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IC socket to be mounted on a circuit board 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01R-012/00
출원번호 UP-0188684 (2008-08-08)
등록번호 US-7632106 (2009-12-24)
우선권정보 JP-2007-207702(2007-08-09)
발명자 / 주소
  • Nakamura, Yuji
출원인 / 주소
  • Yamaichi Electronics Co., Ltd.
대리인 / 주소
    Banner & Witcoff, Ltd.
인용정보 피인용 횟수 : 56  인용 특허 : 30

초록

The configuration comprises a base board to be mounted a circuit board, with an IC receiving concave place and a resilient member receiving area, having an upper wall and a lower wall surrounding the resilient member receiving area, the upper wall provided with a first slot for contact and the lower

대표청구항

What is claimed is: 1. An IC socket to be mounted on a circuit board, comprising a base board having an upper wall and a lower wall face to face with each other to surround together a resilient member receiving area and having a curved surface formed integral with the base board and protruding to t

이 특허에 인용된 특허 (30)

  1. Johnson David A. (St. Louis Park MN), Apparatus for interconnecting electrical contacts.
  2. Johnson David A. ; Kline Eric V., Apparatus for providing controlled impedance in an electrical contact.
  3. Gilk,Mathew L., Circuit contact to test apparatus.
  4. Osato,Eichi; Goto,Yoshihito, Contact and electrical connecting apparatus.
  5. Bonnefoy Jean (Crespieres FRX), Electrical connection device for high density contacts.
  6. Kimura,Ken, Electrical connector.
  7. Rathburn James J., Electrical connector with multiple modes of compliance.
  8. Rathburn James J., Electrical connector with multiple modes of compliance.
  9. Rathburn James J., Electrical connector with multiple modes of compliance.
  10. Tan Yin Leong,SGX, Electrical contactor for testing integrated circuit devices.
  11. Johnson David A. (5600 W. 25 ½St. St. Louis Park MN 55416), Electrical interconnect contact system.
  12. Johnson David A. (5600 W. 25½St. St. Louis Park MN 55416), Electrical interconnect contact system.
  13. Johnson David A. (5600 W. 25½St. St. Louis Park MN 55416), Electrical interconnect contact system.
  14. Johnson David A. (Wayzata MN), Electrical interconnect contact system.
  15. Johnson David A. ; Kline Eric V. ; Fulcher Donald L., Electrical interconnect contact system.
  16. Rathburn James J., Electrical interconnect contact system.
  17. Rathburn,James J.; Cavegn,Martin, Fine pitch electrical interconnect assembly.
  18. Rathburn,James J.; Cavegn,Martin, Fine pitch electrical interconnect assembly.
  19. Rathburn,James J.; Cavegn,Martin, Fine pitch electrical interconnect assembly.
  20. Shibata Sueji,JPX, IC socket.
  21. Suzuki, Katsumi; Nakamura, Yuji, IC socket contact medium having uniform contact force.
  22. Kline Eric V., Integrated circuit test socket with enhanced noise imminity.
  23. Rathburn, James J., Low or zero insertion force connector for printed circuit boards and electrical devices.
  24. Rathburn James J., Method of utilizing a replaceable chip module.
  25. Rathburn James J., Multi-mode compliance connector and replaceable chip module utilizing the same.
  26. James J. Rathburn, Multi-mode compliant connector and replaceable chip module utilizing the same.
  27. Rathburn James J., Replacement chip module.
  28. Sakamoto Iwao,JPX, Semiconductor device measuring socket having socket position adjustment member.
  29. Nelson, John E., Small pin connecters.
  30. Lopez,Jose E.; Shell,Dennis B.; Gilk,Mathew L., Test socket.

