초록 ▼

A level measurement arrangement for measurement of a level of a product in a container, comprising: a level sensor, having: a mounting element, including a process connector, for mounting the mounting element on a mating counter connector on an opening of the container, and a conductive probe segmen

A level measurement arrangement for measurement of a level of a product in a container, comprising: a level sensor, having: a mounting element, including a process connector, for mounting the mounting element on a mating counter connector on an opening of the container, and a conductive probe segment extending from the mounting element into the container; a conductive probe extension (19), having a first end, which is permanently fixed to an inner wall of the container, and having a second end, which is detachably connectable to an end of the conductive probe segment extending into the container; and sensor electronics comprising elements for generating and sending short electromagnetic pulses down the probe segment and the probe extension, elements for reception of the echoes of the pulses reflected at a surface of the product elements for determining the level of the product in the container, based on a time of flight needed for a pulse to travel down the probe segment and the probe extension, and its echo to return.

대표청구항 ▼

What is claimed is: 1. A level measurement arrangement for the measurement of a level of a product in a container, comprising: a level sensor, having a mounting element, including a process connector, for mounting said mounting element on a mating counter connector on an opening of the container, a

What is claimed is: 1. A level measurement arrangement for the measurement of a level of a product in a container, comprising: a level sensor, having a mounting element, including a process connector, for mounting said mounting element on a mating counter connector on an opening of the container, and a conductive probe segment extending from said mounting element into the container; a conductive probe extension, having a first end, which is permanently fixed to an inner wall of the container, and having a second end, which during measurement is detachably connected to an end of said conductive probe segment extending into the container; and sensor electronics, wherein: said sensor electronics comprises: means for generating and sending short electromagnetic pulses down said conductive probe segment and said conductive probe extension; means for reception of echoes of the pulses reflected at a surface of the product, and means for determining the level of the product in the container, based on a time of flight needed for a pulse to travel down said conductive probe segment and said conductive probe extension, together with the time for the reflected pulse to travel to said means for reception of said echoes. 2. The level measurement arrangement according to claim 1, wherein: said sensor electronic is divided into a primary sensor electronics comprising said means for generating and sending short electromagnetic pulses down said conductive probe segment and said conductive probe extension, and said means for reception of the echoes of the pulses reflected at a surface of the product and a secondary sensor electronics comprising said means for determining the level of the product in the container. 3. The level measurement arrangement according to claim 2, wherein: said primary sensor electronics is located inside said mounting element; and said secondary sensor electronics is located inside a housing. 4. The level measurement arrangement according to claim 3, further comprising: means for detachably mounting said housing on said mounting element outside the container; and means for detachably connecting said primary sensor electronics, located in said mounting element to said secondary sensor electronics, which is located inside said housing. 5. The level measurement arrangement according to claim 1, wherein: said conductive probe extension is welded onto the wall of the container. 6. The level measurement arrangement according to claim 5, wherein: all surfaces of the weld are polished. 7. The level measurement arrangement according to claim 1, wherein: said process connector is a tri-clamp connector. 8. The level measurement arrangement according to claim 1, wherein: a detachable connection between said conductive probe extension and said conductive probe segment comprises one of: a bayonet fitting, a threaded joint and an in-line plug connector. 9. The level measurement arrangement according to claim 8, wherein: said detachable connection located above the product in the container.