초록 ▼

A diagnostic system and method for a field device in a process control apparatus is provided. At least one sensor is associated with the process control apparatus, and a computer is adapted to receive data from the sensor and to detect an occurrence of a predetermined process event. A memory device

A diagnostic system and method for a field device in a process control apparatus is provided. At least one sensor is associated with the process control apparatus, and a computer is adapted to receive data from the sensor and to detect an occurrence of a predetermined process event. A memory device is operatively connected to the computer and adapted to store sensor data received by the computer at a time corresponding to the occurrence of the predetermined process event.

대표청구항 ▼

What is claimed is: 1. A diagnostic system for a field device in a process control apparatus, comprising: at least one sensor associated with the process control apparatus; a computer located on the field device and adapted to receive data from the sensor over predetermined intervals of time, to de

What is claimed is: 1. A diagnostic system for a field device in a process control apparatus, comprising: at least one sensor associated with the process control apparatus; a computer located on the field device and adapted to receive data from the sensor over predetermined intervals of time, to detect an occurrence of a predetermined process event and to overwrite previously received sensor data if the occurrence of the predetermined process event is not detected once the predetermined interval of time has elapsed; and a memory device operatively connected to the computer and adapted to store sensor data received by the computer if the occurrence of the predetermined process event is detected, wherein at least one of the computer or the memory device is further adapted to store sensor data collected over the interval of time coinciding with the occurrence of the predetermined process event and at times prior to the detected occurrence of the predetermined process event. 2. The diagnostic system of claim 1, wherein the memory device is further adapted to store sensor data received by the computer at times subsequent to the occurrence of the predetermined process event. 3. The diagnostic system of claim 1, wherein the computer is a microcontroller located on the field device. 4. The diagnostic system of claim 1, wherein the memory device is located on the field device. 5. The diagnostic system of claim 4, wherein the memory device is a non-volatile RAM. 6. The diagnostic system of claim 1, wherein the field device is a valve positioner. 7. The diagnostic system of claim 1, wherein the predetermined process event is an excessive travel deviation of a valve element. 8. The diagnostic system of claim 1, wherein the predetermined process event is a sensor signal, representing a sensed valve parameter, crossing a cutoff point. 9. A method of monitoring the performance of a process control system including at least a first field device, comprising: providing at least one sensor associated with the first field device; providing a memory device operably coupled to the first field device; collecting data from the sensor over predetermined intervals of time; detecting the occurrence of a predetermined process event; overwriting previously received sensor data if the occurrence of the predetermined process event is not detected once the predetermined interval of time has elapsed; and storing data on the memory device from the sensor collected over the interval of time coinciding with the occurrence of the predetermined process event and at a time prior to the occurrence of the predetermined process event if the occurrence of the predetermined process event is detected. 10. The method of claim 9, further including storing data from the sensor collected at times subsequent to the occurrence of the predetermined process event. 11. The method of claim 9, wherein the first field device detects the occurrence of the predetermined process event and communicates the occurrence of the predetermined process event to at least a second field device to store data on a second memory device associated with the second field device. 12. The method of claim 9, wherein the predetermined process event is an excessive travel deviation of a valve element. 13. The method of claim 9, wherein the predetermined process event is a sensor signal, representing a sensed valve parameter, crossing a cutoff point. 14. A field device for a process control apparatus, comprising: at least one sensor; a computer located on the field device and adapted to receive data from the sensor over predetermined intervals of time, to detect an occurrence of a predetermined process event and to overwrite previously received sensor data if the occurrence of the predetermined process event is not detected once the predetermined interval of time has elapsed; and a memory device operatively connected to the computer and adapted to store sensor data received by the computer at a time corresponding to the occurrence of the predetermined process event if the occurrence of the predetermined process event is detected, wherein at least one of the computer or the memory device is further adapted to store sensor data collected over the interval of time coinciding with the occurrence of the predetermined process event and at times prior to the detected occurrence of the predetermined process event. 15. The field device of claim 14, wherein the predetermined process event is the occurrence of a sensed parameter being out of a predetermined range. 16. The field device of claim 14, wherein the predetermined process event is the failure of a sensor. 17. The field device of claim 14, wherein the predetermined process event is a component failure. 18. The field device of claim 14, wherein the predetermined process event is a process variable change. 19. The field device of claim 14, wherein the predetermined process event is a command from a process control workstation.