초록 ▼

A method for manufacturing a capacitive semiconductor sensor includes: forming a plurality of circuit chips in a wafer, wherein each circuit chip includes a pad for testing a sensor chip; bonding the sensor chip on each circuit chip with a bump so that the sensor chip is electrically coupled with th

A method for manufacturing a capacitive semiconductor sensor includes: forming a plurality of circuit chips in a wafer, wherein each circuit chip includes a pad for testing a sensor chip; bonding the sensor chip on each circuit chip with a bump so that the sensor chip is electrically coupled with the circuit chip, wherein each sensor chip is made of semiconductor and has a capacitance changing portion, which is disposed on one side of the sensor chip and has a variable capacitance, wherein the circuit chip detects a capacitance change of the sensor chip, and wherein the one side of the sensor chip faces the circuit chip; testing each sensor chip through the pad; and cutting the wafer into individual circuit chips so that the circuit chip and the sensor chip provide the capacitive semiconductor sensor.

대표청구항 ▼

What is claimed is: 1. A method for manufacturing a capacitive semiconductor sensor comprising: forming a plurality of circuit chips in a wafer, wherein each circuit chip includes a pad for testing a sensor chip; bonding the sensor chip on each circuit chip with a bump so that the sensor chip is el

What is claimed is: 1. A method for manufacturing a capacitive semiconductor sensor comprising: forming a plurality of circuit chips in a wafer, wherein each circuit chip includes a pad for testing a sensor chip; bonding the sensor chip on each circuit chip with a bump so that the sensor chip is electrically coupled with the circuit chip, wherein each sensor chip is made of semiconductor and has a capacitance changing portion, which is disposed on one side of the sensor chip and has a variable capacitance, wherein the circuit chip detects a capacitance change of the sensor chip, and wherein the one side of the sensor chip faces the circuit chip; testing each sensor chip through the pad; and cutting the wafer into individual circuit chips so that the circuit chip and the sensor chip provide the capacitive semiconductor sensor. 2. The method according to claim 1, further comprising: testing each circuit chip in the wafer before the bonding, wherein in the bonding, the sensor chip is bonded on the circuit chip, which is defined as a non-defective product in the testing each circuit chip. 3. The method according to claim 1, further comprising: forming a notch along with a cutting line on the wafer before the bonding. 4. The method according to claim 1, further comprising: bonding the sensor chips on a dicing tape in such a manner that arrangement of the sensor chips corresponds to arrangement of the circuit chips in the wafer before the bonding; and removing the dicing tape from the sensor chips after the bonding. 5. The method according to claim 1, wherein the sensor chips includes a plurality of different types of sensor chips. 6. The method according to claim 1, wherein each circuit chip is capable of converting the capacitance change of the sensor chip to a voltage signal, and the voltage signal is outputted from the pad of each circuit chip. 7. The method according to claim 1, wherein the bump is made of gold or solder. 8. A method for manufacturing a capacitive semiconductor sensor comprising: forming a plurality of circuit chips in a wafer, wherein each circuit chip includes a pad for testing a sensor chip; bonding the wafer on a first dicing tape; cutting the wafer into individual circuit chips; bonding the sensor chip on each circuit chip with a bump so that the sensor chip is electrically coupled with the circuit chip, wherein each sensor chip is made of semiconductor and has a capacitance changing portion, which is disposed on one side of the sensor chip and has a variable capacitance, wherein the circuit chip detects a capacitance change of the sensor chip, and wherein the one side of the sensor chip faces the circuit chip; testing each sensor chip through the pad; and removing the first dicing tape from the circuit chips after the bonding so that the circuit chip and the sensor chip provide the capacitive semiconductor sensor. 9. The method according to claim 8, further comprising: bonding the sensor chips on a second dicing tape in such a manner that arrangement of the sensor chips corresponds to arrangement of the circuit chips in the wafer before the bonding; and removing the second dicing tape from the sensor chips after the bonding. 10. The method according to claim 8, wherein the sensor chips includes a plurality of different types of sensor chips. 11. The method according to claim 8, wherein each circuit chip is capable of converting the capacitance change of the sensor chip to a voltage signal, and the voltage signal is outputted from the pad of each circuit chip. 12. The method according to claim 8, wherein the bump is made of gold or solder.