초록 ▼

The invention relates to a device for measuring surfaces and to a method, which uses, preferably, the device. The device comprises a light source which is used to produce a multi-colored light beam. The light beam can be focused by an imaging optical system on a plurality of points which are arrange

The invention relates to a device for measuring surfaces and to a method, which uses, preferably, the device. The device comprises a light source which is used to produce a multi-colored light beam. The light beam can be focused by an imaging optical system on a plurality of points which are arranged at different distances from the imaging optical system, using the chromatic aberration of the optics. The focused light beam can be deviated to a point of the surface. A sensor device is provided in order to detect the reflected light beam. The aim of the invention is to maintain the largest distance possible between the measuring head and the object. The imaging optical system comprises an optical system for the targeted circulation of a chromatic aberration and an additional optical system which is used to form the focused light beam emerging from the imaging optical system.

대표청구항 ▼

That which is claimed: 1. A device for measurement of surfaces, comprising: a light source for generating a multicolor light beam, in which the light beam is focused by imaging optics on several points at different distances from the imaging optics utilizing chromatic aberration of the optics, in w

That which is claimed: 1. A device for measurement of surfaces, comprising: a light source for generating a multicolor light beam, in which the light beam is focused by imaging optics on several points at different distances from the imaging optics utilizing chromatic aberration of the optics, in which the focused light beam is guided on a surface, and in which a sensor device is provided to detect the reflected light beam, wherein the imaging optics includes optics including a GRIN lens for targeted creation of a chromatic aberration, and additional optics to influence the beam path of the focused light beam emerging from the imaging optics. 2. The device according to claim 1, wherein the optics includes a device for influencing the chromatic aberration. 3. The device according to claim 1, wherein the GRIN lens has a length of greater than one pitch length. 4. The device according to claim 1, wherein the GRIN lens includes a correcting device to influence at least one of an imaging scale or a measurement range. 5. The device according to claim 4, wherein the correcting device has a fixed length. 6. The device according to claim 4, wherein the correcting device can be influenced in its length. 7. The device according to claim 1, wherein the additional optics is constructed for at least one lens. 8. The device according to claim 1, wherein the additional optics has one or more aspherical lenses. 9. The device according to claim 7, wherein at least two lenses in the additional optics have the same focal length with two or more lenses. 10. The device according to claim 7, wherein the additional optics has two or more lenses, all having different focal lengths. 11. The device according to claim 7, wherein at least one lens of the additional optics is configured replaceable. 12. The device according to claim 7, wherein the additional optics makes a 1:1 image. 13. The device according to claim 7, wherein glass fibers are arranged between the lenses of the additional optics. 14. The device according to claim 7, wherein a prism is arranged between the lenses of the additional optics. 15. The device according to claim 1, wherein a deflection device is provided to deflect a light beam. 16. The device according to claim 15, wherein the deflection device comprises one of a prism, a mirror, a plane-parallel plate or other direction-changing device. 17. The device according to claim 15, wherein the deflection device is controllable via electrical correcting elements. 18. A method for measurement of surfaces, comprising: focusing a light beam on several points at different distances from imaging optics using chromatic aberration of the optics, in which the focused light beam is directed to a point of a surface, and detecting the reflected light beam using a sensor device, wherein in the imaging optics, an optics including a GRIN lens is used for targeted creation of chromatic aberration, and additional optics is used to influence the beam path of the focused light beam emerging from the imaging optics.