초록 ▼

A method for determining characteristics of a material includes illuminating the material with coherent light so as to produce scattered light; autocorrelating the scattered light; preprocessing a signal representative of the scattered light to produce a processed signal; and associating the analyze

A method for determining characteristics of a material includes illuminating the material with coherent light so as to produce scattered light; autocorrelating the scattered light; preprocessing a signal representative of the scattered light to produce a processed signal; and associating the analyzed data with particular characteristics of the material. At least one of a cumulant analysis and a cluster analysis may be performed to provide analyzed data. The determined characteristics may be used for real time control or termination a process used to alter the characteristics of the material. Specifically, monitoring of a process for changes in particle size as a function of time or to determine various physical and/or chemical characteristics of the particles or a mixture containing same, including homogeneity, may be achieved. An apparatus operating generally in accordance with the method is also disclosed.

대표청구항 ▼

What is claimed is: 1. A method for determining characteristics of a material comprising: illuminating the material with coherent light so as to produce scattered light; producing a signal representative of the scattered light; autocorrelating said signal representative of the scattered light; prep

What is claimed is: 1. A method for determining characteristics of a material comprising: illuminating the material with coherent light so as to produce scattered light; producing a signal representative of the scattered light; autocorrelating said signal representative of the scattered light; preprocessing a signal representative of the scattered light to produce a processed signal; comparing the processed signal with standard library reference correlation functions for the material to determine whether the material is in a particular product stage; varying distance between a first light conductor for conducting light to said material and a second light conductor for conducting light from said material so as to vary distance that light travels through the material; evaluating light received from said material at a plurality of distances between said first light conductor and said second light conductor; and analyzing a plurality of spectra produced at a plurality of distances of said first light conductor from said second light conductor to generate a three dimensional surface for said comparing. 2. The method of claim 1, further comprising performing at least one of a cumulant analysis and a cluster analysis of said processed signal to provide analyzed data to associate with said particular characteristics of said material. 3. The method of claim 1, wherein preprocessing comprises one or more baseline estimations. 4. The method of claim 3, wherein said one or more baseline estimations comprises subtracting of a product of a total number of sums and the square of the average number of counts per channel. 5. The method of claim 1, wherein preprocessing comprises normalization of a post-baseline-corrected autocorrelation function. 6. The method of claim 1, further comprising establishing criteria of repeatability. 7. The method of claim 1, wherein the material comprises an optically highly scattering fluid. 8. The method of claim 1, wherein the material comprises an emulsion. 9. The method of claim 1, where the material comprises cream or lotion for pharmaceutical or cosmetic purposes. 10. The method of claim 1, wherein the material comprises one of an ink or paint. 11. The method of claim 1, wherein the material comprises a fluidized composite mixture. 12. A method for monitoring a process for altering a state of a material to determine characteristics of the material, comprising: illuminating the material with coherent light so as to produce scattered light; producing a signal representative of the scattered light; autocorrelating said signal representative of the scattered light; preprocessing a signal representative of the scattered light to produce a processed signal; comparing the processed signal with standard library reference correlation functions for the material to determine whether the material undergoing the process is in a particular product stage of being processed; varying distance between a first light conductor for conducting light to said material and a second light conductor for conducting light from said material so as to vary distance that light travels through the material; evaluating light received from said material at a plurality of distances between said first light conductor and said second light conductor; and analyzing a plurality of spectra produced at a plurality of distances of said first light conductor from said second light conductor to generate a three dimensional surface for said comparing. 13. The method of claim 12, further comprising performing at least one of a cumulant analysis and a cluster analysis of said processed signal to provide analyzed data to associate with said particular characteristics of said material. 14. The method of claim 12, wherein the monitoring is performed in real time as the material is altered. 15. The method of claim 13, further comprising using a determination of the characteristics of the material to accomplish at least one or more of altering or terminating the process. 16. The method of claim 12, wherein preprocessing comprises one or more baseline estimations. 17. The method of claim 16, wherein said one or more baseline estimations comprises subtracting of a product of a total number of sums and the square of the average number of counts per channel. 18. The method of claim 12, wherein preprocessing comprises normalization of a post-baseline-corrected autocorrelation function. 19. The method of claim 12, further comprising establishing criteria of repeatability. 20. An apparatus for determining characteristics of a material comprising: a laser for illuminating the material with coherent light so as to produce scattered light; a detector for producing a signal representative of the scattered light; a processor for autocorrelating said signal representative of the scattered light; a processor for preprocessing a signal representative of the scattered light to produce a processed signal; a processor for comparing the processed signals with standard library reference correlation functions for the material to determine whether the material is in a particular means for moving, at a plurality of different times, one or more of a first light conductor for conducting light to said material and a second light conductor for conducting light from said material to vary distance between the first light conductor and the second light conductor so as to vary distance that light travels through the material; and means for analyzing a plurality of spectra produced at a plurality of distances of said first light conductor from said second light conductor to generate a three dimensional surface for said comparing product stage. 21. The apparatus of claim 20, further comprising an additional processor for performing at least one of a cumulant analysis and a cluster analysis of said processed signal to provide analyzed data to associate with said particular characteristics of said material. 22. The apparatus of claim 20, further comprising means for establishing criteria of repeatability of analyzed data.