Thermal management using an on-die thermal sensor
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G05D-023/00
G11C-011/34
G11C-007/04
출원번호
UP-0357493
(2006-02-16)
등록번호
US-7590473
(2009-09-24)
발명자
/ 주소
Wyatt, David A.
출원인 / 주소
Intel Corporation
대리인 / 주소
Pedigo LLC, Philip A.
인용정보
피인용 횟수 :
23인용 특허 :
23
초록▼
Embodiments of the invention are generally directed to systems, methods, and apparatuses for thermal management using an on-die thermal sensor. In some embodiments, an integrated circuit (e.g., a memory controller) includes temperature collection logic and control logic. The temperature collection l
Embodiments of the invention are generally directed to systems, methods, and apparatuses for thermal management using an on-die thermal sensor. In some embodiments, an integrated circuit (e.g., a memory controller) includes temperature collection logic and control logic. The temperature collection logic receives and stores temperature data from a plurality of remote memory devices each having an on-die thermal sensor. In some embodiments, the control logic controls a thermal throttle based, at least in part, on the temperature data. Other embodiments are described and claimed.
대표청구항▼
What is claimed is: 1. A memory controller comprising: an interface to couple with a memory interconnect, the memory interconnect to transfer at least one of memory data or address information; temperature collection logic coupled with the interface to receive and store temperature data from a plur
What is claimed is: 1. A memory controller comprising: an interface to couple with a memory interconnect, the memory interconnect to transfer at least one of memory data or address information; temperature collection logic coupled with the interface to receive and store temperature data from a plurality of remote memory devices, each memory device including an on-die thermal sensor, wherein the temperature data is to be continuously collected from the plurality of remote memory devices during inactive time on the memory interconnect that couples the memory controller to the plurality of remote memory devices, and further wherein the memory devices are to multiplex the temperature data onto the memory interconnect during the inactive time; and control logic coupled with the temperature collection logic, the control logic to provide a thermal control mechanism based, at least in part, on the temperature data, wherein the thermal control mechanism provides a proportional closed-loop feedback control response. 2. The memory controller of claim 1, wherein the temperature collection logic comprises: a memory to store the temperature data from the plurality of remote memory devices. 3. The memory controller of claim 2, wherein the memory to store the temperature data from, the plurality of remote memory devices comprises: a temperature collection register, for each memory device, to store temperature data for the corresponding memory device. 4. The memory controller of claim 1, wherein the temperature collection logic further comprises: one or more temperature collection control registers to store control information for the temperature collection logic. 5. The memory controller of claim 1, wherein the control logic comprises: event steering logic to provide an event responsive, at least in part, to temperature data exceeding a thermal threshold value. 6. A method comprising: collecting, at a memory controller, temperature data from a plurality of remote memory devices, each memory device including an on-die thermal sensor, wherein the temperature data is to be continuously collected from the plurality of remote memory devices during inactive time on a memory interconnect that couples the memory controller to the plurality of remote memory devices, wherein the memory devices are to multiplex the temperature data onto the memory interconnect during the inactive time, and further wherein the memory interconnect does not have dedicated signal lines for thermal management; storing, in the memory controller, processed temperature data, the processed temperature data based, at least in part, on the temperature data from the plurality of remote memory devices; comparing the processed temperature data to a thermal threshold value; and initiating a thermal control mechanism, if the processed temperature data exceeds the threshold value, wherein the thermal control mechanism provides a proportional closed-loop feedback control response. 7. The method of claim 6, wherein collecting, at the memory controller, temperature data from the plurality of remote memory devices comprises: storing temperature data, for each memory device, in a corresponding temperature collection register. 8. The method of claim 6, wherein storing, in the memory controller, processed temperature data comprises storing a moving average temperature. 9. The method of claim 6, wherein initiating the thermal control mechanism, if the processed temperature data exceeds the thermal threshold value comprises at least one of: triggering an event; and initiating an automatic thermal throttle response. 