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In-process vision detection of flaws and FOD by back field illumination 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B32B-041/00
출원번호 UP-0179681 (2008-07-25)
등록번호 US-7678214 (2010-04-21)
발명자 / 주소
  • Engelbart, Roger W.
  • Hannebaum, Reed
  • Pollock, Tim
출원인 / 주소
  • The Boeing Company
대리인 / 주소
    Ostrager Chong Flaherty & Broitman P.C.
인용정보 피인용 횟수 : 7  인용 특허 : 110

초록

A flaw and foreign object debris (FOD) detection system (11) for use during fabrication of a structure (12) includes an illumination device (13). The illumination device (13) is configured to be in proximity with a fabrication system (10) and illuminates a portion (18) of the structure (12). The ill

대표청구항

We claim: 1. A method of fabricating a composite structure comprising: applying a plurality of composite material layers to a substrate to form a structure; generating light rays; during the fabrication of said composite structure, directing said light rays at a portion of the structure and at an a

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이 특허를 인용한 특허 (7)

  1. Georgeson, Gary E.; Troy, James J.; Lea, Scott W., Automated system and method for tracking and detecting discrepancies on a target object.
  2. Engelbart, Roger W.; Hannebaum, Reed; Rector, Eric, Mapping tow splices in composite structures.
  3. Engelbart, Roger W.; Hannebaum, Reed; Rector, Eric, Mapping tow splices in composite structures.
  4. Walton, Steven R., Method and system for two-dimensional and three-dimensional inspection of a workpiece.
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  7. Maass, David, Systems and methods for automated composite layup quality assurance.
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