal seed having several connected major portions substantially cylindrically symmetric about said central axis, and said major portions comprising of (1) a base located at the top of said central axis and having a diameter and ...

이 특허에 인용된 특허 (10)

  1. Larkin David J. (North Olmsted OH) Neudeck Philip G. (Strongsville OH) Powell J. Anthony (North Olmsted OH) Matus Lawrence G. (Amherst OH). Compound semiconductor and controlled doping thereof. USP1995115463978.
  2. Kordina Olle,SEX ; Hallin Christer,SEX ; Janzen Erik,SEX. Device and a method for epitaxially growing objects by CVD. USP1998015704985.
  3. Knippenberg Wilhelmus Franciscus (Eindhoven NL) Verspui Gerrit (Eindhoven NL). Filamentary silicon carbide crystals by VLS growth in molten iron. USP1977034013503.
  4. Neudeck, Philip G.; Powell, J. Anthony. Lateral movement of screw dislocations during homoepitaxial growth and devices yielded therefrom free of the detrimental effects of screw dislocations. USP2004086783592.
  5. Haggerty John S. (Lincoln MA) Menashi Wilson P. (Lexington MA) Wenckus Joseph F. (Needham MA). Method for forming refractory fibers by laser energy. USP1976033944640.
  6. Yury Alexandrovich Vodakov RU; Mark Grigorievich Ramm ; Evgeny Nikolaevich Mokhov RU; Alexandr Dmitrievich Roenkov RU; Yury Nikolaevich Makarov ; Sergei Yurievich Karpov RU; Mark Spiridonovich . Method for growing low defect density silicon carbide. USP2002086428621.
  7. J. Anthony Powell ; Philip G. Neudeck. Method for growing low-defect single crystal heteroepitaxial films. USP2002126488771.
  8. Powell J. Anthony ; Larkin David J. ; Neudeck Philip G. ; Matus Lawrence G.. Method for growth of crystal surfaces and growth of heteroepitaxial single crystal films thereon. USP1999065915194.
  9. Powell J. Anthony ; Larkin David J. ; Neudeck Philip G. ; Matus Lawrence G.. Method for growth of crystal surfaces and growth of heteroepitaxial single crystal films thereon. USP2000126165874.
  10. Barrett Donovan L. ; Thomas Richard N. ; Seidensticker ; deceased Raymond G. ; Hopkins Richard H.. Method of producing large diameter silicon carbide crystals. USP1998055746827.

이 특허를 인용한 특허 피인용횟수: 20

  1. Flowers, Mitchell; Wood, Simon; Milligan, James W.. Bandwidth limiting methods for GaN power transistors. USP2017059641163.
  2. Burrell, Anthony K.; McCleskey, Thomas Mark; Jia, Quanxi; Mueller, Alexander H.; Luo, Hongmei. Cubic nitride templates. USP2013048431253.
  3. Loboda, Mark; Parfeniuk, Christopher. Flat SiC semiconductor substrate. USP2015109165779.
  4. Loboda, Mark; Parfeniuk, Christopher. Flat SiC semiconductor substrate. USP2015049018639.
  5. Loboda, Mark; Chung, Gilyong. High voltage power semiconductor device on SiC. USP2016059337277.
  6. Loboda, Mark; Chung, Gilyong. High voltage power semiconductor devices on SiC. USP2014108860040.
  7. Zwieback, Ilya; Anderson, Thomas E.; Souzis, Andrew E.; Ruland, Gary E.; Gupta, Avinash K.; Rengarajan, Varatharajan; Wu, Ping; Xu, Xueping. Large diameter, high quality SiC single crystals, method and apparatus. USP201702RE46315.
  8. Zwieback, Ilya; Anderson, Thomas E.; Souzis, Andrew E.; Ruland, Gary E.; Gupta, Avinash K.; Rengarajan, Varatharajan; Wu, Ping; Xu, Xueping. Large diameter, high quality SiC single crystals, method and apparatus. USP2014068741413.
  9. Powell, Adrian; Brady, Mark; Mueller, Stephan G.; Tsvetkov, Valeri F.; Leonard, Robert T.. Low 1C screw dislocation 3 inch silicon carbide wafer. USP2014078785946.
  10. Loboda, Mark; Drachev, Roman; Hansen, Darren; Sanchez, Edward. Method for growing a SiC crystal by vapor deposition onto a seed crystal provided on a support shelf which permits thermal expansion. USP2017109797064.
  11. Loboda, Mark. Method for growing a SiC crystal by vapor deposition onto a seed crystal provided on a supporting shelf which permits thermal expansion. USP2017089738991.
  12. Hansen, Darren; Loboda, Mark; Manning, Ian; Moeggenborg, Kevin; Mueller, Stephan; Parfeniuk, Christopher; Quast, Jeffrey; Torres, Victor; Whiteley, Clinton. Method for manufacturing SiC wafer fit for integration with power device manufacturing technology. USP2016039279192.
  13. Hansen, Darren; Loboda, Mark; Manning, Ian; Moeggenborg, Kevin; Mueller, Stephan; Parfeniuk, Christopher; Quast, Jeffrey; Torres, Victor; Whiteley, Clinton. Method for manufacturing SiC wafer fit for integration with power device manufacturing technology. USP20180610002760.
  14. Ueta, Shunsaku; Hori, Tsutomu; Matsushima, Akira. Method for producing single crystal. USP2017109777401.
  15. Loboda, Mark. Method to reduce dislocations in SiC crystal growth. USP2015049017804.
  16. Filtvedt, Werner O.; Filtvedt, Josef. Reactor and method for production of silicon by chemical vapor deposition. USP2017109793116.
  17. Loboda, Mark J.; Zhang, Jie. SiC substrate with SiC epitaxial film. USP2015018940614.
  18. Hara, Kazukuni. Silicon carbide single crystal manufacturing apparatus. USP2017059644286.
  19. Fujibayashi, Hiroaki; Naito, Masami; Ooya, Nobuyuki. Single crystal compound semiconductor substrate. USP2013088507921.
  20. Fujibayashi, Hiroaki; Naito, Masami; Ooya, Nobuyuki. Stacked single crystal compound semiconductor substrates. USP2014048704340.