초록 ▼

Spring contact elements are fabricated by depositing at least one layer of metallic material into openings defined in masking layers deposited on a surface of a substrate which may be an electronic component such as an active semiconductor device. Each spring contact element has a base end, a contac

Spring contact elements are fabricated by depositing at least one layer of metallic material into openings defined in masking layers deposited on a surface of a substrate which may be an electronic component such as an active semiconductor device. Each spring contact element has a base end, a contact end, and a central body portion. The contact end is offset in the z-axis (at a different height) and in at least one of the x and y directions from the base end. In this manner, a plurality of spring contact elements are fabricated in a prescribed spatial relationship with one another on the substrate. The spring contact elements make temporary (i.e., pressure) or permanent (e.g., joined by soldering or brazing or with a conductive adhesive) connections with terminals of another electronic component to effect electrical connections therebetween. In an exemplary application, the spring contact elements are disposed on a semiconductor devices resident on a semiconductor wafer so that temporary connections can be made with the semiconductor devices to burn-in and/or test the semiconductor devices.

대표청구항 ▼

What is claimed is: 1. A method of making electrical connections between a first electronic component and a second electronic component, comprising: fabricating a plurality of spring contact elements directly upon the first .electronic component, the spring contact elements each having a tip end wh

What is claimed is: 1. A method of making electrical connections between a first electronic component and a second electronic component, comprising: fabricating a plurality of spring contact elements directly upon the first .electronic component, the spring contact elements each having a tip end which is spaced above a surface of the first electronic component and at least one of the plurality of spring contact elements being a different size than others of the plurality of spring contact elements; and bringing the first electronic component together with a second electronic component so that the tip ends of the spring contact elements axe in electrical contact with corresponding terminals on the second electronic component, wherein the first electronic component is an active semiconductor device; and the second electronic component is a test substrate; further comprising: powering up the active semiconductor device while maintaining the tip ends of the spring contacts in electrical contact with the terminals of the second electronic component. 2. The method according to claim 1, wherein the plurality of spring contact elements each have an elongate structure and the at least one of the plurality of spring contact elements has a different length than the others of the plurality of spring contact elements. 3. The method according to claim 2, wherein the length is measured in a plane substantially parallel to the surface of the first electronic component. 4. The method according to claim 3, wherein the at least one of the plurality of spring contacts elements has substantially the same spring constant as the others of the plurality of spring contact elements. 5. The method according to claim 1, wherein the at least one of the plurality of spring contacts elements has substantially the same spring constant as the others of the plurality of spring contact elements. 6. The method according to claim 1, wherein the plurality of spring contact elements each have a tapered body coupling the tip end to the surface of the first electronic component. 7. The method according to claim 6, further comprising tailoring the taper for each of the plurality of spring contact elements so that the plurality of spring contact elements each have a substantially equal spring constant. 8. The method according to claim 1, wherein: the fabricating comprises fabricating additional spring contact elements directly upon at least one other first electronic component, the additional spring contact elements each having a tip end which is spaced above a surface of the at least one other first electronic component; and the bringing comprises bringing the first electronic component and the at least one other first electronic component together with the second electronic component so that the tip ends of the spring contact elements and the tip ends of the additional spring contact elements are in electrical contact with corresponding terminals on the second electronic component.