이 특허를 인용한 특허 (56)

  1. Rathburn, James, Area array semiconductor device package interconnect structure with optional package-to-package or flexible circuit to package connection.
  2. Rathburn, James, Bumped semiconductor wafer or die level electrical interconnect.
  3. Rathburn, James, Compliant conductive nano-particle electrical interconnect.
  4. Rathburn, James, Compliant core peripheral lead semiconductor socket.
  5. Rathburn, James, Compliant printed circuit area array semiconductor device package.
  6. Rathburn, James, Compliant printed circuit semiconductor package.
  7. Rathburn, James, Compliant printed circuit semiconductor package.
  8. Rathburn, James, Compliant printed circuit semiconductor tester interface.
  9. Rathburn, James, Compliant printed circuit socket diagnostic tool.
  10. Rathburn, James, Compliant printed circuit wafer level semiconductor package.
  11. Rathburn, James, Compliant printed circuit wafer probe diagnostic tool.
  12. Rathburn, James, Compliant printed flexible circuit.
  13. Rathburn, James, Compliant wafer level probe assembly.
  14. Rathburn, James, Composite polymer-metal electrical contacts.
  15. Wang, Hsin-Chieh; Chen, Wei-Chu; Shen, Yuan-Hsiang; Liu, Hsiao-Wei; Cheng, Yu-Min; Su, Yen-Ching; Yu, Huei-Che; Tsai, Bor-Chen, Connector assembly.
  16. Hamner, Richard Elof; Mulfinger, Robert Neil; Reisinger, Jason M'Cheyne; Taylor, Attalee Snarr, Connector assembly having a floating mating array.
  17. Mulfinger, Robert Neil; Hamner, Richard Elof, Connector with a laterally moving contact.
  18. Rathburn, James, Copper pillar full metal via electrical circuit structure.
  19. Rathburn, Jim, Copper pillar full metal via electrical circuit structure.
  20. Rathburn, James, Direct metalization of electrical circuit structures.
  21. Rathburn, James, Electrical connector insulator housing.
  22. Rathburn, James, Electrical interconnect IC device socket.
  23. Rathburn, James, Electrical interconnect IC device socket.
  24. Millard, Steven J.; Reisinger, Jason M'Cheyne; Hamner, Richard Elof, Flexible circuit member for electrically coupling connectors with one another.
  25. Rathburn, James, Fusion bonded liquid crystal polymer circuit structure.
  26. Rathburn, James, High performance electrical circuit structure.
  27. Rathburn, James, High performance surface mount electrical interconnect.
  28. Rathburn, James, High performance surface mount electrical interconnect.
  29. Rathburn, James, High performance surface mount electrical interconnect.
  30. Rathburn, James, High performance surface mount electrical interconnect with external biased normal force loading.
  31. Rathburn, James, High speed circuit assembly with integral terminal and mating bias loading electrical connector assembly.
  32. Rathburn, James, Hybrid printed circuit assembly with low density main core and embedded high density circuit regions.
  33. Landa, Victor, Integrated circuit chip tester with an anti-rotation link.
  34. Landa, Victor, Integrated circuit chip tester with embedded micro link.
  35. Tiengtum, Pongsak, Integrated circuit socket connector.
  36. Rathburn, James J., Low profile electrical interconnect with fusion bonded contact retention and solder wick reduction.
  37. Rathburn, James J., Mechanical contact retention within an electrical connector.
  38. Rathburn, James, Metalized pad to electrical contact interface.
  39. Rathburn, James, Method of forming a semiconductor socket.
  40. Rathburn, James, Method of making a compliant printed circuit peripheral lead semiconductor package.
  41. Rathburn, James, Method of making a compliant printed circuit peripheral lead semiconductor test socket.
  42. Rathburn, James J., Method of making an electrical connector having electrodeposited terminals.
  43. Rathburn, Jim, Method of making an electronic interconnect.
  44. Rathburn, James, Performance enhanced semiconductor socket.
  45. Duesterhoeft, Scott Stephen; Reisinger, Jason M'Cheyne; Mulfinger, Robert Neil, Removable card connector assemblies having flexible circuits.
  46. Rathburn, James, Resilient conductive electrical interconnect.
  47. Rathburn, James, Selective metalization of electrical connector or socket housing.
  48. Rathburn, Jim, Selective metalization of electrical connector or socket housing.
  49. Rathburn, James, Semiconductor device package adapter.
  50. Rathburn, James, Semiconductor die terminal.
  51. Rathburn, James, Semiconductor socket with direct selective metalization.
  52. Rathburn, James, Simulated wirebond semiconductor package.
  53. Rathburn, James, Singulated semiconductor device separable electrical interconnect.
  54. Hayakawa, Kenji, Socket for electric parts.
  55. Do, Trent K., Surface connector with silicone spring member.
  56. Wagman, Daniel C.; Jol, Eric S.; Do, Trent K., Surface connector with silicone spring member.
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