초록 ▼

A system for accelerating circuit measurements includes a circuit. A signal is applied to the circuit. A set of measurements is taken of a response of the circuit to the applied signal. The system includes a circuit model. The circuit model is a representation of the circuit. A final value of the re

A system for accelerating circuit measurements includes a circuit. A signal is applied to the circuit. A set of measurements is taken of a response of the circuit to the applied signal. The system includes a circuit model. The circuit model is a representation of the circuit. A final value of the response of the circuit is determined utilizing the circuit model in accordance with the set of measurements. A stimulus signal is generated in accordance with the final value for driving the circuit model to the final value. The system includes a stimulus generator in communication with the circuit. The stimulus generator is configured to apply the stimulus signal to the circuit. The stimulus signal is configured to accelerate the response of the circuit to reach the final value.

대표청구항 ▼

What is claimed is: 1. A system for accelerating circuit measurements, comprising: a circuit, wherein a signal is applied to the circuit, and wherein a set of measurements is taken of a response of the circuit to the applied signal; a circuit model, wherein the circuit model comprises a representat

What is claimed is: 1. A system for accelerating circuit measurements, comprising: a circuit, wherein a signal is applied to the circuit, and wherein a set of measurements is taken of a response of the circuit to the applied signal; a circuit model, wherein the circuit model comprises a representation of the circuit, wherein a final value of the response of the circuit is determined utilizing the circuit model in accordance with the set of measurements, and wherein a stimulus signal is generated in accordance with the final value for driving the circuit model to the final value; and a stimulus generator in communication with the circuit, wherein the stimulus generator is configured to apply the stimulus signal to the circuit, wherein the stimulus signal is configured to accelerate the response of the circuit to reach the final value, wherein a second set of measurements is taken of a response of the circuit to the stimulus signal to determine whether the circuit has reached the final value, and wherein a second final value of the response of the circuit to the stimulus signal is determined utilizing the circuit model in accordance with the second set of measurements, when a difference between the response of the circuit to the stimulus signal and the final value is greater than a predetermined value. 2. The system of claim 1, comprising: a signal source in communication with the circuit, wherein the signal source is configured to generate the signal applied to the circuit. 3. The system of claim 1, comprising: a measurement circuit in communication with the circuit, wherein the measurement circuit is configured to take measurements of the response of the circuit. 4. The system of claim 1, comprising: an analyzer in communication with the circuit and the stimulus generator, wherein the analyzer is configured to determine the final value of the response of the circuit and to determine the stimulus signal utilizing the circuit model. 5. The system of claim 1, wherein a second stimulus signal is generated in accordance with the second final value for driving the circuit model to the second final value, and wherein the second stimulus signal is applied to the circuit to accelerate the response of the circuit to reach the second final value. 6. The system of claim 1, wherein the stimulus signal is applied to the circuit for a predetermined duration of time. 7. The system of claim 1, wherein the stimulus signal is applied to the circuit during a predetermined time period. 8. The system of claim 1, wherein the stimulus signal comprises a voltage signal. 9. The system of claim 1, wherein the stimulus signal comprises a current signal. 10. The system of claim 1, further comprising: a filter in communication with the circuit, wherein the filter is configured to filter the response of the circuit. 11. The system of claim 10, wherein the filter comprises a low-pass filter. 12. The system of claim 1, wherein the circuit measurements comprise at least one of a measurement of capacitance, a measurement of resistance, a measurement of capacitance and resistance, a measurement of DC voltage, a measurement of AC voltage, a measurement of DC voltage in a presence of AC voltage, a measurement of AC voltage in a presence of DC voltage, a measurement of DC current, a measurement of AC current, a measurement of DC current in a presence of AC current, and a measurement of AC current in a presence of DC current. 13. The system of claim 1, wherein the set of measurements comprises at least two measurements of the response of the circuit. 14. A system for accelerating circuit measurements, comprising: a circuit wherein a signal is applied to the circuit, and wherein a set of measurements is taken of a response of the circuit to the applied signal; a circuit model, wherein the circuit model comprises a representation of the circuit, wherein a final value of the response of the circuit is determined utilizing the circuit model in accordance with the set of measurements, and wherein a stimulus signal is generated in accordance with the final value for driving the circuit model to the final value; and a stimulus generator in communication with the circuit, wherein the stimulus generator is configured to apply the stimulus signal to the circuit, and wherein the stimulus signal is configured to accelerate the response of the circuit to reach the final value, wherein a second set of measurements is taken of a response of the circuit to the stimulus signal to determine whether the circuit has reached the final value, and wherein the representation of the circuit by the circuit model is modified to increase an accuracy of the representation, when a difference between the response of the circuit to the stimulus signal and the final value is greater than a predetermined value. 15. A method of accelerating circuit measurements, comprising the steps of: a) applying a signal to a circuit; b) measuring a response of the circuit to the applied signal; c) determining a final value of the response of the circuit utilizing a representation of the circuit and measurements taken in step (b); d) generating a stimulus signal in accordance with the final value determined in step (c) for driving the circuit representation to the final value; e) applying the stimulus signal to the circuit, wherein the stimulus signal is configured to accelerate the response of the circuit to reach the final value; f) measuring a response of the circuit to the stimulus signal; g) determining whether the circuit has reached the final value; h) determining a difference between the response of the circuit to the stimulus signal and the final value; and i) determining a second final value of the response of the circuit to the stimulus signal using the circuit representation and measurements taken in step (f), when the difference determined in step (h) is greater than a predetermined value. 16. The method of claim 15, comprising the steps of: j) generating a second stimulus signal in accordance with the second final value determined in step (i) for driving the circuit representation to the second final value; and k) applying the second stimulus signal to the circuit to accelerate the response of the circuit to reach the second final value. 17. The method of claim 15, wherein step (e) comprises the step of: applying the stimulus signal to the circuit for a predetermined duration of time. 18. The method of claim 15, wherein step (e) comprises the step of: applying the stimulus signal to the circuit during a predetermined time period. 19. The method of claim 15, wherein the stimulus signal comprises a voltage signal. 20. The method of claim 15, wherein the stimulus signal comprises a current signal. 21. The method of claim 15, further comprising the step of: filtering the response of the circuit. 22. The method of claim 21, wherein the filtering step comprises the step of: low-pass filtering the response of the circuit. 23. The method of claim 15, wherein the circuit measurements comprise at least one of a measurement of capacitance, a measurement of resistance, a measurement of capacitance and resistance, a measurement of DC voltage, a measurement of AC voltage, a measurement of DC voltage in a presence of AC voltage, a measurement of AC voltage in a presence of DC voltage, a measurement of DC current, a measurement of AC current, a measurement of DC current in a presence of AC current, and a measurement of AC current in a presence of DC current. 24. A method of accelerating circuit measurements, comprising the steps of: a) applying a signal to a circuit; b) measuring a response of the circuit to the applied signal; c) determining a final value of the response of the circuit utilizing a representation of the circuit and measurements taken in step (b); d) generating a stimulus signal in accordance with the final value determined in step (c) for driving the circuit representation to the final value; e) applying the stimulus signal to the circuit, wherein the stimulus signal is configured to accelerate the response of the circuit to reach the final value; f) measuring a response of the circuit to the stimulus signal; g) determining whether the circuit has reached the final value; h) determining a difference between the response of the circuit to the stimulus signal and the final value; and i) modifying the circuit representation to increase an accuracy of the representation, when the difference determined in step (h) is greater than a predetermined value.