IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
UP-0777019
(2007-07-12)
|
등록번호 |
US-7709793
(2010-06-03)
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발명자
/ 주소 |
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
2 인용 특허 :
5 |
초록
▼
A bolometer circuit has a substrate, bolometer detectors coupled to the substrate, a source of calibration data and a compensation circuit. Each bolometer detector has an associated calibration data. The compensation circuit is configured to generate a time varying compensation signal for each bolom
A bolometer circuit has a substrate, bolometer detectors coupled to the substrate, a source of calibration data and a compensation circuit. Each bolometer detector has an associated calibration data. The compensation circuit is configured to generate a time varying compensation signal for each bolometer detector based on its associated calibration data.
대표청구항
▼
What is claimed is: 1. A bolometer circuit, comprising: a substrate; a plurality of bolometer detectors coupled to the substrate; a source of calibration data, each bolometer detector having an associated calibration data; and a compensation circuit configured to generate a time varying temperature
What is claimed is: 1. A bolometer circuit, comprising: a substrate; a plurality of bolometer detectors coupled to the substrate; a source of calibration data, each bolometer detector having an associated calibration data; and a compensation circuit configured to generate a time varying temperature compensation signal based on substrate temperature for each bolometer detector based on its associated calibration data, such that a bolometer detector signal is temperature compensated by the compensation signal over a range of substrate operating temperatures, wherein the source of calibration data comprises a digital memory and the compensation circuit comprises a multiplying digital to analog converter configured to attenuate or amplify the time varying temperature compensation signal based on the calibration data, wherein the time varying temperature compensation signal comprises a ramp potential. 2. The bolometer circuit of claim 1, wherein the bolometer detector signal is summed with the time varying temperature compensation signal. 3. The bolometer circuit of claim 1, further comprising: a source of bias data, each bolometer detector having an associated bias constant; and a bias circuit configured to pulse bias each bolometer detector based on its associated bias constant. 4. The bolometer circuit of claim 3, wherein the bias circuit comprises a bias resistor thermally coupled to the substrate and comprising a material with substantially the same temperature coefficient of resistance as the bolometer detectors. 5. The bolometer circuit of claim 1, wherein the compensation circuit comprises a compensation resistor thermally coupled to the substrate and comprising a material with substantially the same temperature coefficient of resistance as the bolometer detectors. 6. The bolometer circuit of claim 1, wherein the compensation circuit comprises a resistor thermally coupled to the substrate and an integrator. 7. The bolometer circuit of claim 1, further comprising: a bias circuit configured to pulse bias each bolometer detector, wherein the compensation circuit is configured to pre-start the ramp potential a predetermined time before the pulse bias. 8. The bolometer circuit of claim 7, wherein the predetermined time is proportional to the ratio of a temperature above substrate of the bolometer detector at the beginning of the pulse to a temperature rise of the bolometer detector during the pulse. 9. The bolometer circuit of claim 1, further comprising: a bias circuit configured to bias each bolometer detector; and an amplifier configured to receive a sum of a signal from the bolometer detector, the time varying temperature compensation signal, and a bias signal from the bias circuit. 10. The bolometer circuit of claim 9, further comprising an integrating amplifier to integrate and band limit the amplified and compensated detector signal. 11. The bolometer circuit of claim 10, further comprising a sample and hold circuit configured to sample and hold an output of the integrating amplifier. 12. The bolometer circuit of claim 1, wherein the plurality of bolometer detectors are arranged in an array of at least 50 by 50. 13. A method of compensating a bolometer signal, comprising: generating detector signals from each of a plurality of bolometers; providing a source of calibration data, each bolometer detector having an associated calibration data; and providing a time varying temperature compensation signal to the detector signal from each bolometer based on its associated calibration data and based on substrate temperature, such that the detector signals are temperature compensated by the compensation signals over a range of substrate operating temperatures, wherein the calibration data is applied to a multiplying digital to analog converter to amplify or attenuate the time varying temperature compensation signal based on the calibration data, wherein the time varying temperature compensation signal comprises a ramp potential. 14. The method of claim 13, further comprising: providing a bias circuit configured to pulse bias each bolometer; and amplifying a sum of the pulse bias signal, time varying temperature compensation signal, and detector signal. 15. A system for compensating a bolometer signal, comprising: means for generating detector signals from each of a plurality of bolometers; means for providing a source of calibration data, each bolometer detector having an associated calibration data; and means for providing a time varying temperature compensation signal to the detector signal from each bolometer based on its associated calibration data and based on substrate temperature, such that the detector signals are temperature compensated by the compensation signals over a range of substrate operating temperatures, wherein the calibration data is applied to a multiplying digital to analog converter to amplify or attenuate the time varying temperature compensation signal based on the calibration data, wherein the time varying temperature compensation signal comprises a ramp potential. 16. The system of claim 15, further comprising: means for providing a bias circuit configured to pulse bias each bolometer; and means for amplifying a sum of the pulse bias signal, time varying temperature compensation signal, and detector signal.
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