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Diagnostic systems and methods for predictive condition monitoring 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-017/00
출원번호 UP-0681888 (2003-10-09)
등록번호 US-7539597 (2009-07-01)
발명자 / 주소
  • Wegerich, Stephan W.
  • Wolosewicz, Andre
  • Pipke, R. Matthew
출원인 / 주소
  • SmartSignal Corporation
대리인 / 주소
    Fitch, Even, Tabin & Flannery
인용정보 피인용 횟수 : 45  인용 특허 : 139

초록

A system for empirically diagnosing a condition of a monitored system. Estimates of monitored parameters from a model of the system provide residual values that can be analyzed for failure mode signature recognition. Residual values can also be tested for alert (non-zero) conditions, and patterns of

대표청구항

What is claimed is: 1. A monitoring apparatus for diagnosing faults in a system, comprising: a kernel-based non-parametric model responsive to monitored parameter data from said system for generating estimates of the monitored parameter data; an alert module disposed to produce parameter alerts in

이 특허에 인용된 특허 (139)

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