초록 ▼

A high reliability radiation shielding integrated circuit apparatus comprising a plurality of package layers; a radiation shielding lid or base coupled to the plurality of package layers; wherein the circuit die are shielded from receiving an amount of radiation greater than the total dose of tolera

A high reliability radiation shielding integrated circuit apparatus comprising a plurality of package layers; a radiation shielding lid or base coupled to the plurality of package layers; wherein the circuit die are shielded from receiving an amount of radiation greater than the total dose of tolerance of the circuit die. In one embodiment, an integrated circuit apparatus for use in high reliability applications is disclosed. The integrated circuit apparatus is designed to be highly reliable and protect integrated circuit die from failing or becoming unreliable due to radiation, mechanical forces, thermal exposure, or chemical contaminates.

대표청구항 ▼

What is claimed is: 1. A space radiation shielded integrated circuit apparatus, wherein the space radiation shielded integrated circuit apparatus comprises a plurality of circuit components, and is adapted for use in space, comprising: (a.) a first package layer, comprising: i. a first circuit, pac

What is claimed is: 1. A space radiation shielded integrated circuit apparatus, wherein the space radiation shielded integrated circuit apparatus comprises a plurality of circuit components, and is adapted for use in space, comprising: (a.) a first package layer, comprising: i. a first circuit, package; a first copper-tungsten, radiation shielding base, a first substrate, a first circuit die, a first lid, whereby the first copper-tungsten radiation shielding base shields a bottom portion of the space radiation shielded integrated circuit apparatus against incident radiation, wherein the first circuit die is attached to the first substrate, using a cyanate ester adhesive, wherein the first circuit package is soldered to the first copper-tungsten radiation shielding base, using a high-temperature copper-silver solder, wherein the first substrate is attached to the first circuit package, using a cyanate ester adhesive; wherein the first lid is soldered to the first package layer, using a high-temperature gold-tin solder; (b.) a second package layer, comprising: i. a second substrate, a second circuit package, a second circuit die, and a second copper-tungsten radiation shielding base, wherein the second circuit die is attached to the second substrate, using a cyanate ester adhesive, wherein the second copper-tungsten radiation shielding base is attached to the second circuit package, using a high-temperature copper-silver solder, wherein the second substrate is attached to the second circuit package, using a cyanate ester adhesive; wherein a top of the second package layer is attached to a bottom of the first package layer, using a high-temperature gold-tin solder, thereby forming electrical, interconnects, whereby the first package layer and the second package layer are in electrical communication. 2. The apparatus of claim 1, whereto the first lid is comprises a high Z material. 3. The apparatus of claim 2, wherein the first copper-tungsten radiation shielding base comprises a high Z material. 4. The apparatus of claim 3, wherein the first circuit die receives an amount of radiation less than a total dose of tolerance of the first die. 5. The apparatus of claim 4, wherein the second circuit die receives an amount of radiation less than a total dose of tolerance of the second circuit die.