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Method for planar electroplating 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C25D-005/02
  • C25D-005/34
  • C25D-005/48
  • C25D-007/12
출원번호 US-0739822 (2003-12-17)
등록번호 US-7449098 (2008-11-11)
발명자 / 주소
  • Mayer,Steven T.
  • Reid,Jonathan D.
  • Rea,Mark L.
  • Emesh,Ismail T.
  • Meinhold,Henner W.
  • Drewery,John S.
출원인 / 주소
  • Novellus Systems, Inc.
대리인 / 주소
    Weaver Austin Villeneuve & Sampson LLP
인용정보 피인용 횟수 : 63  인용 특허 : 55

초록

A disclosed form of mechanically assisted electroplating leads to a flat, thin, overburden. In one example, an accelerator is deposited on a copper surface and mechanically removed in a simplified CMP-like apparatus. The wafer is then plated in an electrolyte containing little or no accelerating add

대표청구항

What is claimed is: 1. A method of planar plating, the method comprising: (a) providing a work piece having a surface with recessed regions and exposed regions; (b) plating metal onto the work piece under conditions that promote bottom-up fill in high aspect ratio features, whereby recessed regions

이 특허에 인용된 특허 (55)

  1. Weber, Robert J., Acoustically coupled antenna.
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  3. Kelly, John; van den Hoek, Wilbert G. H.; Drewery, John S., Apparatus for electrically planarizing semiconductor wafers.
  4. Talieh Homayoun ; Basol Bulent, Apparatus for forming an electrical contact with a semiconductor substrate.
  5. Talieh, Homayoun; Uzoh, Cyprian Emeka, Apparatus for plating and polishing a semiconductor workpiece.
  6. Loqvist Kaj-Ragnar (Fagersta SEX) Bennstedt Leif-Ake (Falun SEX), Apparatus for providing a surface coating on the wall in a cavity by means of electrolytic plating.
  7. Palnik Karl (Huntingdon Valley PA), Apparatus for selective electrolytic plating.
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  11. Weihs Timothy P. ; Mann Adrian B. ; Searson Peter C., Electrochemical-control of abrasive polishing and machining rates.
  12. Mayer Steven T. ; Contolini Robert J., Electroplanarization of large and small damascene features using diffusion barriers and electropolishing.
  13. Ashiru Oluwatoyin A. (c/o International Tin Research Institute ; Kingston Lane Uxbridge ; Middlesex UB8 3PJ GB2) Blunden Stephen J. (109 Twyford Road West Harrow ; Middlesex HA2 0SJ GB2), Electroplating.
  14. Reid, Jonathan D.; Smith, David; Mayer, Steven T.; Henri, Jon; Varadarajan, Sesha, Electroplating process for avoiding defects in metal features of integrated circuit devices.
  15. Cheung Robin W., Electropolishing copper film to enhance CMP throughput.
  16. Cheung Robin W. ; Ting Chiu H., Metallized interconnection structure and method of making the same.
  17. Cyprian Emeka Uzoh ; Homayoun Talieh, Method and apparatus for depositing and controlling the texture of a thin film.
  18. Van Anglen Erik S. (No. 1 Stonegate Rd. Quakertown PA 18951), Method and apparatus for depositing hard chrome coatings by brush plating.
  19. Van Anglen Erik S. (Quakertown PA) Keeney Harold M. (Whitehall PA), Method and apparatus for depositing hard chrome coatings by brush plating.
  20. Talieh Homayoun, Method and apparatus for electro-chemical mechanical deposition.
  21. Talieh, Homayoun, Method and apparatus for electro-chemical mechanical deposition.
  22. Keeney Harold M. (Whitehall PA) Van Anglen Erik S. (Quakertown PA) Forand James L. (Whitehall PA), Method and apparatus for electrolytic plating.
  23. Basol, Bulent M., Method and apparatus for filling low aspect ratio cavities with conductive material at high rate.
  24. Adams John A. ; Krulik Gerald A. ; Smith Everett D., Method and apparatus for planarization of metallized semiconductor wafers using a bipolar electrode assembly.
