초록 ▼

Systems configured to inspect a wafer are provided. One system includes an illumination subsystem configured to illuminate an area on the wafer by directing light to the wafer at an oblique angle of incidence. The system also includes a collection subsystem configured to simultaneously collect light

Systems configured to inspect a wafer are provided. One system includes an illumination subsystem configured to illuminate an area on the wafer by directing light to the wafer at an oblique angle of incidence. The system also includes a collection subsystem configured to simultaneously collect light scattered from different spots within the illuminated area and to focus the light collected from the different spots to corresponding positions in an image plane. In addition, the system includes a detection subsystem configured to separately detect the light focused to the corresponding positions in the image plane and to separately generate output responsive to the light focused to the corresponding positions in the image plane. The output can be used to detect defects on the wafer.

대표청구항 ▼

What is claimed is: 1. A system configured to inspect a wafer, comprising: an illumination subsystem configured to illuminate an area on the wafer by directing light to the wafer at an oblique angle of incidence; a collection subsystem configured to simultaneously collect light scattered from diffe

What is claimed is: 1. A system configured to inspect a wafer, comprising: an illumination subsystem configured to illuminate an area on the wafer by directing light to the wafer at an oblique angle of incidence; a collection subsystem configured to simultaneously collect light scattered from different spots within the illuminated area and to focus the light collected from the different spots to corresponding positions in an image plane, wherein the different spots are spatially separated from each other within the illuminated area on the wafer, and wherein each of the different spots is configured such that an amount of haze collected from each of the different spots is significantly less than an amount of haze associated with the illuminated area on the wafer; and a detection subsystem configured to separately detect the light focused to the corresponding positions in the image plane and to separately generate output responsive to the light focused to the corresponding positions in the image plane, wherein the output can be used to detect defects on the wafer. 2. The system of claim 1, wherein the different spots within the illuminated area do not overlap with each other within the illuminated area. 3. The system of claim 1, wherein a size of each of the different spots on the wafer is approximately equal. 4. The system of claim 1, wherein each of the different spots is further configured such that a direct current light level due to the haze collected from each of the different spots is significantly less than a direct current light level due to the haze associated with the illuminated area on the wafer. 5. The system of claim 1, wherein each of the different spots is further configured such that spatial noise collected from each of the different spots due to roughness of the wafer is significantly less than spatial noise associated with the illuminated area on the wafer due to the roughness of the wafer. 6. The system of claim 1, wherein the collection subsystem comprises an optical element configured to simultaneously collect the light scattered from the different spots, and wherein a section of the optical element is removed such that the illumination subsystem can direct the light through the section to the area on the wafer at the oblique angle of incidence. 7. The system of claim 1, wherein the wafer comprises an unpatterned wafer. 8. The system of claim 1, wherein the wafer comprises a patterned wafer, and wherein the system is further configured to scan the light directed to the patterned wafer across the patterned wafer in x and y directions. 9. The system of claim 1, wherein the collection subsystem comprises a miniaturized refractive optical element configured to simultaneously collect the light scattered from the different spots. 10. The system of claim 1, wherein the collection subsystem comprises a refractive optical element configured to simultaneously collect the light scattered from the different spots, and wherein the refractive optical element has a size allowing the system to move the refractive optical element during scanning of the light over the wafer in response to changes in focus of the collection subsystem. 11. The system of claim 1, wherein the collection subsystem is corrected such that the light scattered from the different spots is imaged to the corresponding positions in the image plane with a defined point spread function. 12. The system of claim 1, wherein the system is further configured to scan the light directed to the wafer across the wafer by simultaneously rotating and translating the wafer. 13. The system of claim 1, wherein the detection subsystem comprises a detector array configured to separately detect the light focused to the corresponding positions in the image plane. 14. The system of claim 1, wherein the detection subsystem comprises a set of optical fibers configured to separately transmit the light from the corresponding positions in the image plane to different detectors of the detection subsystem. 15. A system configured to inspect a patterned wafer, comprising: an illumination subsystem configured to simultaneously illuminate multiple spots on the patterned wafer at a substantially normal angle of incidence; a collection subsystem configured to separately collect light from the multiple spots and to focus the light collected from the multiple spots to corresponding positions in an image plane, wherein each of the multiple spots is configured such that an amount of haze collected from each of the multiple spots is significantly less than an amount of haze associated with an area covered by all of the multiple spots on the patterned wafer; and a detection subsystem configured to separately detect the light focused to the corresponding positions in the image plane and to separately generate output responsive to the light focused to the corresponding positions in the image plane, wherein the output can be used to detect defects on the patterned wafer. 16. The system of claim 15, wherein the multiple spots do not overlap with each other on the patterned wafer. 17. The system of claim 15, wherein the light from the multiple spots comprises scattered light. 18. The system of claim 15, wherein the light from the multiple spots comprises reflected light. 19. The system of claim 15, wherein a size of each of the multiple spots on the patterned wafer is approximately equal. 20. The system of claim 15, wherein each of the multiple spots is further configured such that a direct current light level due to the haze collected from each of the multiple spots is significantly less than a direct current light level due to the haze associated with the area covered by all of the multiple spots on the patterned wafer. 21. The system of claim 15, wherein each of the multiple spots is further configured such that spatial noise collected from each of the multiple spots due to roughness of the patterned wafer is significantly less than spatial noise associated with the area covered by all of the multiple spots on the patterned wafer due to the roughness of the patterned wafer. 22. The system of claim 15, wherein the collection subsystem comprises a miniaturized refractive optical element configured to collect the light from the multiple spots. 23. The system of claim 15, wherein the collection subsystem comprises a refractive optical element configured to collect the light from the multiple spots, and wherein the refractive optical element has a size allowing the system to move the refractive optical element during scanning of the patterned wafer in response to changes in focus of the collection subsystem. 24. The system of claim 15, wherein the collection subsystem is corrected such that the light from the multiple spots is imaged to the corresponding positions in the image plane with a defined point spread function. 25. The system of claim 15, wherein the system is further configured to scan light directed to the multiple spots on the patterned wafer across the patterned wafer by simultaneously rotating and translating the patterned wafer. 26. The system of claim 15, wherein the detection subsystem comprises a detector array configured to separately detect the light focused to the corresponding positions in the image plane. 27. The system of claim 15, wherein the detection subsystem comprises a set of optical fibers configured to separately transmit the light from the corresponding positions in the image plane to different detectors of the detection subsystem. 28. The system of claim 1, wherein a size of each of the different spots on the wafer is selected such that a substantial amount of the light scattered from the different spots is not scattered from a surface of the wafer. 29. The system of claim 15, wherein a size of each of the different spots on the wafer is selected such that a substantial amount of the light scattered from the different spots is not scattered from a surface of the wafer.