Gas distribution plate fabricated from a solid yttrium oxide-comprising substrate
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
C23C-016/00
B05D-003/12
출원번호
US-0918232
(2004-08-13)
등록번호
US-7479304
(2009-01-20)
발명자
/ 주소
Sun,Jennifer Y.
Thach,Senh
Dempster,James
Xu,Li
Pham,Thanh N.
출원인 / 주소
Applied Materials, Inc.
대리인 / 주소
Law Office of Shirley L. Church
인용정보
피인용 횟수 :
25인용 특허 :
13
초록▼
Disclosed herein is a gas distribution plate for use in a gas distribution assembly for a processing chamber, where the gas distribution plate is fabricated from a solid yttrium oxide-comprising substrate, which may also include aluminum oxide. The gas distribution plate includes a plurality of thro
Disclosed herein is a gas distribution plate for use in a gas distribution assembly for a processing chamber, where the gas distribution plate is fabricated from a solid yttrium oxide-comprising substrate, which may also include aluminum oxide. The gas distribution plate includes a plurality of through-holes, which are typically crescent-shaped. Through-holes which have been formed in the solid yttrium oxide-comprising substrate by ultrasonic drilling perform particularly well. The solid yttrium oxide-comprising substrate typically comprises at least 99.9% yttrium oxide, and has a density of at least 4.92 g/cm3, a water absorbency of about 0.02% or less, and an average grain size within the range of about 10 μm to about 25 μm. Also disclosed herein are methods for fabricating and cleaning the yttrium oxide-comprising gas distribution plate.
대표청구항▼
We claim: 1. A method of fabricating a gas distribution plate for use in a gas distribution assembly in a semiconductor processing chamber, said method comprising: a) selecting a substrate to be used to fabricate said gas distribution plate, wherein said substrate consists of yttrium oxide includin
We claim: 1. A method of fabricating a gas distribution plate for use in a gas distribution assembly in a semiconductor processing chamber, said method comprising: a) selecting a substrate to be used to fabricate said gas distribution plate, wherein said substrate consists of yttrium oxide including from 0% up to about 10% by volume aluminum oxide; b) treating a surface of said substrate to fluoridate said surface; c) creating openings through said substrate, wherein said openings are created either before or after said treating of said substrate surface. 2. A method in accordance with claim 1, wherein a surface of said gas distribution plate is treated with fluorine species using a wet rub technique, whereby the surface characteristics of said substrate are improved with respect to mobile metal impurity content and the amount of loose particles present on said substrate surface. 3. A method in accordance with claim 1, wherein a plurality of through-holes are created in said substrate using ultrasonic drilling. 4. A method in accordance with claim 3, wherein said through-holes are crescent-shaped. 5. A method in accordance with claim 3, wherein, prior to said ultrasonic drilling, a layer of sacrificial material is applied over at least a portion of said substrate surface. 6. A method in accordance with claim 5, wherein said sacrificial material is a polymeric material. 7. A method in accordance with claim 5, wherein said sacrificial material is an inorganic material having a thermal coefficient of linear expansion which is similar to a thermal coefficient of linear expansion of said yttrium oxide. 8. A method in accordance with claim 6 or claim 7, wherein said sacrificial layer has a thickness within the range of about 4 mils to about 6 mils. 9. A method of fabricating a gas distribution plate for use in a gas distribution assembly in a semiconductor processing chamber, said method comprising: a) selecting a substrate to be used to fabricate said gas distribution plate, wherein said substrate consists of yttrium oxide including from 0% up to about 10% by volume aluminum oxide; b) treating a surface of said substrate to fluoridate said surface, wherein a said surface is treated with fluorine species, using a plasma having a density in the range of about 1×109 e-/cm3, whereby the surface characteristics of said substrate are improved with respect to mobile metal impurity content and the amount of loose particles present on said substrate surface; and c) creating openings through said substrate, wherein said openings are created either before or after said treating of said substrate surface. 10. A method in accordance with claim 9, wherein said fluorine-containing plasma is generated from a source gas comprising CF4. 11. A method in accordance with claim 9, wherein a plurality of through-holes are created in said substrate using ultrasonic drilling. 12. A method in accordance with claim 11, wherein said through-holes are crescent-shaped. 13. A method in accordance with claim 11, wherein, prior to said ultrasonic drilling, a layer of sacrificial material is applied over at least a portion of said substrate surface. 14. A method in accordance with claim 13, wherein said sacrificial material is a polymeric material. 15. A method in accordance with claim 13, wherein said sacrificial material is an inorganic material having a thermal coefficient of linear expansion which is similar to a thermal coefficient of linear expansion of said yttrium oxide. 16. A method in accordance with claim 14 or claim 15, wherein said sacrificial layer has a thickness within the range of about 4 mils to about 6 mils.
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