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Semiconductor processors, sensors, semiconductor processing systems, semiconductor workpiece processing methods, and turbidity monitoring methods are provided. According to one aspect, a semiconductor processor includes a process chamber configured to receive a semiconductor workpiece for processing

Semiconductor processors, sensors, semiconductor processing systems, semiconductor workpiece processing methods, and turbidity monitoring methods are provided. According to one aspect, a semiconductor processor includes a process chamber configured to receive a semiconductor workpiece for processing; a supply connection in fluid communication with the process chamber and configured to supply slurry to the process chamber; and a sensor configured to monitor the turbidity of the slurry. Another aspect provides a semiconductor workpiece processing method including providing a semiconductor process chamber; supplying slurry to the semiconductor process chamber; and monitoring the turbidity of the slurry using a sensor.

대표청구항 ▼

The invention claimed is; 1. An apparatus comprising: a container configured to provide a subject material in a substantially static state; and a plurality of sensors individually configured to monitor turbidity of the subject material, wherein the sensors are individually configured to monitor the

The invention claimed is; 1. An apparatus comprising: a container configured to provide a subject material in a substantially static state; and a plurality of sensors individually configured to monitor turbidity of the subject material, wherein the sensors are individually configured to monitor the turbidity using particulate matter of the subject material, and wherein the particulate matter monitored by one of the sensors is different than the particulate matter monitored by another of the sensors; wherein the sensors are provided at different positions relative to the container to monitor the turbidity of the subject material at a plurality of vertical positions of the container; and wherein the sensors are configured to monitor the turbidity of the subject material simultaneously at the same moment in time. 2. The apparatus according to claim 1 wherein the sensors individually comprise: a source configured to emit electromagnetic energy towards the container; and a receiver configured to receive at least some of the electromagnetic energy. 3. The apparatus according to claim 2 wherein the sensors individually comprise a housing configured to align the source and the receiver with respect to the subject material and wherein the housing is configured to attach to the container and to detach from the container without disruption of the subject material within the container. 4. The apparatus according to claim 1 wherein the sensors individually monitor the turbidity of the subject material in the substantially static state. 5. The apparatus according to claim 1 further comprising a process chamber configured to receive and process a semiconductor workpiece using the subject material. 6. The apparatus according to claim 1 wherein the subject material comprises a fluid and particulate matter within the fluid, and wherein the sensors are configured to monitor settling of the particulate matter within the fluid. 7. The apparatus according to claim 1 wherein the subject material comprises a fluid and the particulate matter within the fluid, and wherein the sensors are individually configured to monitor a precipitation rate of the particulate matter within the fluid. 8. The apparatus according to claim 1 further comprising a computer coupled with the sensors and configured to access information regarding the turbidity of the subject material. 9. The apparatus according to claim 1 wherein the subject material comprises a fluid and the particulate matter within the fluid, and wherein the sensors are individually configured to monitor turbidity including monitoring all particulate matter suspended in the fluid at a respective vertical position of the container corresponding to a vertical position of the respective sensor. 10. The apparatus according to claim 1 wherein the container containing the subject material is configured to rotate about an axis during the monitoring of turbidity by the sensors. 11. The apparatus according to claim 1 wherein the particulate matter monitored by the one and the another of the sensors are within different portions of the subject material. 12. The apparatus according to claim 1 wherein the particulate matter monitored by the one and the another of the sensors are located at different vertical positions of the subject material. 13. The apparatus according to claim 1 further comprising a computer configured to calculate information regarding settling of particulate matter within the subject material using information from the one and the another sensors. 14. The apparatus according to claim 1 wherein the sensors are individually configured to monitor the turbidity of the subject material without displacing the subject material. 15. A turbidity monitoring method comprising: providing a container; providing subject material in a substantially static condition within the container; monitoring the turbidity of the subject material at a predefined vertical position within the container without displacing the subject material; generating a signal indicative of the turbidity of the subject material after the monitoring; wherein the subject material comprises a fluid and particulate matter within the fluid, and wherein the monitoring comprises monitoring settling of the particulate matter within the fluid; and wherein the monitoring comprises: emitting electromagnetic energy towards the subject material, the electromagnetic energy being not visible to humans; and receiving at least some of the electromagnetic energy. 16. The method according to claim 15 further comprising simultaneously monitoring the turbidity of the subject material at another predefined vertical position within the container at the same time as the monitoring at the predefined vertical position. 17. The method according to claim 16 wherein the particulate matter monitored at the predefined vertical position is different than the particulate matter monitored at the another predefined vertical position. 18. The method according to claim 15 further comprising rotating the subject material during the monitoring. 19. The method according to claim 15 wherein the monitoring comprises monitoring the turbidity of the subject material provided in the substantially static condition. 20. The method according to claim 15 wherein the monitoring comprises monitoring precipitation rates of the particulate matter within the fluid. 21. The method according to claim 15 further comprising, using a computer, providing information regarding the turbidity of the subject material using the signal. 22. The method according to claim 15 wherein the monitoring comprises monitoring turbidity with respect to all particulate matter suspended in the fluid at the predefined vertical position within the container. 23. The method according to claim 15 wherein the monitoring the turbidity comprises monitoring the turbidity of the subject material at a plurality of different vertical positions within the container using a plurality of sensors. 24. The method according to claim 23 wherein the monitoring comprises monitoring particulate matter of the subject material, and wherein the particulate matter monitored by one of the sensors is different than the particulate matter monitored by another of the sensors. 25. The method according to claim 23 further comprising wherein the monitoring of the settling of particulate matter within the fluid comprises monitoring using information from the plurality of sensors. 26. An apparatus comprising: a container configured to provide a subject material in a substantially static state; a plurality of sensors individually configured to monitor turbidity of the subject material, wherein the sensors are individually configured to monitor the turbidity using particulate matter of the subject material, and wherein the particulate matter monitored by one of the sensors is different than the particulate matter monitored by another of the sensors; wherein the sensors individually comprise: a source configured to emit electromagnetic energy towards the container; a receiver configured to receive at least some of the electromagnetic energy; and a housing configured to align the source and the receiver with respect to the subject material and wherein the housing is configured to attach to the container and to detach from the container without disruption of the subject material within the container. 27. A turbidity monitoring method comprising: providing a container; providing subject material in a substantially static condition within the container; monitoring the turbidity of the subject material at a predefined vertical position within the container without displacing the subject material; generating a signal indicative of the turbidity of the subject material after the monitoring; wherein the subject material comprises a fluid and particulate matter within the fluid, and wherein the monitoring comprises monitoring settling of the particulate matter within the fluid; and simultaneously monitoring the turbidity of the subject material at another predefined vertical position within the container at the same time as the monitoring at the predefined vertical position. 28. The method of claim 27 wherein the particulate matter monitored at the predefined vertical position is different than the particulate matter monitored at the another predefined vertical position.