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A nonvolatile memory device including a lower electrode, a resistor structure disposed on the lower electrode, a diode structure disposed on the resistor structure, and an upper electrode disposed on the diode structure. A nonvolatile memory device wherein the resistor structure includes one resisto

A nonvolatile memory device including a lower electrode, a resistor structure disposed on the lower electrode, a diode structure disposed on the resistor structure, and an upper electrode disposed on the diode structure. A nonvolatile memory device wherein the resistor structure includes one resistor and the diode structure includes one diode. An array of nonvolatile memory devices as described above.

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What is claimed is: 1. A nonvolatile memory device comprising: a lower electrode; a resistor structure including a data storage layer disposed on the lower electrode, the data storage layer including at least one of NiO, TiO2, HfO, ZrO, ZnO, WO3, CoO, and Nb2O5; a diode structure disposed on the re

What is claimed is: 1. A nonvolatile memory device comprising: a lower electrode; a resistor structure including a data storage layer disposed on the lower electrode, the data storage layer including at least one of NiO, TiO2, HfO, ZrO, ZnO, WO3, CoO, and Nb2O5; a diode structure disposed on the resistor structure, the diode structure including a first oxide layer disposed on the resistor structure, and a second oxide layer disposed on the first oxide layer; and an upper electrode disposed on the diode structure. 2. The device according to claim 1, wherein the first oxide layer is formed of p-type oxide and the second oxide layer is formed of n-type oxide. 3. The device according to claim 2, wherein any one of p-type oxide and n-type oxide is formed of at least one of NiO, TiO2, HfO, ZrO, ZnO, WO3, CoO, and Nb2O5. 4. The device according to claim 1, wherein the resistor structure includes one resistor and the diode structure includes one diode. 5. The device according to claim 1, wherein the resistor structure includes a chalcogenide. 6. The device according to claim 1, wherein the resistor structure includes a buffer layer between the lower electrode and the data storage layer. 7. The nonvolatile memory device of claim 1, wherein at least one of the first oxide layer and the second oxide layer are formed at an oxygen partial pressure of about 3 percent to about 10 percent. 8. A nonvolatile memory device comprising: a lower electrode; an array of a nonvolatile memory device, the array comprising: at least two bit lines arranged at regular intervals on a substrate; at least two word lines arranged at regular intervals and disposed across the bit lines; a resistor structure including a data storage layer disposed on the bit lines at each of the intersections of the bit lines and word lines, the data storage layer including at least one of NiO, TiO2, HfO, ZrO, ZnO, WO3, CoO, and Nb2O5; and a diode structure disposed in contact with the resistor structure and the word lines, the diode structure including a first oxide layer disposed on the resistor structure, and a second oxide layer disposed on the first oxide layer. 9. The array according to claim 8, wherein the first oxide layer is formed of p-type oxide and the second oxide layer is formed of n-type oxide. 10. The array according to claim 9, wherein any one of p-type oxide and n-type oxide is formed of at least one selected from the group consisting of NiO, TiO2, HfO, ZrO, ZnO, WO3, CoO, and Nb2O5. 11. The array according to claim 8, wherein the resistor structure includes one resistor and the diode structure includes one diode. 12. The array according to claim 8, wherein the resistor structure includes a chalcogenide. 13. The array according to claim 8, wherein the resistor structure includes a buffer layer between the at least two bit lines and the data storage layer. 14. A method of manufacturing a nonvolatile memory device comprising: forming a lower electrode on a substrate; forming a resistor structure including a data storage layer on the lower electrode, the data storage layer including at least one of NiO, TiO2, HfO, ZrO, ZnO, WO3, CoO, and Nb2O5; forming a diode structure on the resistor structure, the diode structure including a first oxide layer disposed on the resistor structure, and a second oxide layer disposed on the first oxide layer; and forming an upper electrode on the diode structure. 15. A nonvolatile memory device manufactured in accordance with the method of claim 14. 16. The method of manufacturing a nonvolatile memory device according to claim 14, wherein the resistor structure includes a buffer layer between the lower electrode and the data storage layer. 17. The method of claim 14, wherein forming the diode structure includes forming the first oxide layer and the second oxide layer at an oxygen partial pressure of about 3 percent to about 10 percent. 18. A method of manufacturing an array of nonvolatile memory devices comprising: forming at least two bit lines on a substrate, arranged at regular intervals; forming one or more resistor structures including a data storage layer on the at least two bit lines at desired locations, the data storage layer including at least one of NiO, TiO2, HfO, ZrO, ZnO, WO3, CoO, and Nb2O5; forming a diode structure on each of the one or more resistor structures, the diode structure including a first oxide layer disposed on the resistor structure, and a second oxide layer disposed on the first oxide layer; and forming at least two word lines arranged at regular intervals and disposed across the at least two bit lines; the at least two bit lines and the at least two word lines intersecting at the desired locations, the at least two bit lines and the at least two word lines being electrically connected via the one or more resistor and diode structures. 19. An array of nonvolatile memory devices manufactured in accordance with the method of claim 18. 20. The method of manufacturing an array of nonvolatile memory devices according to claim 18, wherein the resistor structure includes a buffer layer between the at least two bit lines and the data storage layer. 21. A nonvolatile memory device comprising: a lower electrode; a resistor structure including a data storage layer on the lower electrode, the data storage layer including at least one of NiO, TiO2, HfO, ZrO, ZnO, WO3, CoO, and Nb2O5; a diode structure configured to supply a current to the data storage layer in one direction, the diode structure including a first oxide layer on the resistor structure, and a second oxide layer on the first oxide layer; and an upper electrode disposed on the diode structure.