  25. Talieh Homayoun ; Uzoh Cyprian Emeka, Method and apparatus for plating and polishing a semiconductor substrate.
  26. Mishima, Koji; Nagai, Mizuki; Kimizuka, Ryoichi; Matsuda, Tetsuo; Kaneko, Hisashi, Method and apparatus for plating substrate with copper.
  27. Mayer Steven T. (Piedmont CA) Contolini Robert J. (Pleasanton CA) Bernhardt Anthony F. (Berkeley CA), Method and apparatus for spatially uniform electropolishing and electrolytic etching.
  28. Uzoh, Cyprian; Basol, Bulent M.; Talieh, Homayoun, Method and structure for thru-mask contact electrodeposition.
  29. Basol,Bulent M.; Talieh,Homayoun, Method and structure to improve reliability of copper interconnects.
  30. Reid, Jonathan David, Method for electrochemical planarization of metal surfaces.
  31. Basol, Bulent M.; Talieh, Homayoun; Uzoh, Cyprian E., Method for electrochemically processing a workpiece.
  32. Greenspan Alex, Method for electroforming an optical disk stamper.
  33. Viehbeck Aldred (Stormville) Buchwalter Stephen L. (Wappingers Falls) Glenning John J. (Vestal) Goldberg Martin J. (Mahopac NY) Kovac Caroline A. (Ridgefield CT) Matthew Linda C. (Peekskill NY) Pawlo, Method for etching an organic polymeric material.
  34. Joseph DiPalma, Method for forming an absorbent structure having vertically orientated flow regulating walls.
  35. Doubt Roark M. (Seattle WA), Method for plating conductive plastics.
  36. Kenneth P. Rodbell ; Panayotis C. Andricacos ; Cyril Cabral, Jr. ; Lynne M. Gignac ; Cyprian E. Uzoh ; Peter S. Locke, Method for plating copper conductors and devices formed.
  37. Adams John A. ; Krulik Gerald A. ; Smith Everett D., Method for simultaneous non-contact electrochemical plating and planarizing of semiconductor wafers using a bipiolar electrode assembly.
  38. Jalal Ashjaee ; Boguslaw A. Nagorski ; Bulent M. Basol ; Homayoun Talieh ; Cyprian Uzoh, Method of and apparatus for making electrical contact to wafer surface for full-face electroplating or electropolishing.
  39. Mseitif Walid M. (Seattle WA), Method of brush chrome plating using tank chrome plating solutions.
  40. Uzoh Cyprian Emeka ; Harper James McKell Edwin, Method of electrochemical mechanical planarization.
  41. Kuehnle Manfred R. (Lexington MA), Method of making photoconductive coating.
  42. Hui Wang, Methods and apparatus for end-point detection.
  43. Basol, Bulent M.; Uzoh, Cyprian E.; Talieh, Homayoun, Multi step electrodeposition process for reducing defects and minimizing film thickness.
  44. Teerlinck, Ivo; Mertens, Paul, Multi-step method for metal deposition.
  45. Kemp Richard A. (Stafford TX), Oligomerization catalyst and process.
  46. Hendriks Jan J. M. (Oedenrode NLX) Somers Gerard A. (Schayk NLX) van der Steen Henrica M. H. (Berlicum NLX), Plating compositions and processes.
  47. Basol, Bulent M., Plating method and apparatus for controlling deposition on predetermined portions of a workpiece.
  48. Basol, Bulent, Plating method and apparatus that creates a differential between additive disposed on a top surface and a cavity surface of a workpiece using an external influence.
  49. Contolini Robert J. (Pleasanton CA) Mayer Steven T. (San Leandro CA) Tarte Lisa A. (Livermore CA), Removal of field and embedded metal by spin spray etching.
  50. Talieh Homayoun, Reverse linear chemical mechanical polisher with loadable housing.
  51. Talieh Homayoun, Reverse linear polisher with loadable housing.
  52. Gulla Michael (Millis MA) Sricharoenchaikit Prasit (Millis MA), Selective metallization process.
  53. Shue Shau-Lin,TWX ; Yu Chen-Hua,TWX, Self-passivation of copper damascene.
  54. Uzoh Cyprian Emeka, Wafer edge deplater for chemical mechanical polishing of substrates.
  55. Uzoh, Cyprian Emeka; Talieh, Homayoun; Basol, Bulent; Young, Douglas W., Workpeice proximity plating apparatus.

