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Method of measuring in situ differential emissivity and temperature

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01J-005/02
출원번호 UP-0217884 (2005-09-01)
등록번호 US-7632012 (2009-12-24)
발명자 / 주소
  • Twerdochlib, Michael
출원인 / 주소
  • Siemens Energy, Inc.
인용정보 피인용 횟수 : 5  인용 특허 : 33

초록

A method for measuring the differential emissivity between two sites on the surface of a body and the temperature of the two sites. The method includes a plurality of measurements of the infrared radiation arising from each of the two sites under a number of different conditions. Some of the measu

대표청구항

I claim: 1. A method of measuring temperature comprising: detecting infrared radiation arising at a first wavelength from a first site on a surface of a body when not irradiated by external infrared radiation; detecting infrared radiation arising at said first wavelength from said first site while

이 특허에 인용된 특허 (33)

  1. Sandridge Robert L. (Proctor WV) Hunt Robert N. (Wheeling WV), Ambient temperature reference device.
  2. Vachon Reginald I. (P.O. Box 1182 Atlanta GA 30301), Apparatus and method for determining stress and strain in pipes, pressure vessels, structural members and other deformab.
  3. Sheffer Michael,ILX, Apparatus and method for in-line soldering.
  4. Stein Alexander (Secaucus NJ), Apparatus for remote measurement of temperatures.
  5. Fally Jacques (Orsay FRX), Bichromatic pyrometer.
  6. Padture Nitin P. ; Gell Maurice ; Klemens Paul G., Ceramic materials for thermal barrier coatings.
  7. Bantel Thomas E. (Cincinnati OH) Lahrman David F. (Champaign IL) Halase ; III John F. (Fairfield OH), Coating thickness measurement.
  8. Peter Meinlschmidt DE; Joerg Sembach DE, Device and method for non-contact detection of structural and/or surface faults in large surface bodies.
  9. Rudolph Ralph G. (Pittsburgh PA), Dual sensor radiation pyrometer.
  10. Brouwer Nicholaas L. (Allegheny Township ; Allegheny County PA) Urbanic John M. (Churchill Borough PA) Anderson Albert R. (White Valley PA), Emissivity error correcting method for radiation thermometer.
  11. Some,Daniel I., Full frame thermal pump probe technique for detecting subsurface defects.
  12. Sakurai Hideaki,JPX ; Kumagae Akitoshi,JPX ; Higashikawa Iwao,JPX ; Ito Shinichi,JPX ; Arikado Tsunetoshi,JPX ; Okumura Katsuya,JPX, Heat treatment method and a heat treatment apparatus for controlling the temperature of a substrate surface.
  13. James R. Markham, High speed infrared radiation thermometer, system, and method.
  14. Ruud, James A.; Janora, Kevin H., In-situ method and composition for repairing a thermal barrier coating.
  15. Marcus D W Smith GB, Interpretation of thermal paint.
  16. Van Der Pasch,Engelbertus Antonius Fransiscus; Beems,Marcel Hendrikus Maria; Leenders,Martinus Hendrikus Antonius, Lithographic apparatus and device manufacturing method.
  17. Harry Israel Ringermacher ; Donald Robert Howard ; Ravindra Kumar Pandey, Method and apparatus for quantitative nondestructive evaluation of metal airfoils using high resolution transient thermography.
  18. Tank Volker (Eching DEX), Method and system for optically measuring simultaneously the emissivity and temperature of objects.
  19. Champetier Robert J. ; Egozi David,ILX, Method for determining the temperature of a semi-transparent radiating body.
  20. Jarrell, Donald B.; Sisk, Daniel R.; Hatley, Darrel D.; Kirihara, Leslie J.; Peters, Timothy J., Methods and systems for analyzing the degradation and failure of mechanical systems.
  21. Devitt, John William; Bauco, Anthony S.; Cantello, Craig Alan; Harding, Kevin G., Methods for determining the depth of defects.
  22. Courtright Edward L. ; Johnson Roger N. ; Bakker Wate T., Multilayer nanostructured ceramic thermal barrier coatings.
  23. Spitzberg Richard M., Non-contact surface temperature, emissivity, and area estimation.
  24. Barry Edward Luke GB, Optical scope with measuring system.
  25. Stein Alexander (Secaucus NJ), Pyrometer measurements in the presence of intense ambient radiation.
  26. McBride Roy,GBX ; Burnett James G.,GBX ; Greenaway Alan Howard,GBX ; Jones Julian D. C.,GBX, Sensor system for measurement of temperature or strain.
  27. Small IV, Ward; Celliers, Peter, Single-fiber multi-color pyrometry.
  28. Poulsen, Peter, Systems and methods for integrated emissivity and temperature measurement of a surface.
  29. Katzir Abraham,ILX ; Eyal Ophir,ILX ; Scharf Vered,ILX, Temperature measurement by active photothermal radiometry.
  30. Hashimoto, Miyuki; Yano, Kenji; Iwata, Misao; Kitagawa, Kuniyuki; Satoshi Arai; Arai, Norio, Temperature measuring method and apparatus.
  31. Marijnissen Gillion Herman,NLX ; Lieshout Astrid Helennia Francoise van,NLX ; Ticheler Gerardus Johannes,NLX ; Bons Hendrikus Jacobus Maria,NLX ; Ridder Michiel Leendert,NLX, Thermal barrier coating ceramic structure.
  32. Paton Neil E. ; Murphy Kenneth S. ; Clarke David R., Thermal barrier coating stress measurement.
  33. Chamberlain,Gary Roy; Mellor,Andrew; Ridley,Ian Hamilton, Thermal imaging system and method.

이 특허를 인용한 특허 (5)

  1. Feist, Jörg Peter; Nicholls, John Rayment; Fraser, Michael James; Heyes, Andrew Lawrence, Measurement, coating and monitoring system and method.
  2. Rabiei, Shahryar; Kraemer, Gilbert Otto; Myers, Geoffrey David, System and method for operating a gas turbine.
  3. Zombo, Paul J.; Lemieux, Dennis H.; Hatcher, Clifford, System for monitoring a high-temperature region of interest in a turbine engine.
  4. Ringermacher, Harry Israel; Howard, Donald Robert; Knight, Bryon Edward, Thermal imaging method and apparatus for evaluating coatings.
  5. Subramanian, Ramesh; Kulkarni, Anand A.; Jonnalagadda, Vinay; Mitchell, David J., Turbine component instrumented to provide thermal measurements.
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