최소 단어 이상 선택하여야 합니다.
최대 10 단어까지만 선택 가능합니다.
다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
NTIS 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
DataON 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
Edison 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
Kafe 바로가기국가/구분 | United States(US) Patent 등록 |
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국제특허분류(IPC7판) |
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출원번호 | US-0410783 (2006-04-24) |
등록번호 | US-7449899 (2008-11-11) |
발명자 / 주소 |
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출원인 / 주소 |
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대리인 / 주소 |
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인용정보 | 피인용 횟수 : 8 인용 특허 : 903 |
A high frequency probe has contact tips located within the periphery of a terminal section of a coaxial cable and shielded by a ground conductor of the coaxial cable.
The invention claimed is: 1. A probe comprising: (a) a coaxial cable including an axially extending first conductor, a coaxial second conductor and a dielectric, said coaxial cable terminating in a terminal section oblique to a longitudinal axis of said coaxial cable; (b) a dielectric substrate aff
The invention claimed is: 1. A probe comprising: (a) a coaxial cable including an axially extending first conductor, a coaxial second conductor and a dielectric, said coaxial cable terminating in a terminal section oblique to a longitudinal axis of said coaxial cable; (b) a dielectric substrate affixed to said coaxial cable with a first side proximate said terminal section and a second side remote from said terminal section; (c) a first conductive member conductively connecting said first conductor to a first contact located on said second side of said dielectric substrate, nearer a periphery of said terminal section than a center of said terminal section and substantially within said periphery of said terminal section, said first contact engageable with a device to be tested; and (d) a second conductive member conductively connecting said second conductor to a second contact located on said second side of said dielectric substrate, nearer said periphery of said terminal section than said center of said terminal section and substantially within said periphery of said terminal section. 2. The probe of claim 1 wherein said first conductive member is located substantially within said periphery of said terminal section. 3. The probe of claim 2 wherein said second conductive member is located substantially within said periphery of said terminal section. 4. The probe of claim 1 further comprising a third contact conductively connected to said second conductor and located substantially within said periphery of said terminal section on said second side of said dielectric substrate. 5. The probe of claim 4 wherein said conductive connection of said third contact to said second conductor is located substantially within said periphery of said terminal section. 6. The probe of claim 1 wherein said oblique terminal section comprises: (a) a first oblique substantially planar section of said coaxial cable; and (b) an intersecting second oblique section of said coaxial cable. 7. The probe of claim 6 wherein said second oblique section intersects said first oblique planar section proximate said first contact. 8. The probe of claim 6 wherein said second oblique section is substantially normal to said first oblique planar section. 9. The probe of claim 1 wherein said second conductive member further comprises a planar portion adjacent to but free of conductive connection with said first contact. 10. The probe of claim 9 wherein said second conductive member is conductively connected to a ground. 11. The probe of claim 1 wherein said dielectric substrate comprises: (a) a first dielectric layer having a first side and a second side; (b) a conductive layer having a first side in contact with said second side of said first dielectric layer and a second side; and (c) a second dielectric layer having a first side in contact with said second side of conductive layer and a second side. 12. The probe of claim 1 wherein one of said first and said second conductive members comprises: (a) a contact tip; and (b) a substantially planar conductive shield conductively connected to said contact tip and electrically isolated from the other of said first and said second conductive members, said conductive shield coextensive with a greater area of said terminal section than an area of said contact tip. 13. A probing system comprising: (a) a first probe comprising: (i) a coaxial cable including an axially extending first conductor and a coaxial second conductor, said coaxial cable terminating in a terminal section oblique to a longitudinal axis of said coaxial cable; (ii) a first contact tip conductively connected to said first conductor and located nearer a periphery of said terminal section of said coaxial cable than a center of said terminal section and substantially within said periphery of said terminal section; and (iii) a second contact tip conductively connected to said second conductor and located nearer said periphery of said terminal section than said center of said terminal section and substantially within said periphery of said terminal section; and (b) a second probe comprising: (i) a coaxial cable including an axially extending first conductor and a coaxial second conductor, said coaxial cable terminating in a terminal section oblique to a longitudinal axis of said coaxial cable; (ii) a first contact tip conductively connected to said first conductor and located nearer a periphery of said terminal section of said coaxial cable than a center of said terminal section and substantially within said periphery of said terminal section; and (iii) a second contact tip conductively connected to said second conductor and located nearer said periphery of said terminal section than said center of said terminal section and substantially within said periphery of said terminal section, crosstalk between said second contact tip of said first probe and a contact tip of said second probe spaced 150 micrometers apart said second contact tip of said first probe on a ground being less than-42 dB for an applied signal frequency of 30 gigahertz. 14. The probing system of claim 13 wherein said crosstalk is less than-47 dB for said applied signal frequency of 30 gigahertz. 15. The probing system of claim 13 wherein said crosstalk is less than-50 dB for said applied signal frequency of 30 gigahertz. 16. A probe comprising: (a) a coaxial cable including an axially extending first conductor, a coaxial second conductor conductively connected to a ground, and a dielectric, said coaxial cable terminating in a terminal section oblique to a longitudinal axis of said coaxial cable; (b) a first contact located substantially within a periphery of said terminal section and conductively connected said first conductor, said first contact engageable with a device to be tested; and (c) a conductive member conductively connecting said second conductor to a second contact located substantially within said periphery of said terminal section, said conductive member including a substantially planar conductor located proximate to but conductively disconnected from said first contact. 17. The probe of claim 16 wherein said conductive member is located substantially within said periphery of said terminal section. 18. The probe of claim 16 further comprising a second conductive member conductively connecting said second conductor to a third contact located substantially within said periphery of said terminal section, said second conductive member including a substantially planar conductor located proximate to but conductively disconnected from said first contact. 19. The probe of claim 16 wherein said terminal section comprises an oblique substantially planar first section of said coaxial cable intersected by a second oblique section of said coaxial cable. 20. The probe of claim 19 wherein said second oblique section intersects said first section proximate said first contact.
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