초록 ▼

A method for operating an electrically erasable programmable read only memory (EEPROM) array includes providing an array including a multiplicity of memory cells, wherein each memory cell is connected to a word line and to two bit lines, selecting one of the memory cells, and erasing a bit of the se

A method for operating an electrically erasable programmable read only memory (EEPROM) array includes providing an array including a multiplicity of memory cells, wherein each memory cell is connected to a word line and to two bit lines, selecting one of the memory cells, and erasing a bit of the selected memory cell while applying an inhibit word line voltage to a gate of an unselected memory cell. An EEPROM array is also described, the array including a multiplicity of NROM memory cells, wherein each memory cell is connected to a word line and to two bit lines, and wherein each NROM cell is individually erasable and individually programmable without significantly disturbing unselected cells.

대표청구항 ▼

What is claimed is: 1. A method for operating an electrically erasable programmable read only memory (EEPROM) array of non-volatile memory ("NVM") cells having one or more charge storage regions, said method comprising: mitigating disturb effect during an erase operation by selecting one of said me

What is claimed is: 1. A method for operating an electrically erasable programmable read only memory (EEPROM) array of non-volatile memory ("NVM") cells having one or more charge storage regions, said method comprising: mitigating disturb effect during an erase operation by selecting one of said memory cells; and erasing a bit of the selected memory cell while substantially concurrently applying an inhibit word-line voltage to a terminal of an unselected memory cell in proximity with the selected memory cell, such that the inhibit voltage mitigates disturb effect on the unselected cell. 2. The method according to claim 1 wherein said memory cells comprise non-floating gate memory cells. 3. The method according to claim 2, wherein said cells comprise one or more charge storage regions per cell and each charge storage region is associated with one or more bits. 4. The method according to claim 3, wherein a charge storage region may be charged to one of three or more charge levels, wherein each of the three or more charge levels is associated with a different logical state. 5. The method according to claim 4, wherein either the selected or unselected cell is operated as a multi-level cell. 6. The method according to claim 1 wherein said memory cells are nitride read only memory (NROM) cells. 7. The method according to claim 6, wherein said cells comprise one or more charge storage regions per cell and each charge storage region is associated with one or more bits. 8. The method according to claim 7, wherein a charge storage region may be charged to one of three or more charge levels, wherein each of the three or more charge levels is associated with a different logical state. 9. The method according to claim 8, wherein either the selected or unselected cell is operated as a multi-level cell. 10. The method according to claim 1, wherein said array is a virtual ground array. 11. The method according to claim 1, wherein said unselected memory cell shares the same bit line as said selected cell. 12. The method according to claim 1, wherein said inhibit gate voltage is of such magnitude that a threshold voltage of said unselected memory cell is lowered not more than a predetermined amount. 13. The method according to claim 1 and further comprising having at least one column of said memory cells located between a pair of isolation zones. 14. A device comprising: an electrically erasable programmable read only memory (EEPROM) array of non-volatile memory ("NVM") cells having one or more charge storage regions, and a controller adapted to mitigate disturb effect during an erase operation by selecting one of said memory cells, and applying an erase pulse to a bit of the selected memory cell while substantially concurrently applying an inhibit word-line voltage to a terminal gate of an unselected memory cell in proximity with the selected memory cell, such that the inhibit voltage mitigates disturb effect on the unselected cell. 15. The device according to claim 14, wherein said memory cells comprise nonfloating gate memory cells. 16. The device according to claim 15, wherein said cells comprise one or more charge storage regions per cell and each charge storage region is associated with one or more bits. 17. The device according to claim 16, wherein a charge storage region may be charged to one of three or more charge levels, wherein each of the three or more charge levels is associated with a different logical state. 18. The device according to claim 17, wherein either the selected or unselected cell is operated as a multi-level cell. 19. The device according to claim 14, wherein said memory cells are nitride read only memory (NROM) cells. 20. The device according to claim 19, wherein said cells comprise one or more charge storage regions per cell and each charge storage region is associated with one or more bits. 21. The device according to claim 20, wherein a charge storage region may be charged to one of three or more charge levels, wherein each of the three or more charge levels is associated with a different logical state. 22. The device according to claim 21, wherein either the selected or unselected cell is operated as a multi-level cell.