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Certain exemplary embodiments comprise a method, which can comprise configuring a system to compare an electrical value and a selected pre-stored threshold value of a plurality of pre-stored threshold values. The method can comprise configuring the system to modify the plurality of pre-stored thresh

Certain exemplary embodiments comprise a method, which can comprise configuring a system to compare an electrical value and a selected pre-stored threshold value of a plurality of pre-stored threshold values. The method can comprise configuring the system to modify the plurality of pre-stored threshold values based upon a predetermined change in measured temperature.

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What is claimed is: 1. A method comprising: configuring a system to compare an electrical value and a selected pre-stored threshold value of a plurality of pre-stored threshold values, said electrical value related to a measurement provided by a sensor associated with an arc fault detection system;

What is claimed is: 1. A method comprising: configuring a system to compare an electrical value and a selected pre-stored threshold value of a plurality of pre-stored threshold values, said electrical value related to a measurement provided by a sensor associated with an arc fault detection system; and configuring said system to trip a protective device in an electrical circuit responsive to a detected arc fault, said arc fault detected based upon said plurality of pre-stored threshold values, said plurality of pre-stored threshold values automatically modified responsive to a predetermined change in measured temperature, said system adapted to sample said measured temperature at a lower rate than a sampling rate of said electrical measurement. 2. The method of claim 1, further comprising: configuring said system to select said selected pre-stored threshold value from said plurality of pre-stored threshold values based upon said measurement provided by said sensor and said measured temperature. 3. The method of claim 1, further comprising: configuring said system to obtain said measurement provided by said sensor via a resistive sensor. 4. The method of claim 1, further comprising: configuring said system to obtain said measurement provided by said sensor via a current transformer. 5. The method of claim 1, further comprising: configuring said system to obtain said measurement provided by said sensor via a Rogowski coil. 6. The method of claim 1, further comprising: configuring said system to obtain said measured temperature via an on-chip temperature sensor. 7. The method of claim 1, further comprising: configuring said system to convert said measured temperature from an analog signal to a digital signal. 8. The method of claim 1, further comprising: configuring said system to sample a waveform to determine said electrical value. 9. The method of claim 1, further comprising: configuring said system to send said electrical value to an information device. 10. The method of claim 1, further comprising: configuring said system to determine said plurality of pre-stored threshold values. 11. The method of claim 1, further comprising: configuring said system to determine said plurality of pre-stored threshold values after a delay time to allow for self-heating of said sensor. 12. The method of claim 1, further comprising: configuring said system to determine said plurality of pre-stored threshold values responsive to a sensed temperature, said sensed temperature processed via a method comprising an analog to digital conversion. 13. The method of claim 1, further comprising: configuring said system to determine said plurality of pre-stored threshold values responsive to a sensed temperature processed via a method comprising an analog to digital conversion performed via an information device. 14. The method of claim 1, further comprising: configuring said system to sample said temperature measurement at said lower rate based upon a microprocessor pin voltage. 15. The method of claim 1, further comprising: configuring said system to select said plurality of pre-stored threshold values based upon said measured temperature, wherein said plurality of pre-stored threshold values is a first plurality of pre-stored threshold values, said system adapted to store a second plurality of pry-stored threshold values selectable by said system. 16. A system comprising: an information device configured to automatically compare an electrical value and a selected pre-stored threshold value of a plurality of pre-stored threshold values, said electrical value related to a measurement provided by a sensor associated with an arc fault detection system, said information device configured to trip a protective device in an electrical circuit responsive to a detected arc fault, said arc fault detected based upon said plurality of pre-stored threshold values, said plurality of pre-stored threshold values automatically modified responsive to a predetermined change in measured temperature, said measured temperature sampled at a lower rate than a sampling rate of said electrical measurement. 17. The system of claim 16, further comprising: a memory device configured to store said plurality of pre-stored threshold values, said information device communicatively coupled to said memory device. 18. The system of claim 16, further comprising: said sensor. 19. A machine readable medium comprising instructions for: configuring a system to compare an electrical value and a selected pre-stored threshold value of a plurality of pre-stored threshold values, said electrical value related to a measurement provided by a sensor associated with an arc fault detection system; and configuring said system to trip a protective device in an electrical circuit responsive to a detected arc fault, said arc fault detected based upon said plurality of pre-stored threshold values, said plurality of pre-stored threshold values automatically modified responsive to a predetermined change in measured temperature, said system adapted to sample said measured temperature at a lower rate than a sampling rate of said electrical measurement. 20. A method comprising: providing a first electromagnetic signal adapted to configure a system to compare an electrical value and a selected pre-stored threshold value of a plurality of prestored threshold values, said electrical value related to a measurement provided by a sensor associated with an arc fault detection system; and providing a second electromagnetic signal adapted to configure said system to trip a protective device in an electrical circuit responsive to a detected arc fault, said arc fault detected based upon said plurality of pre-stored threshold values, said plurality of pre-stored threshold values automatically modified responsive to a predetermined change in measured temperature, said system adapted to sample said measured temperature at a lower rate than a sampling rate of said electrical measurement. 21. An apparatus having an information device configured to provide a first set of machine-readable instructions adapted to configure a system to compare an electrical value and a selected pre-stored threshold value of a plurality of pre-stored threshold values, said electrical value related m a measurement provided by a sensor associated with an arc fault detection system; and provide a second set of machine-readable instructions adapted to configure said system to trip a protective device in an electrical circuit responsive to a detected arc fault, the arc fault detected based upon said plurality of pre-stored threshold value, said plurality of pre-stored threshold values automatically modified responsive to predetermined change in measured temperature, said system adapted to sample said measured temperature at a lower rate than a sampling rate of said electrical measurement.