초록 ▼

A positional measurement system includes an electromagnetic wave source which emits an electromagnetic wave, a lens system which has a first lens surface, an electromagnetic wave shield section provided around a center axis of the first lens surface, and a second lens surface, and causes the electro

A positional measurement system includes an electromagnetic wave source which emits an electromagnetic wave, a lens system which has a first lens surface, an electromagnetic wave shield section provided around a center axis of the first lens surface, and a second lens surface, and causes the electromagnetic wave having entered by way of the first lens surface exclusive of the electromagnetic wave shield section to exit from the second lens surface, to form an electromagnetic wave concentrated area at a position opposite the electromagnetic wave source, a receiving device which detects the electromagnetic wave concentrated area formed by the lens system, and a computing device which measures a position of the electromagnetic wave source based on information detected by the receiving device on the electromagnetic wave concentrated area.

대표청구항 ▼

What is claimed is: 1. A positional measurement system, comprising: an electromagnetic wave source which emits an electromagnetic wave; a lens system, wherein the electromagnetic wave source is provided at one side of the lens system, and wherein the lens system has a first lens surface, an electro

What is claimed is: 1. A positional measurement system, comprising: an electromagnetic wave source which emits an electromagnetic wave; a lens system, wherein the electromagnetic wave source is provided at one side of the lens system, and wherein the lens system has a first lens surface, an electromagnetic wave shield section provided at a center axis of the first lens surface and extended in all directions from the center axis of the first lens surface, and a second lens surface to let out the electromagnetic wave entered from the first lens surface exclusive of the electromagnetic wave shield section to form an electromagnetic wave concentrated area on an other side of the lens system opposite the electromagnetic wave source; a receiving device which detects the electromagnetic wave concentrated area formed by the lens system; and a computing device which measures a position of the electromagnetic wave source based on information detected by the receiving device on the electromagnetic wave concentrated area. 2. The positional measurement system according to claim 1, wherein a wavelength of the electromagnetic wave falls within the range of 300 nm to 1 m. 3. The positional measurement system according to claim 1, wherein the first lens surface exclusive of the electromagnetic wave shield section of the lens system is in a shape of a ring. 4. The positional measurement system according to claim 1, wherein the electromagnetic wave concentrated area formed by the lens system is a shape of a ring. 5. The positional measurement system according to claim 1, further comprising: an electromagnetic wave transmittance filter which is disposed at a stage prior to the receiving device, and permits transmission of the electromagnetic wave and rejects other electromagnetic waves. 6. The positional measurement system according to claim 1, wherein the lens system includes: a first mirror surface encircling a center axis of the second lens surface opposing the first lens surface; and a second mirror surface disposed at a position of the electromagnetic wave shield section opposing the second lens surface. 7. The positional measurement system according to claim 6, wherein each of the first lens surface, the second lens surface, and the second mirror surface is a convex shape, and the first mirror surface has a concave shape. 8. The positional measurement system according to claim 1, further comprising: an electromagnetic wave diffusing member provided at a position after the lens system that forms the electromagnetic wave concentrated area; and an imaging lens system disposed at a position after the electromagnetic wave diffusing member to detect the electromagnetic wave concentrated area by the receiving device. 9. The positional measurement system according to claim 1, wherein the electromagnetic wave source is a member which reflects an electromagnetic wave generated by an electromagnetic wave generator. 10. The positional measurement system according to claim 1, wherein the plurality of electromagnetic wave sources are provided. 11. The positional measurement system according to claim 1, wherein the electromagnetic wave is light, the electromagnetic wave source is a light source, the lens system is an optical lens system, and the receiving device is a light-receiving element array. 12. The positional measurement system according to claim 11, wherein an imaging lens system is provided between the optical lens system and the light-receiving element array. 13. The positional measurement system according to claim 1, wherein the electromagnetic wave is a radio wave in a band of millimeter waves or microwaves, the electromagnetic wave source is a radio wave transmitter, the lens system is a radio wave lens system, and the receiving device is an antenna array. 14. The positional measurement system according to claim 13, wherein the antenna array is embedded in the second lens surface of the radio wave lens system. 15. A positional measurement system, comprising: an electromagnetic wave source which emits an electromagnetic wave; a first mirror which reflects the electromagnetic wave, to form an electromagnetic wave concentrated area; an electromagnetic wave component which is interposed between the electromagnetic wave source and the first mirror, and imparts a change to a direction of the electromagnetic wave; a receiving device which detects the electromagnetic wave concentrated area formed by the mirror; and a computing device which measures a position of the electromagnetic wave source based on information detected by the receiving device on the electromagnetic wave concentrated area; wherein the electromagnetic wave component is a lens which transmits the electromagnetic wave to the mirror, and imparts a change to a direction of the electromagnetic wave, to concentrate the electromagnetic wave concentrated area on the receiving device; wherein the electromagnetic wave concentrated area has a shape of a ring; and wherein the lens is contacting the first mirror. 