초록 ▼

A device is provided for measuring roundness of a mechanical object even if the mechanical object performs an orbit movement. The orbital movement and the surface roundness are separated. It is even possible to divide the orbital movement into an x component and a y component. The measurement is acc

A device is provided for measuring roundness of a mechanical object even if the mechanical object performs an orbit movement. The orbital movement and the surface roundness are separated. It is even possible to divide the orbital movement into an x component and a y component. The measurement is accomplished in a single measurement. After measuring it is possible to decide what to indicate: the orbit of the mechanical object, the deviation from a nominally round surface, or the combination of both. This is possible since once the data has been obtained it is then possible to use the data once or a number of times to indicate the orbit of the mechanical object, the deviation from a nominally round surface, or the combination of both.

대표청구항 ▼

What is claimed is: 1. A device for indicating at least one of an orbit of, and a deviation from a nominally round surface of a mechanical object, the device comprising: a processor; and output means for outputting a deviation profile, wherein the processor for generating the deviation profile base

What is claimed is: 1. A device for indicating at least one of an orbit of, and a deviation from a nominally round surface of a mechanical object, the device comprising: a processor; and output means for outputting a deviation profile, wherein the processor for generating the deviation profile based on distance data sets covering the nominally round surface; each distance data set comprising at least three distances, measured in a direction of rotation, to the nominally round surface and related to an angle, the at least three distances having been measured at distance measuring angles; and the processor for indicating the deviation profile using the output means wherein the distance measuring angles are selected such that the locations of zeroes in a transfer function used in generating the deviation profile are satisfactory. 2. The device according to claim 1, wherein the processor is further configured for generating the deviation profile by solving a system of simultaneous equations including the distance data sets and the distance measuring angles. 3. The device according to claim 1, wherein the processor is further configured for generating the deviation profile including forming linear combinations of the distance data sets and weights related to the distance measuring angles. 4. The device according to claim 1, wherein the processor is further configured to use Fourier transforms in generating the deviation profile. 5. The device according to claim 1, wherein the processor for indicating a quality of the distance measuring angles. 6. The device according to claim 1, wherein, in case the distance data sets comprise more than three distances, the processor for estimating a measurement error limit. 7. The device according to claim 1, wherein the quality of a nominally round surface is determined. 8. The device according to claim 1, further comprising a distance measuring arrangement comprising at least three distance gauges for measuring the at least three distances. 9. The device according to claim 8, wherein the distance measuring arrangement is constituted by a support frame and the at least three distance gauges are arranged thereto in relation to the distance measuring angles. 10. The device according to claim 8, wherein the distance measuring arrangement is constituted by separate support elements, of which each presents at least one distance gauge. 11. The device according to claim 8, wherein the distance measuring arrangement further comprises at least one A/D converter for converting distances measured by the at least three distance gauges. 12. Amended) The device according to claim 8, wherein the distance measuring arrangement further comprises an encoder. 13. The device according to claim 8, wherein the distance measuring angles are 3P1/4, 0 (zero), and 7P116. 14. The device according to claim 3, wherein the processor for indicating, using the output means, a function deviation of one or more details of manufacturing equipment having processed the surface based on the correspondence between a Fourier transformation of the deviation profile and at least one function deviation indicating frequency. 15. The device according to claim 14, wherein the distance data corresponds to a line of the surface of the mechanical object, the line being in one of: a processing direction of the manufacturing equipment, and at least presenting a component in the processing direction of the manufacturing equipment. 16. The device according to claim 14, wherein the manufacturing equipment is constituted by at least one of the equipment types for grinding, hot rolling, cold rolling, turning, milling, printing, polishing, and honing. 17. The device according to claim 14, wherein the processor is arranged to generate a frequency map comprising a set of function deviation indicating frequencies. 18. A storage means comprising distance data usable for a device according to claim 1, the storage means comprising sets of at least three distances to a nominally round surface related to an angle and having been measured at distance measuring angles. 19. The device for measuring distance data sets as input to a device according to claim 1, comprising an encoder and a distance measuring arrangement comprising at least three distance gauges for measuring at least three distances, wherein each distance data set comprises the at least three distances to the nominally round surface and related to an angle, and the at least three distances measured at distance measuring angles. 20. The device according to claim 19, wherein the distance measuring arrangement is constituted by a support frame and the at least three distance gauges are arranged thereto in relation to the distance measuring angles. 