이 특허를 인용한 특허 (63)

  1. Basker, Veeraraghavan S.; Cotte, John M.; Deligianni, Hariklia; Flotta, Matteo, Apparatus and method for electrochemical processing of thin films on resistive substrates.
  2. Kadija, Igor V., Apparatus and method of contact electroplating of isolated structures.
  3. Reid, Jonathan D.; Webb, Eric G.; Minshall, Edmund B.; Kepten, Avishai; Stowell, R. Marshall; Mayer, Steven T., Capping before barrier-removal IC fabrication method.
  4. Chandrasekhar, Prasanna, Complimentary polymer electrochromic device.
  5. Chandrasekhar, Prasanna, Complimentary polymer electrochromic device.
  6. Chandrasekhar, Prasanna, Complimentary polymer electrochromic device.
  7. Sulfridge, Marc, Conductive interconnect structures and formation methods using supercritical fluids.
  8. Sulfridge, Marc, Conductive interconnect structures and formation methods using supercritical fluids.
  9. Sulfridge, Marc, Conductive interconnect structures and formation methods using supercritical fluids.
  10. Chandrasekhar, Prasanna; Zay, Brian J.; Modes, Sr., Richard; LaRosa, Anthony; Hobin, Kyle, Electrochemical deposition apparatus and methods of using the same.
  11. Chandrasekhar, Prasanna; Zay, Brian J.; Laganis, Edward J.; Romanov, Vasily V.; LaRosa, Anthony J., Electrochromic eyewear.
  12. Dinneen, Daniel Mark; Duncan, James E., Electroplating and post-electrofill systems with integrated process edge imaging and metrology systems.
  13. Mayer, Steven T.; Koos, Daniel A.; Webb, Eric, Fabrication of semiconductor interconnect structure.
  14. Xu, Xingling; Webb, Eric, High speed copper plating bath.
  15. Arvin, Charles L.; Cox, Harry; Deligianni, Hariklia; Scott, George J., Method and apparatus for controlling and monitoring the potential.
  16. Arvin, Charles L.; Cox, Harry; Deligianni, Hariklia; Scott, George J., Method and apparatus for controlling and monitoring the potential.
  17. Vasilev, Vladislav, Method and apparatus for workpiece surface modification for selective material deposition.
  18. Vasilev, Vladislav, Method and apparatus for workpiece surface modification for selective material deposition.
  19. Basol, Bulent M., Method for controlling conductor deposition on predetermined portions of a wafer.
  20. Chong, Chin Hui; Lee, Choon Kuan, Method of manufacturing an interposer.
  21. Ishibashi, Yusuke; Konno, Yuya; Watanabe, Yujiro; Yasui, Toyoaki; Tanaka, Kazunari; Kawahara, Kosei; Fuchigami, Yohei; Nishina, Toshio, Method of manufacturing rotary machine, method of plating rotary machine, and rotary machine.
  22. Chen, Chao-Peng; Chudasama, Jas; Lam, Situan; Lin, Chien-Li, Method to reduce void formation during trapezoidal write pole plating in perpendicular recording.
  23. Reid, Jonathan; Varadarajan, Sesha; Emekli, Ugur, Methods and apparatus for depositing copper on tungsten.
  24. Reid, Jonathan; Varadarajan, Sesha; Emekli, Ugur, Methods and apparatus for depositing copper on tungsten.
  25. Dinneen, Daniel Mark; Mayer, Steven T., Methods and apparatuses for electroplating and seed layer detection.
  26. Dinneen, Daniel Mark; Mayer, Steven T., Methods and apparatuses for electroplating and seed layer detection.
  27. Ranjan, Manish; Sweeney, Cian; Ghongadi, Shantinath, Methods and apparatuses for estimating on-wafer oxide layer reduction effectiveness via color sensing.
  28. Sulfridge, Marc, Methods for forming interconnects in microelectronic workpieces and microelectronic workpieces formed using such methods.
  29. Sulfridge, Marc, Methods for forming interconnects in microelectronic workpieces and microelectronic workpieces formed using such methods.
  30. Sulfridge, Marc, Methods for forming interconnects in microelectronic workpieces and microelectronic workpieces formed using such methods.
  31. Kirby, Kyle K.; Parekh, Kunal R.; Niroumand, Sarah A., Microelectronic devices with through-substrate interconnects and associated methods of manufacturing.