10. The method of claim 9, wherein initiating the automatic thermal throttle response comprises: determining a difference between a processed temperature data value and a thermal threshold value; computing a control adjustment based, at least in part, on the difference between the processed temperature data value and the thermal threshold value; and applying a memory interface throttle based, at least in part, on the control adjustment. 11. The method of claim 10, further comprising: incrementing a loop counter, the loop counter to provide an indication of a number of times the processed temperature data value exceeds the thermal threshold value. 12. The method of claim 11, wherein computing the control adjustment based, at least in part, on the difference between the processed temperature data value and the thermal threshold value further comprises: altering the control adjustment based, at least in part, on a value of the loop counter. 13. A system comprising: a memory module including a plurality of memory devices, each of the plurality of memory devices having an on-die thermal sensor; and a memory controller coupled with the memory module through a memory interconnect the memory controller including an interface to couple with a memory interconnect, the memory interconnect to transfer at least one of memory data or address information, temperature collection logic coupled with the interface to receive and store temperature data from the plurality of memory devices, wherein the temperature data is to be continuously collected from the plurality of remote memory devices during inactive time on the memory interconnect that couples the memory controller to the plurality of remote memory devices, and further wherein the memory devices are to multiplex the temperature data onto the memory interconnect during the inactive time, and control logic coupled with the temperature collection logic, the control logic to control a thermal throttle based, at least in part, on the temperature data, wherein the control logic provides a proportional closed-loop feedback control response. 14. The system of claim 13, wherein the temperature collection logic comprises: a temperature collection register, for each memory device, to store temperature data for the corresponding memory device. 15. The system of claim 13, wherein the temperature collection logic further comprises: one or more temperature collection control registers to store control information for the temperature collection logic. 16. The system of claim 13, wherein the control logic further comprises: event steering logic to provide an event responsive, at least in part, to temperature data exceeding a thermal threshold value.
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이 특허에 인용된 특허 (23)
Olsen, Douglas S.; Stura, David, Apparatus and method for controlling temperature in a device under test using integrated temperature sensitive diode.
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Cooper, Christopher B.; Liu, Ming-Bo; Martin, Chris G.; Manning, Troy A.; Casper, Stephen L.; Dennison, Charles H.; Shirley, Brian M.; Brown, Brian L.; Batra, Shubneesh, METHOD OF STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT, METHOD OF MODIFYING OPERATION OF DYNAMIC RANDOM ACCESS MEMORY IN RESPONSE TO TEMPERATURE, PROGRAMMABLE TEMPERATURE SENSING CIRCUIT .
Turnbull Robert R. (Buchanan MI) DeLisle David J. (Berrien Springs MI) Kohtz Robert A. (St. Joseph MI), Method and control circuit for measuring the temperature of an integrated circuit.
Jain,Sandeep; Wyatt,David; Shi,Jun; Mishra,Animesh; Halbert,John; Isbara,Melik, Temperature determination and communication for multiple devices of a memory module.
Jain,Sandeep; Wyatt,David; Shi,Jun; Mishra,Animesh; Halbert,John; Isbara,Melik, Temperature determination and communication for multiple devices of a memory module.
de Cesare, Josh P.; Cho, Jung Wook; Takayanagi, Toshi; Millet, Timothy J., Hardware automatic performance state transitions in system on processor sleep and wake events.
de Cesare, Josh P.; Cho, Jung Wook; Takayanagi, Toshi; Millet, Timothy J., Hardware automatic performance state transitions in system on processor sleep and wake events.
de Cesare, Josh P.; Cho, Jung Wook; Takayanagi, Toshinari; Millet, Timothy J., Hardware automatic performance state transitions in system on processor sleep and wake events.
de Cesare, Josh P.; Cho, Jung Wook; Takayanagi, Toshinari; Millet, Timothy J., Hardware automatic performance state transitions in system on processor sleep and wake events.
Machnicki, Erik P.; Millet, Timothy J.; de Cesare, Josh P., Modifying performance parameters in multiple circuits according to a performance state table upon receiving a request to change a performance state.
Bachand, Charles Keith; Lemke, Scott James; Sule, Ambarish Mukund; Ghasemazar, Mohammad; Franco, Osvaldo, Systems, apparatus, and methods for temperature detection.
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