IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
UP-0674652
(2007-02-13)
|
등록번호 |
US-7558415
(2009-07-15)
|
발명자
/ 주소 |
- McLaren, Gina
- Ellis, Robert
- Douglass, James W.
- Riding, Thomas J.
- Ring, James E.
|
출원인 / 주소 |
- Carl Zeiss MicroImaging AIS, Inc.
|
대리인 / 주소 |
Patterson, Thuente, Skaar & Christensen PA
|
인용정보 |
피인용 횟수 :
2 인용 특허 :
145 |
초록
A method, system, and apparatus are provided for automated light microscopic for detection of proteins associated with cell proliferative disorders.
대표청구항
▼
What is claimed: 1. A method, comprising: obtaining a slide which includes a sample thereon; scanning art area of said slide at a first magnification to obtain a first image of said area; using a computer to: analyze said first image to determine texture values within said area; define areas with r
What is claimed: 1. A method, comprising: obtaining a slide which includes a sample thereon; scanning art area of said slide at a first magnification to obtain a first image of said area; using a computer to: analyze said first image to determine texture values within said area; define areas with raised texture values as being areas which represent the sample; and fit a series of said texture values to a waveform to determine an edge of said sample; and obtaining a second image representing said sample at a magnification higher than said first magnification. 2. A method as in claim 1, wherein said scanning comprises scanning multiple raster scans across separated windows on the slide, where all of the windows on the slide are collectively smaller than the entire area of the slide, and said using comprises analyzing said texture values in said windows. 3. A method as in claim 2, wherein said raster scanning occurs in two orthogonal directions. 4. A method as in claim 3, wherein said raster scanning in two orthogonal directions produces overlapping adjacent image fields in x and y directions. 5. A method as in claim 4, wherein said image fields overlap by at least half a diameter of an average cell. 6. A method as in claim 1, wherein said scanning comprises scanning only a portion of the total area of the slide, other than a portion of the slide that is reserved for labeling with identification information. 7. A method as in claim 6, wherein said identification information is a barcode. 8. A method as in claim 1, wherein said determining texture values comprise determining pixel variance across the area. 9. A method as in claim 1, wherein said determining texture values comprise determining a difference between the largest pixel value and the smallest pixel value within the area. 10. A method as in claim 1, wherein said waveform is a square wave. 11. A method as in claim 1, wherein said waveform is a best fit step function. 12. A method as in claim 1, wherein an amplitude of said waveform is used to determine a presence of said edge. 13. A method of determining a desired area for analysis on a slide with a smear sample thereon, comprising: scanning an area of the slide at a first magnification; using a computer to: determine a series of texture values within the area; and analyze the series of texture values with a waveform function that represents information about an edge of a smear sample, to determine the edge of the smear sample from the series of texture values; and obtaining an image representing said sample at a magnification higher than said first magnification. 14. A method as in claim 13, wherein said scanning comprises scanning across windows which extend across portions of the slide, where all of the windows represent collectively less than the entire scanned area of the slide, and wherein said using comprises determining texture values within said windows. 15. A method as in claim 14, wherein said windows are rectangles that all extend across The slide in a single direction. 16. A method as in claim 14, wherein said windows are rectangles that extend across the slide in two orthogonal directions. 17. A method as in claim 16, wherein at least one of said windows that extends in one direction overlaps with at least one of said windows that extends in another direction. 18. A method as in claim 13, wherein said function is a square wave. 19. A method as in claim 13, wherein said function is a best fit step function. 20. An automated microscope, comprising: a slide holder; a microscope camera, adapted to scan an area of the slide which includes a sample thereon at a first magnification to produce a first image of said area; a slide feeder adapted to automatically present said microscope camera with sample slides; and a computer, receiving said first image, analyzing said first image to determine texture values within said area and to define areas with raised texture values as being areas which represent the sample, and fitting a series of said texture values to a waveform to determine an edge of said sample, wherein said microscope camera is further adapted to obtain a second image of said defined areas representing said sample at a magnification higher than said first magnification. 21. A microscope as in claim 20, wherein said computer controls said microscope camera to image said areas which represent the sample at a higher magnification. 22. A microscope as in claim 20, further comprising a scan subsystem that controls an area of scanning, wherein said scan subsystem controls scanning multiple raster scans across separated windows on the slide, where all of the windows on the slide are collectively smaller than the entire area of the slide, and said computer analyzes said texture values in said windows. 23. A microscope as in claim 20, wherein said microscope camera scans only a portion of the total area of the slide/other than a portion of the slide that is reserved for labeling with identification information. 24. A microscope as in claim 23, further comprising a barcode scanner that scans the portion of the slide labeled with identification information. 25. A microscope as in claim 23, wherein said raster scans occur in two orthogonal directions. 26. A microscope as in claim 25, wherein said raster scans produce overlapping adjacent image fields in x and y directions. 27. A microscope as in claim 20, wherein said computer determines pixel variance across the area as part of said texture values. 28. A microscope as in claim 20, wherein said computer determines a difference between the largest pixel value and the smallest pixel value within the area as part of said texture values. 29. A microscope as in claim 20, wherein said computer fits a series of texture values to a waveform indicative of an edge of an exemplary sample I to determine an edge of the sample. 30. A microscope as in claim 29, wherein said waveform is a square wave. 31. A microscope as in claim 29, wherein said waveform is a best fit step function. 32. A microscope as in claim 20, further comprising: a first monitor configured for display of said first and second images; and a second monitor configured as a user interface display. 33. A microscope comprising: microscope optics, scanning an area of a slide with a smear sample thereon at a first magnification; a slide feeder adapted to automatically present said microscope optics with said slide with said smear sample; and a computer that determines a series of texture values within the area based on an output of said microscope optics, and analyzes the series of texture values with a function that represents information about an edge of a smear sample, to determine the edge of the smear sample from the series of texture values, wherein, using said determined smear edges, said microscope optics obtain an image of said sample at a magnification higher than said first magnification. 34. A microscope as in claim 33, further comprising a scan subsystem that controls an area of scanning. 35. A microscope as in claim 34, wherein said scan subsystem controls scanning across windows which extend across portions of the slide, where all of the windows represent collectively less than the entire scanned area of the slide, and wherein said computer determines texture values within said windows. 36. A microscope as in claim 35, wherein said windows are rectangles that all extend across the slide in a single direction. 37. A microscope as in claim 35, wherein said windows are rectangles that extend across the slide in two orthogonal directions. 38. A microscope as in claim 37, wherein at least one of said windows that extends in one direction overlaps with at least one of said windows that extends in another direction. 39. A microscope as in claim 33, wherein said function is a square wave. 40. A microscope as in claim 33, wherein said function is a best fit step function.
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