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특허 상세정보

MyON담기
내보내기 페이스북 공유 카카오톡 공유

On chip temperature measuring and monitoring circuit and method

특허상세정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판) G01K-007/01    H01L-017/78   
미국특허분류(USC) 374/178; 374/163; 374/170; 702/130; 327/513
출원번호 UP-0177311 (2008-07-22)
등록번호 US-7780347 (2010-09-13)
발명자 / 주소
출원인 / 주소
대리인 / 주소
    Law Office of Charles W. Peterson, Jr.
인용정보 피인용 횟수 : 0  인용 특허 : 66
초록
▼

A device temperature measurement circuit, an integrated circuit (IC) including a device temperature measurement circuit, a method of characterizing device temperature and a method of monitoring temperature. The circuit includes a constant current source and a clamping device. The clamping device selectively shunts current from the constant current source or allows the current to flow through a PN junction, which may be the body to source/drain junction of a field effect transistor (FET). Voltage measurements are taken directly from the PN junction. Junct...

대표
청구항
▼

What is claimed is: 1. A device temperature measurement circuit comprising: a PN junction in a device; a constant current source selectively providing current to said PN junction; and a clamping device in parallel with said PN junction and selectively passing all current from said constant current source, a voltage developing across said clamping device and said constant current source when said clamping device is not passing current, said voltage indicating junction temperature of said PN junction. 2. A device temperature measurement circuit as in c...

이 특허에 인용된 특허 (66)

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