16. A positional measurement system according to claim 15, wherein the computing device measures a 3-D position of the electromagnetic wave source. 17. The positional measurement system according to claim 15, wherein the information includes a size of the ring and a position of the ring. 18. The positional measurement system according to claim 15, wherein the lens has a half mirror provided on a part facing the electromagnetic wave source. 19. A positional measurement system, comprising: an electromagnetic wave source which emits an electromagnetic wave; a first mirror which reflects the electromagnetic wave, to form an electromagnetic wave concentrated area; an electromagnetic wave component which is interposed between the electromagnetic wave source and the first mirror, and imparts a change to a direction of the electromagnetic wave; a receiving device which detects the electromagnetic wave concentrated area formed by the first mirror; and a computing device which measures a position of the electromagnetic wave source based on information detected by the receiving device on the electromagnetic wave concentrated area; wherein the electromagnetic wave component is a lens which transmits the electromagnetic wave to the mirror, and imparts a change to a direction of the electromagnetic wave, to concentrate the electromagnetic wave concentrated area on the receiving device; wherein the electromagnetic wave concentrated area has a shape of a ring; and wherein the lens has a half mirror provided on a part facing the electromagnetic wave source. 20. A positional measurement system, comprising: an electromagnetic wave source which emits an electromagnetic wave; a first mirror which reflects the electromagnetic wave, to form an electromagnetic wave concentrated area; an electromagnetic wave component which is interposed between the electromagnetic wave source and the first mirror, and imparts a change to a direction of the electromagnetic wave; a receiving device which detects the electromagnetic wave concentrated area formed by the first mirror; and a computing device which measures a position of the electromagnetic wave source based on information detected by the receiving device on the electromagnetic wave concentrated area; wherein the electromagnetic wave component is a lens which transmits the electromagnetic wave to the mirror, and imparts a change to a direction of the electromagnetic wave, to concentrate the electromagnetic wave concentrated area on the receiving device; wherein the electromagnetic wave concentrated area has a shape of a ring; and wherein the lens is a plano-convex lens having a flat surface on a part facing the electromagnetic wave source. 21. The positional measurement system according to claim 20, wherein the plano-convex lens has a half mirror provided on the flat surface facing the electromagnetic wave source. 22. The positional measurement system according to claim 20, wherein the convex surface of the plano-convex lens has a second mirror which reflects the electromagnetic wave from the first mirror, to form the electromagnetic wave concentrated area on the receiving device. 23. The positional measurement system according to claim 21, wherein the plano-convex lens has a concave lens surface at a center axis of a convex surface. 24. The positional measurement system according to claim 21, wherein the convex surface of the plano-convex lens is contacting the half mirror. 25. The positional measurement system according to claim 23, wherein the convex surface of the plano-convex lens is contacting the half mirror. 26. A positional measurement system, comprising: an electromagnetic wave source which emits an electromagnetic wave, and a lens system, comprising: a first lens surface; an electromagnetic wave shield section provided at a center axis of the first lens surface and extended in all directions from the center axis of the first lens surface; and a second lens surface, wherein, the electromagnetic wave entered by way of the first lens surface exclusive of the electromagnetic wave shield section is caused to exit from the second lens surface, to form an electromagnetic wave concentrated area; wherein the first lens surface exclusive of the electromagnetic wave shield section is in a shape of a ring; wherein the first lens surface has a convex shape; further comprising a first mirror surface encircling a center axis of the second lens surface; and a second mirror surface disposed at a position opposing the second lens surface, wherein the second lens surface has a convex shape, and the second mirror surface has a convex shape, and the first mirror surface has a concave shape; and wherein a position of the electromagnetic wave source is measured. 27. The positional measurement system according to claim 26, wherein the electromagnetic wave concentrated area is formed in a shape of a ring by the electromagnetic wave having passed through an intermediate section of the first lens surface being in a shape of a ring. 28. The positional measurement system according to claim 27, wherein a peak of electromagnetic wave intensity appears in an outermost periphery of the electromagnetic wave concentrated area. 29. The positional measurement system according to claim 26, wherein the electromagnetic wave is light. 30. The positional measurement system according to claim 26, wherein the electromagnetic wave is a radio wave in a band of millimeter waves or microwaves.