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Device and method for resonant high-speed microscopic impedance probe 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-019/00
  • G01F-023/26
  • G01F-023/22
  • A61B-005/05
출원번호 US-0460965 (2006-07-28)
등록번호 US-7451646 (2008-11-18)
발명자 / 주소
  • Cleland,Andrew N.
  • Soh,Hyongsok T.
출원인 / 주소
  • The Regents of the University of California
대리인 / 주소
    Quine Intellectual Property Law Group
인용정보 피인용 횟수 : 16  인용 특허 : 19

초록

A resonant high-speed microscopic impedance probe useful for small scale impedance measurements and/or cell and particle counting.

대표청구항

What is claimed is: 1. A device capable of measuring impedance variances in a small region comprising: a probe electrode separated by one or more non-conducting regions from one or more shield electrodes; a detecting end of said probe electrode that can be placed in close proximity to said small re

이 특허에 인용된 특허 (19)

  1. Tomita Eisuke (Tokyo JPX) Sakuhara Toshihiko (Tokyo JPX) Itaya Kingo (Sendai JPX), Apparatus and method for tunnel current measurement observed simultaneously with electrochemical measurement.
  2. Buzzanca Giovanni (Bergamo ITX) Ronchetti Camillo (Milan ITX) Uberti Franco (Milan ITX) Anzani Renato (Milan ITX), Apparatus for measuring the degree of sensitization of metal articles.
  3. Baughman James S. (Stanwood MI), Capacitance-type material level indicator.
  4. Lindsay Stuart M. (Tempe AZ), Cell and substrate for electrochemical STM studies.
  5. Hansma Paul K. (Isla Vista CA) Walters Deron A. (Goleta CA) Hillner Paul E. (Berlin DEX), Combined scanning probe and scanning energy microscope.
  6. van der Weide Daniel Warren, Combined topography and electromagnetic field scanning probe microscope.
  7. Petric Paul F. (Swampscott MA) Foley Michael S. (Beverly MA) Utlaut Mark W. (Beverly MA) Laiacano Joseph A. (Gloucester MA), Gap control system for localized vacuum processing.
  8. Bard Allen J. (Austin TX) Huesser Oskar E. (Austin TX) Craston Derek H. (Crowborough GB3), High resolution deposition and etching in polymer films.
  9. Anlage Steven Mark ; Wellstood Frederick Charles ; Vlahacos Kosta ; Steinhauer David E., Near-field scanning microwave microscope having a transmission line with an open end.
  10. Chamberlin Ralph V. (Tempe AZ) DiCarlo Anthony (Holladay UT), Non-contact force microscope having a coaxial cantilever-tip configuration.
  11. Kwak Juhyoun (Pasadena CA) Bard Allen J. (Austin) Fan Fu-Ren F. (Austin TX), Scanning electrochemical microscopy.
  12. Hansma Paul K. (Santa Barbara CA) Drake Barney (Santa Barbara CA), Scanning ion conductance microscope.
  13. Keilmann Fritz (Stuttgart DEX), Scanning tip for optical radiation.
  14. Xiang Xiao-Dong ; Schultz Peter G. ; Wei Tao, Scanning tip microwave near field microscope.
  15. Binnig Gerd (Richterswil CHX) Rohrer Heinrich (Richterswil CHX), Scanning tunneling microscope.
  16. Johnson, Wayne; Parsons, Richard, System and method for monitoring and controlling gas plasma processes.
  17. Wayne Johnson ; Richard Parsons, System and method for monitoring and controlling gas plasma processes.
  18. Elings Virgil B. (Santa Barbara CA) Gurley John A. (Santa Barbara CA), Tapping atomic force microscope with phase or frequency detection.
  19. Nees John A. (Ann Arbor MI) Wakana Shin-ichi (Sagamihara JPX), Ultrafast electrical scanning force microscope probe.

이 특허를 인용한 특허 (16)

  1. Kane, Terence L.; Walsh, John M., Atom probe tomography sample preparation for three-dimensional (3D) semiconductor devices.
  2. Kane, Terence L.; Walsh, John M., Atom probe tomography sample preparation for three-dimensional (3D) semiconductor devices.
  3. Kane, Terence L.; Stanton, Matthew F.; Tenney, Michael P., High frequency capacitance-voltage nanoprobing characterization.
  4. Richards, William L.; Ashby, Austin; Ketterer, Matthew; Marshall, Kevin; Harrison, Josh; Mette, Matthew; Richards, Paul; Showalter, Wayne; Cote, Jasmin; Halbert, Phillip C.; Bourgeois, Solene; Metzger, Steven W.; Hance, Ken; Mensack, Meghan; Michel, Carlos; Allers, Elke; Gamage, Dulini; Prisbrey, Landon; Gusyatin, Oleg; Shamsheyeva, Alena; Turng, Ben; Ghusson, Andrew; Reinhardt, Kurt, Instrument and system for rapid microogranism identification and antimicrobial agent susceptibility testing.
  5. Richards, William L.; Ashby, Austin; Ketterer, Matthew; Marshall, Kevin; Harrison, Josh; Mette, Matthew; Richards, Paul; Showalter, Wayne; Cote, Jasmin; Halbert, Phillip C.; Bourgeois, Solene; Metzger, Steven W.; Hance, Ken; Mensack, Meghan; Michel, Carlos; Allers, Elke; Gamage, Dulini; Prisbrey, Landon; Gusyatin, Oleg; Shamsheyeva, Alena; Turng, Ben; Ghusson, Andrew; Reinhardt, Kurt, Instrument and system for rapid microorganism identification and antimicrobial agent susceptibility testing.
  6. Prisbrey, Landon; Blackmore, Elise; Hance, Kenneth R.; Metzger, Steven W.; Marshall, Kevin, Membrane-assisted purification.
  7. Ni, Cheng Chin, Probe card assembly and test probes therein.
  8. Pai, Woei-Wu; Li, Huan-Hsin; Chen, I-Jan, Radio-frequency reflectometry scanning tunneling microscope.
  9. Pai, Woei-Wu; Li, Huan-Hsin; Chen, I-Jan; Chao, Yen-Cheng, Radio-frequency reflectometry scanning tunneling microscope.
  10. Metzger, Steven W.; Hance, Kenneth Robert, Rapid cell purification systems.
  11. Metzger, Steven W.; Hance, Kenneth Robert, Rapid cell purification systems.
  12. Metzger, Steven W.; Hance, Kenneth Robert, Rapid cell purification systems.
  13. Shamsheyeva, Alena; Howson, David C.; Metzger, Steven W., Rapid determination of microbial growth and antimicrobial susceptibility.
  14. Metzger, Steven W.; Howson, David C.; Goldberg, David A.; Buttry, Daniel A., Rapid microbial detection and antimicrobial susceptibility testing.
  15. Goldberg, David A.; Howson, David C.; Metzger, Steven W.; Buttry, Daniel A.; Saavedra, Steven Scott, Sensitive and rapid determination of antimicrobial susceptibility.
  16. Kott, Norbert; Rempel, Steven; Janzen, Orlando C.; Adeleye, Ayodele; Tam, Edmond; Cheng, James, Timing assembly for a manufactured wood products press.
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