IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
UP-0560432
(2004-06-01)
|
등록번호 |
US-7649621
(2010-02-22)
|
우선권정보 |
EP-03101841(2003-06-23) |
국제출원번호 |
PCT/EP2004/005879
(2004-06-01)
|
§371/§102 date |
20060321
(20060321)
|
국제공개번호 |
WO05/001377
(2005-01-06)
|
발명자
/ 주소 |
- Braunecker, Bernhard
- Kipfer, Peter
|
출원인 / 주소 |
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
0 인용 특허 :
9 |
초록
▼
The invention relates to an optical inclinometer. According to the invention, an incline-dependent medium, e.g. a liquid surface, is positioned in the pupil of an optical subsystem and a detectable wave front is imaged onto a detector by means of said medium. A phase displacement of radiation emitte
The invention relates to an optical inclinometer. According to the invention, an incline-dependent medium, e.g. a liquid surface, is positioned in the pupil of an optical subsystem and a detectable wave front is imaged onto a detector by means of said medium. A phase displacement of radiation emitted from a radiation source is caused by said medium; the interaction of the radiation and the medium can take place during reflection or transmission. An aberration of the wave front caused by the medium can be analyzed by means of a wave front sensor and compensated by an evaluation unit or the detector. A wave front sensor having a diffractive structure formed upstream of each subaperture is compact and increases the resolution and the detectable angular region of the inclinometer.
대표청구항
▼
The invention claimed is: 1. An optical inclinometer, comprising a radiation source for generating radiation; a medium having an inclination-sensitive surface and having an optical interface which is inclination-dependent; a detector for recording and converting an image into signals; and an evalua
The invention claimed is: 1. An optical inclinometer, comprising a radiation source for generating radiation; a medium having an inclination-sensitive surface and having an optical interface which is inclination-dependent; a detector for recording and converting an image into signals; and an evaluation unit for determining an inclination; wherein the radiation source and the detector are arranged so that a wavefront of the radiation is focused indirectly or directly, in reflection and/or transmission, onto the detector by at least a part of the medium; wherein the detector has a wavefront sensor or the detector is the wavefront sensor. 2. The optical inclinometer according to claim 1, wherein the medium is a liquid. 3. The optical inclinometer according to claim 1, wherein the radiation source, the medium and the detector are arranged so that the radiation is fed substantially perpendicularly to at least one surface of the medium during a passage through the medium. 4. The optical inclinometer according to claim 1, wherein the detector has at least one diffractive element which is arranged on an array of microlenses. 5. The optical inclinometer according to claim 1, wherein the detector is a Shack-Hartmann wavefront sensor or has a Shack-Hartmann wavefront sensor. 6. The optical inclinometer according to claim 1, wherein the detector is mounted indirectly or directly on a container containing the medium. 7. The optical inclinometer according to claim 1, wherein the detector has a detector surface which has two dimensions. 8. The optical inclinometer according to claim 1, wherein the radiation source and the detector are arranged on a common base. 9. The optical inclinometer according to claim 8, wherein the radiation source and the detector are arranged so that the radiation generated is emitted perpendicularly to a surface of the base and a receiving direction of the detector is oriented perpendicularly to the surface of the base. 10. The optical inclinometer according to claim 1, wherein at least one deflection element is arranged in a beam path from the radiation source to the detector. 11. The optical inclinometer according to claim 1, wherein at least one diffractive and/or optical-gradient element is arranged in a beam path from the radiation source to the detector. 12. A geodetic device comprising an inclinometer according to claim 1. 13. A method for measuring an inclination of a device that includes a radiation source for generating radiation; a medium having an inclination-sensitive surface and having an optical interface which is inclination-dependent; a detector for recording and converting an image into signals; and an evaluation unit for determining an inclination, wherein the radiation source and the detector are arranged so that a wavefront of the radiation is focused indirectly or directly, in reflection and/or transmission, onto the detector by at least a part of the medium, the method comprising the steps of: focusing of the wavefront of the radiation onto the detector; recording of the signals of the detector; and evaluating of the signals and determining of the inclination of the device; wherein during the evaluating of the signals, information about the wavefront of the radiation is derived. 14. The method according to claim 13, wherein, during the evaluating of the signals, an analysis of the deviation of the wavefront of the radiation from the wavefront before an interaction with the medium is effected. 15. The method according to claim 13, wherein, during the recording of the signals and/or during the evaluating of the signals, a reconstruction of the wavefront of the radiation before an interaction of the medium is effected. 16. The method according to claim 13, wherein, during the recording of the signals and/or during the evaluating of the signals, individual image points of the detector are selected. 17. The method according to claim 13, wherein, during the evaluating of the signals, the form function is derived by a polynomial approach. 18. The method according to claim 13, wherein, during the recording of the signals and/or during the evaluating of the signals, different apertures are correlated with one another. 19. The method according to claim 13 being used for compensating vibrations and/or random fluctuations of at least one surface of the medium. 20. A wavefront sensor for use in an optical inclinometer according to claim 1, comprising: a camera for recording and converting the image into the signals; and an array of microlenses, wherein that at least one diffractive element is coordinated with the array of microlenses. 21. The wavefront sensor according to claim 20, wherein the diffractive element is a hologram or a grating. 22. The optical inclinometer according to claim 1, wherein the radiation source is a semiconductor laser or an LED. 23. The optical inclinometer according to claim 1, wherein the detector has a CMOS microcamera or CCD microcamera. 24. The optical inclinometer according to claim 7, wherein the orientation of the detector surface is parallel to a surface of the medium. 25. The optical inclinometer according to claim 8, wherein the common base is a circuit board. 26. The optical inclinometer according to claim 11, wherein the at least one diffractive and/or optical-gradient element is a Fresnel lens. 27. The optical inclinometer according to claim 12, wherein the geodetic device is a telemeter or a plumb staff. 28. The method according to claim 13, for measuring the inclination of a device, wherein the device is a geodetic device. 29. The method according to claim 13, wherein the radiation source is a semiconductor laser or an LED. 30. The method according to claim 13, wherein the information about the wavefront of the radiation is a form function of the of the radiation. 31. The method according to claim 13, wherein the detector has a CMOS microcamera or a CCD microcamera. 32. The method according to claim 16, wherein only the individual image points are used for determining the inclination of the device. 33. The method according to claim 17, wherein the polynomial approach uses Zemike polynomials. 34. The wavefront sensor according to claim 20, wherein the camera includes a CMOS microcamera or a CCD microcamera. 35. The wavefront sensor according to claim 21, wherein the diffractive element is a Dammann grating.
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