21. The device according to claim 19, wherein the distance measuring arrangement is constituted by separate support elements, of which each presents at least one distance gauge. 22. The device according to claim 19, wherein the distance measuring arrangement further comprises at least one A/D converter for converting distances measured by the at least three distance gauges. 23. The device according to claim 19, further comprising a storage means for storing the distance data sets. 24. The device according to claim 19, further comprising means for storing distance data sets on a portable media. 25. A method for indicating at least one of an orbit of, and a deviation from a nominally round surface of a mechanical object, the method comprising the steps of: generating a deviation profile based on distance data sets covering the nominally round surface, each distance data set comprising at least three distances, measured in a direction of rotation, to the nominally round surface and related to an angle, the at least three distances having been measured at distance measuring angles; and indicating the deviation profile. 26. The method according to claim 25, further comprising the step of generating the deviation profile by solving a system of simultaneous equations including the distance data sets and the distance measuring angles. 27. The method according to claim 25, further comprising the step of Fourier transforming the deviation profile. 28. The method according to claim 25, further comprising the step of indicating a quality of the distance measuring angles. 29. The method according to claim 25, wherein the distance measuring angles are 3P1/4, 0 (zero), and 7P1/6. 30. The method according to claim 25, further comprising the step of estimating a measurement error limit, in case the distance data sets comprise more than three distances. 31. The method according to claim 25 for indicating the quality of a nominally round surface. 32. The method according to claim 27, further comprising the step of: indicating a function deviation of one or more details of manufacturing equipment having processed the surface based on the correspondence between the Fourier transformation of the deviation profile and at least one function deviation indicating frequency. 33. The method according to claim 32, wherein the distance data corresponds to a line of the surface of the mechanical object, the line being in one of: a processing direction of the manufacturing equipment, and at least presenting a component in the processing direction of the manufacturing equipment. 34. The method according to claim 32, wherein the manufacturing equipment is constituted by at least one of the equipment types for grinding, hot rolling, cold rolling, turning, milling, printing, polishing, and honing. 35. The method according to claim 32, further comprising the step of configuring a frequency map comprising a set of function deviation indicating frequencies. 36. A computer program product loadable into the internal memory of a computer, comprising software code portions for performing the method of claim 25, when run on a computer. 37. A carrier characterized by comprising the computer program product in claim 36. 38. The method of claim 18, wherein the step of generating the deviation profile, R, is based on the following expression: AR=G, where A is a matrix based on the distance measuring angles, R is a vector comprising the deviation profile, and G is a matrix comprising the distances data sets. 39. The method of claim 38, wherein the vector R comprises stacked data concerning the deviation from a nominally round surface and the orbit in two dimensions of the mechanical object. 40. The method of claim 38, wherein the vector R is in the form of a matrix. 41. The method of claim 18, wherein the step of generating the deviation profile, R, based on the following expression, in the case the distance data sets comprise three distances: kr=R, where where r is a vector comprising ri being the distance read by distance gauge i (i=1 . . .n) and k is a vector comprising weights ki (i=1 . . . n). 42. A device for indicating at least one of an orbit of, and a deviation from a nominally round surface of a mechanical object, the device comprising: a processor; and output means for outputting a deviation profile, wherein the processor for generating the deviation profile based on distance data sets covering the nominally round surface; each distance data set comprising at least three distances, measured in a direction of rotation, to the nominally round surface and related to an angle, the at least three distances having been measured at distance measuring angles; and the processor for indicating the deviation profile using the output means, wherein the step of generating the deviation profile, R, is based on the following expression: AR=G, where A is a matrix based on the distance measuring angles, R is a vector comprising the deviation profile, and G is a matrix comprising the distances data sets. 43. The device of claim 42, wherein the vector R comprises stacked data concerning the deviation from a nominally round surface and the orbit in two dimensions of the mechanical object. 44. The device of claim 42, wherein the vector R is in the form of a matrix. 45. A device for indicating at least one of an orbit of, and a deviation from a nominally round surface of a mechanical object, the device comprising: a processor; and output means for outputting a deviation profile, wherein the processor for generating the deviation profile based on distance data sets covering the nominally round surface; each distance data set comprising at least three distances, measured in a direction of rotation, to the nominally round surface and related to an angle, the at least three distances having been measured at distance measuring angles; and the processor for indicating the deviation profile using the output means, wherein the step of generating the deviation profile, R, is based on the following expression, in the case the distance data sets comprise three distances: kr=R, where where r is a vector comprising ri being the distance read by distance gauge i (i=1 . . .n) and k is a vector comprising weights k1 (i=1 . . .n).