$\require{mediawiki-texvc}$
  • 검색어에 아래의 연산자를 사용하시면 더 정확한 검색결과를 얻을 수 있습니다.
  • 검색연산자
검색도움말
검색연산자 기능 검색시 예
() 우선순위가 가장 높은 연산자 예1) (나노 (기계 | machine))
공백 두 개의 검색어(식)을 모두 포함하고 있는 문서 검색 예1) (나노 기계)
예2) 나노 장영실
| 두 개의 검색어(식) 중 하나 이상 포함하고 있는 문서 검색 예1) (줄기세포 | 면역)
예2) 줄기세포 | 장영실
! NOT 이후에 있는 검색어가 포함된 문서는 제외 예1) (황금 !백금)
예2) !image
* 검색어의 *란에 0개 이상의 임의의 문자가 포함된 문서 검색 예) semi*
"" 따옴표 내의 구문과 완전히 일치하는 문서만 검색 예) "Transform and Quantization"

통합검색

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

특허 상세정보

On chip temperature measuring and monitoring circuit and method

특허상세정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판) G01K-007/01    H01L-017/78   
미국특허분류(USC) 374/178; 374/163; 374/170; 702/130; 327/513
출원번호 UP-0177311 (2008-07-22)
등록번호 US-7780347 (2010-09-13)
발명자 / 주소
출원인 / 주소
대리인 / 주소
    Law Office of Charles W. Peterson, Jr.
인용정보 피인용 횟수 : 0  인용 특허 : 66
초록

A device temperature measurement circuit, an integrated circuit (IC) including a device temperature measurement circuit, a method of characterizing device temperature and a method of monitoring temperature. The circuit includes a constant current source and a clamping device. The clamping device selectively shunts current from the constant current source or allows the current to flow through a PN junction, which may be the body to source/drain junction of a field effect transistor (FET). Voltage measurements are taken directly from the PN junction. Junct...

대표
청구항

What is claimed is: 1. A device temperature measurement circuit comprising: a PN junction in a device; a constant current source selectively providing current to said PN junction; and a clamping device in parallel with said PN junction and selectively passing all current from said constant current source, a voltage developing across said clamping device and said constant current source when said clamping device is not passing current, said voltage indicating junction temperature of said PN junction. 2. A device temperature measurement circuit as in c...

이 특허에 인용된 특허 (66)