  32. Hiatt, William M.; Dando, Ross S., Microfeature workpieces and methods for forming interconnects in microfeature workpieces.
  33. Tuttle, Mark E., Microfeature workpieces having interconnects and conductive backplanes, and associated systems and methods.
  34. Tuttle, Mark E., Microfeature workpieces having interconnects and conductive backplanes, and associated systems and methods.
  35. Mayer, Steven T.; Porter, David W., Modulated metal removal using localized wet etching.
  36. Thorum, Matthew Sherman; Mayer, Steven T., Monitoring electrolytes during electroplating.
  37. Mayer, Steven T., Monitoring leveler concentrations in electroplating solutions.
  38. Mayer, Steven T., Monitoring leveler concentrations in electroplating solutions.
  39. Mayer, Steven T.; Drewery, John Stephen; Webb, Eric G., Photoresist-free metal deposition.
  40. Lee, William T., Plated metal hard mask for vertical NAND hole etch.
  41. Basol, Bulent M., Plating methods for low aspect ratio cavities.
  42. Chandrasekhar, Prasanna; Chai, Yanjie, Potentiostat/galvanostat with digital interface.
  43. Cohen, Guy A.; Cordes, Steven A.; Goma, Sherif A.; Rosner, Joanna; Trewhella, Jeannine M., Processing for overcoming extreme topography.
  44. Cohen, Guy M.; Cordes, Steven A.; Goma, Sherif A.; Rosner, Joanna; Trewhella, Jeannine M., Processing for overcoming extreme topography.
  45. Mayer, Steven T.; Porter, David W., Reduced isotropic etchant material consumption and waste generation.
  46. Mayer, Steven T.; Porter, David W., Reduced isotropic etchant material consumption and waste generation.
  47. Mayer, Steven T.; Drewery, John S.; Hill, Richard S.; Archer, Timothy M.; Kepten, Avishai, Selective electrochemical accelerator removal.
  48. Mayer, Steven T.; Drewery, John; Hill, Richard S.; Archer, Timothy; Kepten, Avishai, Selective electrochemical accelerator removal.
  49. Mayer, Steven T.; Stowell, Marshall R.; Drewery, John S.; Hill, Richard S.; Archer, Timothy M.; Kepten, Avishai, Selective electrochemical accelerator removal.
  50. Mayer, Steven T.; Reid, Jonathan D., Semiconductive counter electrode for electrolytic current distribution control.
  51. Kirby, Kyle K.; Parekh, Kunal R., Semiconductor with through-substrate interconnect.
  52. Kirby, Kyle K.; Parekh, Kunal R., Semiconductor with through-substrate interconnect.
  53. Kirby, Kyle K.; Parekh, Kunal R., Semiconductor with through-substrate interconnect.
  54. Kirby, Kyle K.; Parekh, Kunal R., Semiconductor with through-substrate interconnect.
  55. Kirby, Kyle; Parekh, Kunal, Semiconductor with through-substrate interconnect.
  56. Brogan, Lee; Mayer, Steven T.; Thorum, Matthew; Richardson, Joseph; Porter, David W.; Fu, Haiying, TSV bath evaluation using field versus feature contrast.
  57. Mayer, Steven T.; Rea, Mark L.; Hill, Richard S.; Kepten, Avishai; Stowell, R. Marshall; Webb, Eric G., Topography reduction and control by selective accelerator removal.
  58. Mayer, Steven T.; Rea, Mark L.; Hill, Richard S.; Kepten, Avishai; Stowell, R. Marshall; Webb, Eric G., Topography reduction and control by selective accelerator removal.
  59. Chandrasekhar, Prasanna, Variable-emittance electrochromic devices and methods of preparing the same.
  60. Kirby, Kyle K.; Niroumand, Sarah A., Vias and conductive routing layers in semiconductor substrates.
  61. Mayer, Steven T.; Webb, Eric G.; Porter, David W., Wet etching methods for copper removal and planarization in semiconductor processing.
  62. Mayer, Steven T.; Webb, Eric; Porter, David W., Wet etching methods for copper removal and planarization in semiconductor processing.
  63. Mayer, Steven T.; Webb, Eric; Porter, David W., Wet etching methods for copper removal and planarization in semiconductor processing.
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