최소 단어 이상 선택하여야 합니다.
최대 10 단어까지만 선택 가능합니다.
다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
NTIS 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
DataON 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
Edison 바로가기다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
Kafe 바로가기국가/구분 | United States(US) Patent 등록 |
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국제특허분류(IPC7판) |
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출원번호 | UP-0312103 (2005-12-20) |
등록번호 | US-7623932 (2009-12-02) |
발명자 / 주소 |
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출원인 / 주소 |
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대리인 / 주소 |
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인용정보 | 피인용 횟수 : 2 인용 특허 : 314 |
A reduced rule set for identifying a root cause of an aberration in an industrial process is generated from a complete rule base. The rule base includes plurality of rules for the industrial process, and each rule comprises a condition of at least one process signal of the industrial process and a f
A reduced rule set for identifying a root cause of an aberration in an industrial process is generated from a complete rule base. The rule base includes plurality of rules for the industrial process, and each rule comprises a condition of at least one process signal of the industrial process and a fault which corresponds to the condition of at least one process signal. Available process signals are identified. Rules are selectively removed from the rule base to produce the reduced rule set.
What is claimed is: 1. A method for generating a reduced rule set for identifying a root cause of an aberration in an industrial process for use in an industrial process field device, comprising: (a) obtaining a rule base comprising a plurality of rules for the industrial process, each rule compris
What is claimed is: 1. A method for generating a reduced rule set for identifying a root cause of an aberration in an industrial process for use in an industrial process field device, comprising: (a) obtaining a rule base comprising a plurality of rules for the industrial process, each rule comprising a condition of at least one process signal of the industrial process and a fault which corresponds to a condition of at least one process signal; (b) identifying which process signals of the industrial process are available to the field device; (c) selectively removing a rule from the plurality of rules of the rule base to produce the reduced rule set, wherein the step of selectively removing a rule is based upon the step of identifying which process signals of the industrial are available; and (d) storing the reduced rule set in a memory of the field device; (e) performing diagnostics in the field device based upon the reduced rule set and the identification process signals. 2. The method of claim 1 including identifying rules within the reduced rule set having identical process signal conditions. 3. The method of claim 2 including combining rules in the reduced rule set which have identical process signal conditions. 4. The method of claim 3 including creating a new fault for a combined rule. 5. The method of claim 1 wherein the process signals comprise process variables. 6. The method of claim 1 including automating steps (a) through (c). 7. The method of claim 6 and including performing (a) through (c) in a computer. 8. The method of claim 3 including repeating the step of combining until only unique rules are left in the reduced rule set. 9. The method of claim 1 wherein the condition of at least one of the process signals comprises the group of conditions consisting of less than a constant, greater than a constant, trending up, trending down, no change and blank. 10. A computer system configured to implement the method of claim 1. 11. An apparatus for determining a reduced rule set for identifying a root cause of an aberration in an industrial process for use in an industrial process field device, comprising; means for obtaining a rule base comprising a plurality of rules for the industrial process, each rule comprising a condition of at least one process signal of the industrial process and a fault which corresponds to a condition of at least one process signal; means for identifying which process signals of the industrial process are available to the field device; means for selectively removing a rule from the plurality of rules of the rule base to produce the reduced rule set, wherein the step of selectively removing a rule is based upon the step of identifying which process signals of the industrial are available; and means for storing the reduced rule set in a memory of the field device; means for performing diagnostics in the field device based upon the reduced rule set and the identification process signals. 12. The apparatus of claim 11 including means for identifying rules within the reduced rule set having identical process signal conditions. 13. The apparatus of claim 12 including means for combining rules in the reduced rule set which have identical process signal conditions. 14. The apparatus of claim 13 including means for creating a new fault for a combined rule. 15. The apparatus of claim 11 wherein the process signals comprise process variables. 16. The apparatus of claim 11 wherein the condition of at least one of the process signals comprises the group of conditions consisting of less than a constant, greater than a constant, trending up, trending down, no change and blank. 17. An industrial process diagnostic apparatus for identifying a root cause of an aberration in an industrial process, comprising: a rule base comprising a plurality of rules for the industrial process, each rule comprising a condition of at least one process signal of the industrial process and a fault which corresponds to a condition of at least one process signal; a processor configured to identify which process signals of the industrial process are available and responsively selectively remove a rule from the plurality of rules of the rule base to produce the reduced rule set, based upon the identified process signals. 18. The apparatus of claim 17 wherein the processor is further configured to identify rules within the reduced rule set having identical process signal conditions. 19. The apparatus of claim 18 wherein the process is further configured to combine rules in the reduced rule set which have identical process signal conditions. 20. The apparatus of claim 19 wherein the process is further configured to create a new fault for a combined rule. 21. The apparatus of claim 17 wherein the process signals comprise process variables. 22. The apparatus of claim 17 wherein the condition of at least one of the process signals comprises the group of conditions consisting of less than a constant, greater than a constant, trending up, trending down, no change and blank.
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