  1. Wu, Ke; Kwong, David. Active Vcc-to-Vss ESD clamp with hystersis for low supply chips. USP2003046552886.
  2. Allen William J. (7711 Hillside Dr. La Jolla CA 92037) Chavis Leon A. (P.O. Box 8788 La Jolla CA 92038). Alarm apparatus for handgun security. USP1993035196827.
  3. Fujihira Tatsuhiko (Kanagawa JPX). An overheating detection circuit including a reversely biased junction having a temperature dependent reverse leakage cu. USP1991125070322.
  4. Javanifard, Jahanshir J.; Wells, Steve; Giduturi, Hari; Ward, Dave. Analog temperature measurement apparatus and method. USP2003056567763.
  5. Niven Robert W. (Lilburn GA). Arc starter for welder. USP1987064672175.
  6. Giovanni Matranga IT; Luca Lo Coco IT; Giuseppe Compagno IT. CMOS temperature sensor. USP2002126489831.
  7. Burgener Mark L. ; Reedy Ronald E. ; Sung John Y.. Capacitor on ultrathin semiconductor on insulator. USP1999105973382.
  8. Prentice John S. (Palm Bay FL). Circuit and method for extending the safe operating area of a BJT. USP1994105357089.
  9. Milanesi Andrea,ITX. Circuit generator of a constant electric signal which is independent from temperature and manufacturing process variables. USP2000046049244.
  10. Abe, Hirofumi; Ishihara, Hideaki; Noda, Shinichi. Clamp circuit. USP2004096794921.
  11. Davis William F. (Tempe AZ). Clamping circuit. USP1977054027177.
  12. Ohashi Ikuo,JPX. Comparing and amplifying detector circuit. USP2001116316971.
  13. Ross Mark A. (San Carlos CA). Content addressable memory architecture and circuits. USP1993125270591.
  14. Bacon Glade B. (Everett WA). Coupling circuit for a measuring instrument. USP1995055418450.
  15. Moody Paul T. (Oldham GBX). Current limited temperature responsive circuit. USP1993065221888.
  16. Noftsker Russell (Woodland Hills CA) Mathews James Kirk (Van Nuys CA). Electrical operating circuit having semiconductor device junction temperature monitoring. USP1977084039928.
  17. Pippin,Jack D.. Fail-safe thermal sensor apparatus and method. USP2007067228508.
  18. Szajda Kenneth S. (Arlington MA). Feedback sensor circuit. USP1996085546041.
  19. De Vivek K.. Forward biased MOS circuits. USP2000126166584.
  20. Thomson, David; Blake, John; Manus, Lorcan Mac. Four current transistor temperature sensor and method. USP2003046554469.
  21. Johansson Jan,SEX ; Ericsson Per,SEX ; Ekenstam Nils Af,SEX ; Sjoden Henrik. Gate biasing arrangement to temperature compensate a quiescent current of a power transistor. USP2001096288596.
  22. Lien Chiu-Feng,TWX. Integrated temperature sensor. USP2000026019508.
  23. Bucksch Walter (Freising DEX) Vorel Anton (Eggenfelden DEX). Integrated transistor circuit. USP1994015278461.
  24. Shih,Kelvin. LED junction temperature tester. USP2006057052180.
  25. Masonson Raymond H. (Derwood MD). Laser thermal control using thermoelectric cooler. USP1997025602860.
  26. Watanabe, Hiroshi; Takeda, Kohji. Level shifting circuit. USP2005076914470.
  27. Hirokazu Itakura JP; Junichi Nagata JP. Load actuation circuit. USP2002056396249.
  28. Cooper, Christopher B.; Liu, Ming-Bo; Martin, Chris G.; Manning, Troy A.; Casper, Stephen L.; Dennison, Charles H.; Shirley, Brian M.; Brown, Brian L.; Batra, Shubneesh. METHOD FOR STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT, METHOD FOR STORING A TEMPERATURE THRESHOLD IN A DYNAMIC RANDOM ACCESS MEMORY, METHOD OF MODIFYING DYNAMIC RANDOM ACCESS MEMORY OPE. USP2003046552945.
  29. Hoff David L. (Fair Oaks CA). MOS temperature sensing circuit. USP1988084768170.
  30. Falik, Ohad. Method and apparatus for determining the temperature of a junction using voltage responses of the junction and a correction factor. USP2005036870357.
  31. Borys S. Senyk. Method and apparatus for monitoring the temperature of a processor. USP2002036363490.
  32. Pippin,Jack D.. Method and apparatus for programmable thermal sensor for an integrated circuit. USP2007057216064.
  33. Beer, Peter; Dobler, Manfred; Krause, Gunnar. Method for determining the temperature of a semiconductor chip and semiconductor chip with temperature measuring configuration. USP2003096612738.
