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Embedded microprocessor for integrated circuit testing and debugging 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-011/00
출원번호 UP-0629508 (2003-07-29)
등록번호 US-7539900 (2009-07-01)
발명자 / 주소
  • Plofsky, Jordan
출원인 / 주소
  • Altera Corporation
대리인 / 주소
    Weaver Austin Villeneuve & Sampson LLP
인용정보 피인용 횟수 : 16  인용 특허 : 66

초록

A technique for embedding a microprocessor into an integrated circuit allows on-chip testing and debugging. The microprocessor present on the chip tests and debugs the rest of the chip. Both testing and debugging of a programmable logic device use an embedded microprocessor. Testing is performed by

대표청구항

I claim: 1. A programmable logic device (PLD) comprising: programmable logic that includes test logic; a port for external communication; a hard-coded microprocessor embedded within the programmable logic device and in communication with said programmable logic; and memory that includes a test rout

이 특허에 인용된 특허 (66)

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  11. Sample Stephen P. ; Bershteyn Mikhail ; Butts Michael R. ; Bauer Jerry R., Emulation system with time-multiplexed interconnect.
  12. Bellay Jeffrey D. (Houston TX), Emulator device including a semiconductor substrate having the emulated device embodied in the same semiconductor substr.
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  15. Veenstra Kerry ; Rangasayee Krishna ; Herrmann Alan L., Enhanced embedded logic analyzer.
  16. Veenstra, Kerry; Rangasayee, Krishna; Herrmann, Alan L., Enhanced embedded logic analyzer.
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  22. Butts Michael R. (Portland OR) Batcheller Jon A. (Newberg OR), Hierarchically connected reconfigurable logic assembly.
  23. Guccione Steven A., Interactive dubug tool for programmable circuits.
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  25. Stewart Kem ; Selvidge Charles W. ; Crouch Kenneth ; Wong Marina ; Seneski Mark, Logic analysis system for logic emulation systems.
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  32. Chen Benjamin ; Macliesh Peter ; Wang Albert, Method and apparatus for entry of timing constraints.
  33. Jamal Kamran (Sunnyvale CA), Method and apparatus for making integrated circuits with built-in self-test.
  34. Patel Rakesh H. ; Costello John ; Wong Myron, Method and apparatus for monitoring or forcing an internal node in a programmable device.
  35. Brebner, Gordon J., Method and apparatus for multithreading.
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  37. Fang, Ying, Method and apparatus for testing an embedded device.
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  40. Jesse H. Jenkins, IV ; Walter H. Edmondson, Method for remotely testing microelectronic device over the internet.
  41. Butts, Michael R.; Batcheller, Jon A., Method of using electronically reconfigurable logic circuits.
  42. Uhling Thomas F. (Monument CO) Dascher David J. (Colorado Springs CO) Rush Kenneth (Colorado Springs CO) Griggs Keith C. (Colorado Springs CO), Multiplexing electronic test probe.
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  48. Kuboki Shigeo (Nakaminato JPX) Sugimoto Norihiko (Katsuta JPX) Inada Syunji (Hitachi JPX) Ueno Masahiro (Hitachi JPX) Harakawa Takeshi (Hadano JPX) Inada Kazuhisa (Hitachi JPX) Tominaga Toshihiko (Ka, Program control apparatus incorporating a trace function.
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  50. Ansari, Ahmad R., Programmable interactive verification agent.
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  52. Kaplinsky Cecil H. (Palo Alto CA), Programmable logic device.
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  54. Zaveri Ketan ; Lane Christopher F. ; Reddy Srinivas T. ; Lee Andy L. ; McClintock Cameron R. ; Pedersen Bruce B., Programmable logic device with circuitry for observing programmable logic circuit signals and for preloading programmable logic circuits.
  55. Lee, Chong H.; Asayesh, Reza, Programmable logic device with high speed serial interface circuitry.
  56. Yang Yang-Sei,KRX, Prototyping system and a method of operating the same.
  57. Sample Stephen P. (Mountain View CA) D\Amour Michael R. (Los Altos Hills CA) Payne Thomas S. (Union City CA), Reconfigurable hardware emulation system.
  58. Patel Rakesh H. ; Norman Kevin A., Sample and load scheme for observability of internal nodes in a PLD.
  59. Patel Rakesh H. ; Norman Kevin A., Sample and load scheme for observability of internal nodes in a PLD.
  60. Butts Michael R. (Portland OR) Batcheller Jon A. (Newberg OR), Structures and methods for adding stimulus and response functions to a circuit design undergoing emulation.
  61. Alfke Peter H., System for preventing radiation failures in programmable logic devices.
  62. Dastidar,Jayabrata Ghosh; Wright,Adam; Pang,Hung Hing Anthony; Vo,Binh; Nagarandal,Ajay; Tracy,Paul J.; Harms,Michael, Techniques for automatically generating tests for programmable circuits.
  63. El-Ayat Khaled A. (Cupertino CA) Chang Jia-Hwang (Cupertino CA), Testability architecture and techniques for programmable interconnect architecture.
  64. Ansari,Ahmad R.; Vashi,Mehul R.; Herron,Nigel G.; Douglass,Stephen M., Testing of an integrated circuit having an embedded processor.
  65. Ansari,Ahmad R.; Vashi,Mehul R.; Herron,Nigel G.; Douglass,Stephen M., Testing of an integrated circuit having an embedded processor.
  66. Heile Francis B. ; Fairbanks Brent A., Work group computing for electronic design automation.

이 특허를 인용한 특허 (16)

  1. Mahajan, Abhijit, Apparatus and method for analyzing bidirectional data exchanged between two electronic devices.
  2. Thomas, Mathieu, Apparatus and method for non-intrusive random memory failure emulation within an integrated circuit.
  3. Hamid, Adnan; Qian, Kairong; Do, Kieu; Grosse, Joerg, Display in a graphical format of test results generated using scenario models.
  4. Jeddeloh, Joe M., Embedded processor.
  5. Ahmed, Muhammad; Reghunath, Manoj, Method and apparatus for supporting a unified debug environment.
  6. Milton, David Ian M.; Grbic, Alexander, Methods and systems for performing signal activity extraction.
  7. Milton, David Ian M.; Grbic, Alexander, Methods and systems for performing signal activity extraction.
  8. Wong, Chi Kwok, Multiplexing application and debug channels on a single USB connection.
  9. Wong, Chi Kwok, Multiplexing application and debug channels on a single USB connection.
  10. Hamid, Adnan; Qian, Kairong; Do, Kieu; Grosse, Joerg, Scheduling of scenario models for execution within different computer threads and scheduling of memory regions for use with the scenario models.
  11. Bassin, Evgeni, Systems and methods for sensing signals communicated with a host device or on an interface of plug-in card when there is lack of access to sensing points.
  12. La Fever, George Bernard; Flaum, Iser B., Systems and methods of device authentication including features of circuit testing and verification in connection with known board information.
  13. La Fever, George Bernard; Flaum, Iser B., Systems and methods of implementing content validation of microcomputer based circuits.
  14. La Fever, George B.; Yellin, Carmy; Flaum, Iser B.; Muse, David R., Systems and methods of implementing remote boundary scan features.
  15. La Fever, George B.; Yellin, Carmy; Flaum, Iser B.; Muse, David R., Systems and methods of implementing remote boundary scan features.
  16. Hamid, Adnan; Qian, Kairong; Do, Kieu; Grosse, Joerg, Testing SOC with portable scenario models and at different levels.
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