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Method of fabricating a semiconductor device 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/30
  • H01L-021/02
  • H01L-021/84
  • H01L-021/70
출원번호 US-0926573 (2007-10-29)
등록번호 US-7473592 (2009-01-06)
우선권정보 JP-10-251635(1998-09-04)
발명자 / 주소
  • Yamazaki,Shunpei
  • Ohtani,Hisashi
출원인 / 주소
  • Semiconductor Energy Laboratory Co., Ltd.
대리인 / 주소
    Cook Alex Ltd.
인용정보 피인용 횟수 : 34  인용 특허 : 84

초록

A semiconductor device with high reliability is provided using an SOI substrate. When the SOI substrate is fabricated by using a technique typified by SIMOX, ELTRAN, or Smart-Cut, a single crystal semiconductor substrate having a main surface (crystal face) of a {110} plane is used. In such an SOI s

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이 특허에 인용된 특허 (84)

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  78. Kinugawa Masaaki (Tokyo JPX), Short channel CMOS on 110 crystal plane.
  79. Matloubian Mishel (Dallas TX), Sidewall channel stop process.
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이 특허를 인용한 특허 (34)

  1. Takahashi, Kei; Murakami, Satoshi; Ozawa, Suguru, Display device and method for manufacturing thereof.
  2. Yamazaki, Shunpei, Light-emitting device.
  3. Yamazaki, Shunpei, Light-emitting device including color filter and black matrix.
  4. Ohnuma, Hideto; Momo, Junpei; Yamazaki, Shunpei, Manufacturing method of SOI substrate and manufacturing method of semiconductor device.
  5. Shimomura, Akihisa; Ohnuma, Hideto; Momo, Junpei; Yamazaki, Shunpei, Method for manufacturing SOI substrate.
  6. Yamazaki, Shunpei; Nishida, Eriko, Method for manufacturing SOI substrate and method for manufacturing semiconductor device.
  7. Yamazaki, Shunpei; Nishida, Eriko; Shimazu, Takashi, Method for manufacturing SOI substrate and method for manufacturing semiconductor device.
  8. Yamazaki, Shunpei; Nishida, Eriko; Shimazu, Takashi, Method for manufacturing SOI substrate and semiconductor device.
  9. Yamazaki, Shunpei; Nishida, Eriko; Shimazu, Takashi, Method for manufacturing SOI substrate in which crystal defects of a single crystal semiconductor layer are reduced and method for manufacturing semiconductor device.
  10. Shimomura, Akihisa; Tsukamoto, Naoki, Method for manufacturing a semiconductor substrate by laser irradiation.
  11. Yamazaki, Shunpei; Momo, Junpei; Isaka, Fumito; Higa, Eiji; Koyama, Masaki; Shimomura, Akihisa, Method for manufacturing semiconductor device.
  12. Yamazaki, Shunpei, Method for manufacturing semiconductor substrate and method for manufacturing semiconductor device.
  13. Yamazaki, Shunpei; Ohtani, Hisashi, Method of fabricating a semiconductor device.
  14. Yamazaki, Shunpei; Ohtani, Hisashi, Method of fabricating a semiconductor device.
  15. Yamazaki, Shunpei; Ohtani, Hisashi, Method of fabricating a semiconductor device.
  16. Yamazaki, Shunpei; Ohtani, Hisashi, Method of fabricating a semiconductor device.
  17. Yamazaki, Shunpei; Ohtani, Hisashi, Method of fabricating a semiconductor device.
  18. Yamazaki, Shunpei; Ohtani, Hisashi, Method of fabricating a semiconductor device.
  19. Yamazaki, Shunpei, Method of manufacturing a semiconductor device.
  20. Yamazaki, Shunpei, Method of manufacturing a semiconductor device.
  21. Yamazaki, Shunpei, Method of manufacturing a semiconductor device.
  22. Yamazaki, Shunpei, Method of manufacturing a semiconductor device.
  23. Yamazaki, Shunpei, Method of manufacturing a semiconductor device.
  24. Yamazaki, Shunpei, Method of manufacturing a semiconductor device having a gate electrode formed over a silicon oxide insulating layer.
  25. Yamazaki, Shunpei, Method of manufacturing a semiconductor device including thermal oxidation to form an insulating film.
  26. Yamazaki, Shunpei, Method of manufacturing semiconductor device having island-like single crystal semiconductor layer.
  27. Yamazaki, Shunpei; Ohtani, Hisashi; Koyama, Jun; Fukunaga, Takeshi, Nonvolatile memory and electronic apparatus.
  28. Fukunaga, Takeshi, Process for production of SOI substrate and process for production of semiconductor device.
  29. Fukunaga, Takeshi, Process for production of SOI substrate and process for production of semiconductor device including the selective forming of porous layer.
  30. Yamazaki, Shunpei, Semiconductor device.
  31. Maruyama, Hotaka; Akimoto, Kengo, Semiconductor device and manufacturing method thereof.
  32. Akimoto, Kengo, Semiconductor device and method for manufacturing the same.
  33. Yamazaki, Shunpei, Semiconductor device having a display portion.
  34. Yamazaki, Shunpei; Ohtani, Hisashi; Koyama, Jun; Fukunaga, Takeshi, Semiconductor device having buried oxide film.
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