  34. Sheehan, Gary E.; Wan, Jun. Method for synchronized delta-VBE measurement for calculating die temperature. USP2004056736540.
  35. Glazer Marvin A. (Tempe AZ). Modified semiconductor temperature sensor. USP1980094224537.
  36. Aslan Mehmet ; Henderson Richard. Multi-channel remote diode temperature sensor. USP2001126332710.
  37. Davidson Evan Ezra (Hopewell Junction NY) Bosco Francis Edward (Poughkeepsie NY) Vakirtzis Charles Kyriakos (New Windsor NY). On-chip temperature sensing system. USP1997065639163.
  38. Mori,Kazuhisa. Overheat detecting circuit. USP2008087417487.
  39. Nishiura Masaharu (Kawasaki JPX) Fujihira Tatsuhiko (Kawasaki JPX). Overheating detection circuit for detecting overheating of a power device. USP1994105355123.
  40. Masakazu Shoji. Process-tolerant integrated circuit design. USP2002126496056.
  41. Goetz, Laszlo; Reithmaier, Stefan; Scoones, Kevin. Reference voltage source. USP2004056737848.
  42. Peterson Scott M.. Self checking temperature sensing circuit. USP1998055748429.
  43. Shunzou Ohshima JP. Semiconductor active fuse operating at higher supply voltage employing current oscillation. USP2002086441679.
  44. Tomishima, Shigeki. Semiconductor device suitable for system in package. USP2005126977849.
  45. Hidaka, Hideto. Semiconductor integrated circuit device operating with low power consumption. USP2003106635934.
  46. Kunst David J.. Solid state temperature measurement. USP1999126008685.
  47. Breinlinger, Richard H.. Solid state temperature measuring device and method. USP2004016679628.
  48. Tsukikawa Yasuhiko,JPX ; Ooishi Tsukasa,JPX. Substrate potential generation circuit that can suppress variation of output voltage with respect to change in external power supply voltage and environment temperature. USP1999126005434.
  49. Tuthill Michael G.,IEX. Switched current temperature sensor circuit with compounded .DELTA.V.sub.BE. USP1999115982221.
  50. Wan, Jun; Holloway, Peter R.; Sheehan, Gary E.. Synchronized delta-VBE measurement system. USP2005106957910.
  51. Ooishi Tsukasa,JPX. Temperature dependent circuit, and current generating circuit, inverter and oscillation circuit using the same. USP2001086271710.
  52. Matsuno Yasushi,JPX ; Shinohara Mahito,JPX. Temperature detecting circuit, temperature detecting method and photo-electric conversion apparatus. USP2001076255891.
  53. Namiki Masayuki (Tokyo JPX) Kamiya Masaaki (Tokyo JPX) Kojima Yoshikazu (Tokyo JPX) Tanaka Kojiro (Tokyo JPX). Temperature detecting device. USP1983074395139.
  54. Nagata Junichi,JPX ; Hayakawa Junji,JPX ; Ban Hiroyuki,JPX. Temperature detecting using a forward voltage drop across a diode. USP1999075918982.
  55. Takahashi Mitsuasa,JPX. Temperature detection method and circuit using MOSFET. USP1998085796290.
  56. Malherbe Alexandre (Trets FRX). Temperature detector on an integrated circuit. USP1997115686858.
  57. Descombes Arthur,CHX. Temperature level detection circuit. USP2001056225851.
  58. Tanaka, Nobue. Temperature measuring sensor incorporated in semiconductor substrate, and semiconductor device containing such temperature measuring sensor. USP2005056890097.
  59. Bolton ; Jr. Jerry T. ; Martin Frederick L.. Temperature sensing apparatus. USP1998075781075.
  60. Armstrong Desmond R. (Wallington GB2) Hughes John B. (Hove GB2). Temperature sensing circuit. USP1991085039878.
  61. Gnther Uwe (Nufringen DEX) Nagel Karl (Gomaringen DEX) Kalkhof Bernd (Reutlingen DEX). Temperature sensing semiconductor circuit. USP1987034652144.
  62. Sakurai Yasuhiro,JPX. Temperature sensor and method of adjusting the same. USP1999115993060.
  63. Mizuta, Masaru. Temperature sensor circuit having trimming function. USP2004016674185.
  64. Gold, Spencer M.; House, Kenneth; Gauthier, Claude R.. Two-pin thermal sensor calibration interface. USP2004086774653.
  65. Ten Eyck Timothy A. (Dallas TX). Voltage as a function of temperature stabilization circuit and method of operation. USP1992025087831.
  66. Hinrichs Karl (Westminster CA) Mohtashemi Abdollah (Laguna Niguel CA). Wide-range thermistor meter. USP1995095453682.