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Semiconductor device having variable parameter selection based on temperature and test method

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01K-013/00
출원번호 UP-0708184 (2007-02-20)
등록번호 US-7603249 (2009-10-28)
발명자 / 주소
  • Walker, Darryl
대리인 / 주소
    Walker, Darryl G.
인용정보 피인용 횟수 : 24  인용 특허 : 26

초록

A semiconductor device that may include temperature sensing circuits is disclosed. The temperature sensing circuits may be used to control various parameters, such as internal regulated supply voltages, internal refresh frequency, a word line low voltage. In this way, operating specifications of a s

대표청구항

What is claimed is: 1. A semiconductor device, comprising: a first temperature sensing circuit including a first temperature threshold value and providing a first temperature indication signal, the first temperature sensing circuit coupled to receive a temperature detect enable signal having a temp

이 특허에 인용된 특허 (26)

  1. Javanifard, Jahanshir J.; Wells, Steve; Giduturi, Hari; Ward, Dave, Analog temperature measurement apparatus and method.
  2. Payne Thomas R. (Louisville KY), Boil dry protection system for cooking appliance.
  3. McNeill Bruce W. ; Walden Robert W., CMOS bandgap voltage reference.
  4. Norman Robert D. ; Chevallier Christophe J., Clock signal from an adjustable oscillator for an integrated circuit.
  5. Norman Robert D. ; Chevallier Christophe J., Clock signal from an adjustable oscillator for an integrated circuit.
  6. Choi,Jong hyun; Cho,Beob rae; Seo,Young hun, DRAM device with a refresh period that varies responsive to a temperature signal having a hysteresis characteristic.
  7. Chevallier Christophe J., Integrated circuit with temperature detector.
  8. Chevallier Christophe J., Integrated circuit with temperature detector.
  9. Winter Marlan L. (Hendersonville NC) Innes Mark E. (Asheville NC), Load controller with digitally modeled overload protection and analog tracking of heat state during power off.
  10. Shima Tsuyoshi,JPX ; Suyama Tomio,JPX, Low temperature storage cabinet.
  11. Opris, Ion E., Low-voltage bandgap reference circuit.
  12. Johns,Charles Ray; Wang,Michael Fan, Maximal temperature logging.
  13. Borys S. Senyk, Method and apparatus for monitoring the temperature of a processor.
  14. Pippin,Jack D., Method and apparatus for programmable thermal sensor for an integrated circuit.
  15. Gunther,Stephen H.; Binns,Frank; Pippin,Jack D.; Rankin,Linda J.; Burton,Edward A.; Carmean,Douglas M.; Bauer,John M., Methods and apparatus for thermal management of an integrated circuit die.
  16. Abe, Toshihiro; Mori, Shintaro; Terayama, Fumihiko; Kitamura, Masahiro; Yamazaki, Seiichi; Moriguchi, Yasuo, Microcomputer equipped with built-in temperature sensor.
  17. Schmidt, Thomas A.; Marshall, Andrew; Xu, Jingwei, Multiple temperature threshold sensing having a single sense element.
  18. Park,Sang Kyun, Self refresh period control circuits.
  19. Walker,Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
  20. Walker,Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
  21. Godfrey Gary M., System and method for tasking processing modules based upon temperature.
  22. Kim,Kwang hyun; Kim,Chan Kyung, Temperature sensing circuit and method.
  23. Won,Myung Gyoo; Kim,Jae Hoon; Park,Jong Wook, Temperature sensing circuit for use in semiconductor integrated circuit.
  24. Feder,Jan; Beyerle,Rick; Byers,Stephen; Jones,Thomas, Thermal control of a DUT using a thermal control substrate.
  25. Ivanov Andre,CAX ; Lowe Alan Arthur,CAX, Time monitoring appliance.
  26. Gupton John (Vernon Hills IL), Variable temperature heating control system for inhalation therapy apparatus.

이 특허를 인용한 특허 (24)

  1. Bach, Christine; Haase, Axel; Schneider, Reinhard; Stoll, Jürgen; Zinn, Philipp, Electric heater for heating synthetic materials and method for operating the electric heater.
  2. Walker, Darryl G., Multi-chip non-volatile semiconductor memory package including heater and sensor elements.
  3. Walker, Darryl G., Multi-chip non-volatile semiconductor memory package including heater and sensor elements.
  4. Walker, Darryl G., Multi-chip non-volatile semiconductor memory package including heater and sensor elements.
  5. Walker, Darryl G., Multi-chip non-volatile semiconductor memory package including heater and sensor elements.
  6. Walker, Darryl G., Power up of semiconductor device having a temperature circuit and method therefor.
  7. Tsukude, Masaki, Semiconductor device.
  8. Walker, Darryl G., Semiconductor device having a temperature circuit that provides a plurality of temperature operating ranges.
  9. Walker, Darryl G., Semiconductor device having subthreshold operating circuits including a back body bias potential based on temperature range.
  10. Walker, Darryl G., Semiconductor device having temperature sensor circuit that detects a temperature range upper limit value and a temperature range lower limit value.
  11. Walker, Darryl G., Semiconductor device having temperature sensor circuits.
  12. Walker, Darryl G., Semiconductor device having variable parameter selection based on temperature.
  13. Walker, Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
  14. Walker, Darryl, Semiconductor device having variable parameter selection based on temperature and test method.
  15. Walker, Darryl G., Semiconductor device having variable parameter selection based on temperature and test method.
  16. Walker, Darryl G., Semiconductor device having variable parameter selection based on temperature and test method.
  17. Walker, Darryl G., Semiconductor device having variable parameter selection based on temperature and test method.
  18. Zimlich, David, Temperature compensation via power supply modification to produce a temperature-independent delay in an integrated circuit.
  19. Zimlich, David, Temperature compensation via power supply modification to produce a temperature-independent delay in an integrated circuit.
  20. Walker, Darryl G., Temperature sensing circuit with hysteresis and time delay.
  21. Walker, Darryl G., Testing and setting performance parameters in a semiconductor device and method therefor.
  22. Walker, Darryl G., Testing and setting performance parameters in a semiconductor device and method therefor.
  23. Walker, Darryl G., Testing and setting performance parameters in a semiconductor device and method therefor.
  24. Yoshida, Munehiro; Boerstler, David William, Thermal sensing circuit using bandgap voltage reference generators without trimming circuitry.
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