$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Method for manufacturing a thin film semiconductor device 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/00
  • H01L-021/84
  • H01L-021/70
  • H01L-021/3205
  • H01L-021/02
  • H01L-021/44
출원번호 UP-0329095 (2006-01-11)
등록번호 US-7579224 (2009-09-08)
우선권정보 JP-2005-014756(2005-01-21)
발명자 / 주소
  • Kuwabara, Hideaki
  • Yamamoto, Hiroko
출원인 / 주소
  • Semiconductor Energy Laboratory Co., Ltd.
대리인 / 주소
    Nixon Peabody LLP
인용정보 피인용 횟수 : 29  인용 특허 : 20

초록

It is an object of the present invention to simplify steps needed to process a wiring in forming a multilayer wiring. In addition, when a droplet discharging technique or a nanoimprint technique is used to form a wiring in a contact hole having a comparatively long diameter, the wiring in accordance

대표청구항

What is claimed is: 1. A method for manufacturing a semiconductor device comprising the steps of: forming a first insulating film over a semiconductor substrate; forming a second insulating film over the first insulating film; forming a first opening that reaches the first insulating film in the se

이 특허에 인용된 특허 (20)

  1. Mei Sheng Zhou SG; Sangki Hong SG; Simon Chooi SG, Aluminum and copper bimetallic bond pad scheme for copper damascene interconnects.
  2. Yamazaki, Shunpei; Arai, Yasuyuki, Display device comprising substrates, contrast medium and barrier layers between contrast medium and each of substrates.
  3. Ying-Ho Chen TW; Syun-Ming Jang TW; Jih-Churng Twu TW; Tsu Shih TW, Elimination of electrochemical deposition copper line damage for damascene processing.
  4. Shinohara Hisato,JPX ; Sugawara Akira,JPX, Excimer laser scanning system.
  5. Raul E. Acosta ; Melanie L. Carasso AU; Steven A. Cordes ; Robert A. Groves ; Jennifer L. Lund ; Joanna Rosner, Integrated coil inductors for IC devices.
  6. Yamazaki Shunpei (Tokyo JPX) Itoh Kenji (Tokyo JPX) Nagayama Susumu (Tokyo JPX), Laser scribing method.
  7. Sinohara Hisato (Sagamihara JPX), Laser scriving system and method.
  8. Furusawa,Masahiro, Liquid crystal display device having partition walls.
  9. Yamazaki,Shunpei; Arai,Yasuyuki, Manufacture method of display device.
  10. Shinohara Hisato,JPX ; Sugawara Akira,JPX, Method and system of laser processing.
  11. Furusawa,Masahiro; Hashimoto,Takashi, Method for forming a conductive layer pattern.
  12. Itoh, Kazuyoshi; Watanabe, Wataru; Toma, Tadamasa, Method for rewriting data in three-dimensional optical memory device fabricated in glass by ultra-short light pulse.
  13. Acosta, Raul E.; Carasso, Melanie L.; Cordes, Steven A.; Groves, Robert A.; Lund, Jennifer L.; Rosner, Joanna, Method of fabricating integrated coil inductors for IC devices.
  14. Hwang, Sung Bo, Method of forming insulating film in semiconductor device.
  15. Sheng-Hsiung Chen TW; Ming-Hsing Tsai TW, Method of improved copper gap fill.
  16. Tu An-Chun,TWX ; Tai Shih-Kuan,TWX ; Yeu Tzu-Shih,TWX, Method of low-K/copper dual damascene.
  17. Chen, Ying-Ho; Twu, Jih-Churng; Chang, Weng, Multilayer interface in copper CMP for low K dielectric.
  18. Lukas,Aaron Scott; O'Neill,Mark Leonard; Bitner,Mark Daniel; Vincent,Jean Louise; Vrtis,Raymond Nicholas; Karwacki, Jr.,Eugene Joseph, Non-thermal process for forming porous low dielectric constant films.
  19. Suzuki, Tomomi; Ikakura, Hiroshi; Maeda, Kazuo; Shioya, Yoshimi; Ohira, Koichi, Semiconductor device manufacturing method having a porous insulating film.
  20. Wakabayashi,Koji, Wiring repair apparatus.

이 특허를 인용한 특허 (29)

  1. Yamazaki, Shunpei; Aoyama, Tomoya; Tsurume, Takuya; Hamada, Takao, Deposition method and manufacturing method of light-emitting device.
  2. Yamazaki, Shunpei; Aoyama, Tomoya; Tsurume, Takuya; Hamada, Takao, Deposition method and manufacturing method of light-emitting device.
  3. Dittmer, Lothar; Moschuetz, Harald; Nawrot, Thomas; Ziemann, Andreas, Device for determining the conductance of laundry, dryers and method for preventing deposits on electrodes.
  4. Dittmer, Lothar; Moschütz, Harald; Nawrot, Thomas; Ziemann, Andreas, Device for determining the conductance of laundry, dryers and method for preventing deposits on electrodes.
  5. Shinn, Ted-Hong; Wang, Yi-Ching; Wang, Hsiang-Tang; Wu, Chi-Ming, Flexible electrophoretic display and method for manufacturing the same.
  6. Hosoba, Miyuki; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Method for manufacturing semiconductor device.
  7. Hosoba, Miyuki; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Method for manufacturing semiconductor device.
  8. Hosoba, Miyuki; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Method for manufacturing semiconductor device.
  9. Sasaki, Toshinari; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Method for manufacturing semiconductor device.
  10. Sasaki, Toshinari; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Method for manufacturing semiconductor device.
  11. Sasaki, Toshinari; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Method for manufacturing semiconductor device.
  12. Sasaki, Toshinari; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Method for manufacturing semiconductor device.
  13. Sasaki, Toshinari; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Method for manufacturing semiconductor device.
  14. Sasaki, Toshinari; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Method for manufacturing semiconductor device.
  15. Sasaki, Toshinari; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Method for manufacturing semiconductor device.
  16. Sasaki, Toshinari; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Method for manufacturing semiconductor device.
  17. Sasaki, Toshinari; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Method for manufacturing semiconductor device.
  18. Sasaki, Toshinari; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Method for manufacturing semiconductor device.
  19. Yamazaki, Shunpei; Watanabe, Ryosuke; Hiraishi, Suzunosuke; Sakata, Junichiro, Method for manufacturing semiconductor device.
  20. Yamazaki, Shunpei; Watanabe, Ryosuke; Hiraishi, Suzunosuke; Sakata, Junichiro, Method for manufacturing semiconductor device.
  21. Morisue, Masafumi; Tanaka, Koichiro, Method for manufacturing semiconductor device and method for manufacturing display device.
  22. Sasaki, Toshinari; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Semiconductor device.
  23. Yakubo, Yuto, Semiconductor device.
  24. Sasaki, Toshinari; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Semiconductor device and method for manufacturing the same.
  25. Sasaki, Toshinari; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Semiconductor device and method for manufacturing the same.
  26. Sasaki, Toshinari; Sakata, Junichiro; Ohara, Hiroki; Yamazaki, Shunpei, Semiconductor device and method for manufacturing the same.
  27. Tokunaga, Hajime; Saito, Toshihiko, Semiconductor device including storage device and method for driving the same.
  28. Tokunaga, Hajime; Saito, Toshihiko, Semiconductor device including storage device and method for driving the same.
  29. Yamazaki, Shunpei; Sakata, Junichiro; Noda, Kosei; Sakakura, Masayuki; Oikawa, Yoshiaki; Maruyama, Hotaka, Semiconductor device with oxide semiconductor layer.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로