Image null-balance system with multisector-cell direction sensing
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01C-001/00
G01C-003/08
출원번호
UP-0409529
(2006-04-21)
등록번호
US-7733469
(2010-06-29)
발명자
/ 주소
Kane, David M.
Selwyn, Philip
출원인 / 주소
Arete' Associates
대리인 / 주소
Lippman, Peter I.
인용정보
피인용 횟수 :
0인용 특허 :
18
초록▼
A light beam is detected/localized by multisector detector—quad-cell, or 5+ sectors handling plural beams. Preferences: Beams focus to diffraction limit on the detector, which reveals origin direction by null-balance—shifting spots to a central sector junction, and measuring shifts to
A light beam is detected/localized by multisector detector—quad-cell, or 5+ sectors handling plural beams. Preferences: Beams focus to diffraction limit on the detector, which reveals origin direction by null-balance—shifting spots to a central sector junction, and measuring shifts to reach there. One or more MEMS reflectors, and control system with programmed processor(s), sequence the spot toward center: following a normal to an intersector boundary; then along the boundary. One afocal optic amplifies MEMS deflections; another sends beams to imaging optics. After it's known which sector received a spot, and the beam shifts, source direction is reported. The system can respond toward that (or a related) direction. It can illuminate objects, generating beams reflectively. Optics define an FOR in which to search; other optics define an FOV (narrower), for imaging spots onto the detector. The FOR:FOV angular ratio is on order of ten—roughly 180:20°, or 120:10°.
대표청구항▼
We claim: 1. Apparatus for detecting, and determining the direction of, an incident beam of light; said apparatus comprising: a multiple-sector-cell detector; optics for forming a sharply focused image of such beam on the multiple-sector-cell detector; and means, responsive to the multiple-sector-c
We claim: 1. Apparatus for detecting, and determining the direction of, an incident beam of light; said apparatus comprising: a multiple-sector-cell detector; optics for forming a sharply focused image of such beam on the multiple-sector-cell detector; and means, responsive to the multiple-sector-cell detector, for determining the direction of origin of such beam, wherein the direction-determining means: interact with the detector in a null-balance mode of operation; and comprise means for: deflecting the sharply focused image to a central position substantially common to the multiple sectors, and measuring the amount of deflection required to move the image to the central position. 2. The apparatus of claim 1, wherein: the multiple-sector-cell detector is a quad-cell detector. 3. The apparatus of claim 1, wherein: the optics comprise means for focusing such beam to a substantially diffraction-limited spot on the detector. 4. The apparatus of claim 1, further comprising: means for operating the detector to determine which of the multiple sectors has received the beam; and means for deflecting the beam by a measured amount, along the detector, to reach a boundary between only two of the sectors. 5. The apparatus of claim 1, wherein: the deflecting-and-measuring means comprise an array of one or more MEMS mirrors. 6. The apparatus of claim 1, wherein: the deflecting-and-measuring means comprise at least one programmed processor for sequencing the sharply focused image in a logical progression to the central position. 7. The apparatus of claim 6, wherein the programmed processor comprises programming for sequencing the sharply focused image to: first, a boundary between two of the sectors; and then along that boundary to the central position. 8. The apparatus of claim 7, wherein the programmed processor comprises: programming for deflecting the beam to the boundary by a first measured amount, along a track that is generally normal to the boundary; and then deflecting the beam by a second measured amount, along the boundary, to reach the central position. 9. The apparatus of claim 8, wherein the processor further comprises: programming for interpreting the two measured amounts of deflection to determine the position of the source of the beam. 10. The apparatus of claim 8, wherein: the programming deflects the beam to the boundary and then to the central position when such beam is present and the processor is operating. 11. The apparatus of claim 6, wherein: the at least one processor sequences said image in a logical progression to the central position when such sharply focused image is present and the processor is operating. 12. The apparatus of claim 1, further comprising: an array of MEMS mirrors. 13. The apparatus of claim 11, further comprising: a control system for operating the MEMS mirrors to deflect the sharply focused image along the detector. 14. The apparatus of claim 13, further comprising: an afocal optical element for amplifying the deflection produced by the MEMS mirrors. 15. The apparatus of claim 14, wherein: the afocal element amplifies said deflection when such image is present and the apparatus is operating. 16. The apparatus of claim 13, wherein: the control system operates the MEMS mirrors to deflect the image along the detector when such image is present and the control system is operating. 17. The apparatus of claim 1, further comprising: an afocal optical element for amplifying the deflection produced by the deflecting means. 18. The apparatus of claim 17, wherein: the afocal element amplifies said deflection when such sharply focused image is present and the apparatus is operating. 19. The apparatus of claim 1, further comprising: an afocal optical element for directing such beam to the image-forming optics. 20. The apparatus of claim 19, wherein: the afocal element directs such beam to the image-forming optics when such beam is present and the apparatus is operating. 21. The apparatus of claim 1, wherein: the multiple-sector-cell detector comprises at least five sectors. 22. The apparatus of claim 21, wherein: the at least five sectors facilitate detecting, and determining the direction of, plural incident beams of light. 23. The apparatus of claim 1, wherein: the optics form said sharply focused image when such beam is present and the apparatus is operating. 24. Apparatus for detecting, and determining the direction of, an incident beam of light; said apparatus comprising: a multiple-sector-cell detector; optics for forming an image of such beam on the multiple-sector-cell detector; and means, responsive to the multiple-sector-cell detector, for determining the direction of origin of such beam; wherein the determining means interact with the detector in a feedback mode of operation, and comprise means for: deflecting the image to a reference position along the multiple-sector-cell detector, and measuring an amount of deflection required to move the image to the reference position. 25. The apparatus of claim 24, wherein: the feedback mode of operation is a null-balance mode. 26. The apparatus of claim 25, wherein: said optics comprise means for sharply focusing the image on the detector. 27. The apparatus of claim 26, wherein: the reference position is substantially common to the multiple sectors. 28. The apparatus of claim 27, wherein: the substantially common reference position is a central position on the multiple-sector-cell detector. 29. The apparatus of claim 24, wherein: the reference position is a central position on the multiple-sector-cell detector. 30. The apparatus of claim 29, wherein: the reference position is substantially common to the multiple sectors. 31. The apparatus of claim 30, wherein: said optics comprise means for sharply focusing the image on the detector. 32. The apparatus of claim 31, wherein: the feedback mode of operation is a null-balance mode. 33. The apparatus of claim 24, wherein: said optics comprise means for sharply focusing the image on the detector.
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