Power supply monitoring for an implantable device
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IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
A61N-001/00
출원번호
UP-0588798
(2006-10-27)
등록번호
US-7711426
(2010-06-03)
발명자
/ 주소
Armstrong, Randolph K.
Armstrong, Scott A.
Inman, D. Michael
Scott, Timothy L.
출원인 / 주소
Cyberonics, Inc.
대리인 / 주소
Conley Rose, P.C.
인용정보
피인용 횟수 :
11인용 특허 :
3
초록▼
A method and an apparatus for determining a time period remaining in a useful life of an energy storage device in an implantable medical device. The method may include measuring a voltage of the energy storage device to produce a measured voltage, and comparing the measured voltage to a transition v
A method and an apparatus for determining a time period remaining in a useful life of an energy storage device in an implantable medical device. The method may include measuring a voltage of the energy storage device to produce a measured voltage, and comparing the measured voltage to a transition voltage. While the measured voltage is greater than or equal to the transition voltage, the time period remaining in the energy storage device's useful life is approximated based upon a function of charge depleted. While the measured voltage is less than the transition voltage, the time period remaining in the energy storage device's useful life is approximated based upon a higher order polynomial function of the measured voltage. The transition voltage corresponds to a predetermined point on a energy storage device voltage depletion curve representing the voltage across the energy storage device over time.
대표청구항▼
What is claimed is: 1. A method for determining a time period remaining in a useful life of an energy storage device in an implantable medical device, the method comprising: measuring a voltage of the energy storage device to produce a measured voltage; comparing the measured voltage to a transitio
What is claimed is: 1. A method for determining a time period remaining in a useful life of an energy storage device in an implantable medical device, the method comprising: measuring a voltage of the energy storage device to produce a measured voltage; comparing the measured voltage to a transition voltage; while the measured voltage is greater than or equal to the transition voltage, determining a time period remaining in the energy storage device's useful life based upon a function of charge depleted; and while the measured voltage is less than the transition voltage, performing a calculation using a higher order polynomial function of the measured voltage and determining a time period remaining in the energy storage device's useful life based upon said calculation; wherein the transition voltage corresponds to a predetermined point on an energy storage device voltage depletion curve representing the voltage across the energy storage device over time. 2. The method of claim 1, wherein the higher order polynomial function of the measured voltage comprises: Time remaining=% remaining×[Cinitial/Iavg]; and % remaining=(−b+SQRT(b2−4a(c−Vmeasured)))/2a; where a, b, and c are predetermined polynomial coefficients, Vmeasured is the measured voltage, Cinitial is the charge that the energy storage device initially started with, and Iavg is the average current consumption rate. 3. The method of claim 1, wherein the transition voltage is approximately 2.6 volts. 4. The method of claim 1, wherein the transition voltage comprises a variable value that is calculated based upon the average current consumption rate. 5. The method of claim 4, wherein the transition voltage comprises a variable value that is calculated based upon the consumption rate according to the following equation: Transition Voltage=the maximum of W volts or (X volts−(LOG(Iavg/Y))/Z); Where W is a variable or constant voltage, X is a voltage greater than W volts, Iavg is the average current consumption rate, and Y and Z are predetermined coefficients. 6. The method of claim 1, wherein the measured voltage is corrected with an impedance correction factor for use in determining the time period remaining in the energy storage device's useful life. 7. The method of claim 6, wherein the impedance correction factor is a constant. 8. The method of claim 6, wherein the measured voltage is corrected by the impedance correction factor according to the following equation: Voltage used to calculate time remaining=Vmeasured+[Rconst×Iavg]; where Vmeasured is the measured voltage, Rconst is the constant impedance correction factor and Iavg is the variable average current consumption rate. 9. The method of claim 1, wherein while the measured voltage is greater than or equal to the transition voltage, determining a time period remaining in the energy storage device's useful life further comprises calculating the time period based upon the total charge depleted, and at least one of the total available electrical charge and a consumption rate. 10. The method of claim 2, further comprising: measuring the temperature of the energy storage device; calculating a Vcompensated by compensating the value for Vmeasured for temperature; and replacing Vmeasured with Vcompensated to calculate Time remaining. 11. The method of claim 10, further comprising: measuring the temperature of the energy storage device; compensating the value for Vmeasured for temperature according to the following algorithm: Vcompensated=Vmeasured+(K×(Tbaseline−Tmeasurement)); wherein Vmeasured is the measured voltage, Tmeasured is the measured temperature, Tbaseline is a base temperature, and K is a temperature compensation constant; and replacing Vmeasured with Vcompensated in the calculation of Time remaining such that: Time remaining=% remaining×[Cinitial/Iavg]; and % remaining=(−b+SQRT(b2−4a(c−Vcompensated)))/2a; where a, b, and c are predetermined polynomial coefficients, Vcompensated is the measured voltage compensated for temperature, Cinitial is the charge that the energy storage device initially started with, and Iavg is the average current consumption rate.
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이 특허에 인용된 특허 (3)
Loch, Robert, Battery charge indicator such as for an implantable medical device.
Schmidt, Craig L.; Wahlstrand, John D.; Crespi, Ann M.; Younker, Gregory A.; Busacker, James W., Estimating remaining battery service life in an implantable medical device.
Davis, Jon P.; Goetz, Steven M.; Torgerson, Nathan A.; Singal, Ashish; Davenport, Lynn A.; Sahasrabudhe, Rajeev M.; Gokaldas, Shyam; Anderson, Joel A.; Perz, Leroy L.; Straka, Scott E., User interface for optimizing energy management in a neurostimulation system.
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