IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
UP-0821602
(2007-06-25)
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등록번호 |
US-7808227
(2010-10-26)
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발명자
/ 주소 |
- Markel, Eric J.
- Hagerty, Robert O.
- Muhle, Michael E.
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출원인 / 주소 |
- Univation Technologies, LLC
|
인용정보 |
피인용 횟수 :
0 인용 특허 :
23 |
초록
The present invention is directed to various methods and systems for detecting at least one impurity in a bulk fluid. In certain embodiments, the methods are performed in conjunction with a polymerization reactor system such as a gas-phase reactor system.
대표청구항
▼
What is claimed is: 1. A method for detecting at least one impurity in a polymerization reactor system, comprising: contacting at least one electrical probe with a bulk material that includes gaseous and solid phase materials in a reactor vessel in the polymerization reactor system, wherein the rea
What is claimed is: 1. A method for detecting at least one impurity in a polymerization reactor system, comprising: contacting at least one electrical probe with a bulk material that includes gaseous and solid phase materials in a reactor vessel in the polymerization reactor system, wherein the reactor vessel has an inner diameter of at least two feet at internal points thereof positioned farthest apart and the pressure in the reactor vessel is in the range of from about 100 psig to about 600 psig; monitoring the electrical probe; and determining the presence of an impurity based on the monitoring. 2. The method as recited in claim 1, wherein the electrical probe is also useable for determining a level of static electricity of solids in the bulk material. 3. The method as recited in claim 2, further comprising using the electrical probe for determining a level of static electricity of solids in the bulk material. 4. The method as recited in claim 1, wherein the bulk material consists essentially of nonpolar materials. 5. The method as recited in claim 4, wherein the impurity is a polar material. 6. The method as recited in claim 1, wherein the impurity is a gaseous material. 7. The method as recited in claim 1, further comprising altering a flow rate of at least one feed stream into the polymerization reactor system, and determining whether the altering of the flow rate of the at least one feed stream affects the determination of the presence of the impurity. 8. The method as recited in claim 1, wherein the electrical probe is positioned above a distributor plate of the polymerization reactor system. 9. The method as recited in claim 1, wherein the electrical probe is positioned between a feedstock inlet and a distributor plate of the polymerization reactor system. 10. The method as recited in claim 9, wherein the feedstock consists essentially of a nonpolar material. 11. The method as recited in claim 1, wherein a second electrical probe is positioned in a recycle line of the polymerization reactor system. 12. The method as recited in claim 1, wherein monitoring the electrical probe includes monitoring a voltage or current flow between the electrical probe and a ground. 13. The method as recited in claim 12, wherein no external electrical signal is applied to the electrical probe, the voltage or current flow being generated by the electrical probe contacting the bulk material. 14. The method as recited in claim 12, wherein the ground is the reactor vessel of the polymerization reactor system. 15. The method as recited in claim 1, wherein monitoring the electrical probe includes detecting a voltage differential between the probe and a ground. 16. The method as recited in claim 15, wherein the ground is the reactor vessel of the polymerization reactor system. 17. The method as recited in claim 1, further comprising monitoring a second electrical probe, determining presence of an impurity based on the monitoring of the second electrical probe, and comparing results of the determining the presence of the impurity based on the monitoring of the electrical probe and the second electrical probe. 18. The method as recited in claim 1, wherein determining the presence of the impurity comprises detecting an electrical property of the impurity. 19. The method as recited in claim 1, wherein determining the presence of the impurity comprises detecting an electrical dipole moment of the impurity. 20. The method as recited in claim 1, wherein determining the presence of the impurity comprises detecting a dielectric constant of the impurity. 21. A method for detecting at least one gaseous impurity in a moving bulk material that includes gaseous and solid phase materials in a gas-phase polymerization reactor wherein the pressure in the reactor is in the range of from about 100 psig to about 600 psig, comprising: contacting at least one electrical probe with a moving bulk material consisting essentially of nonpolar materials; monitoring the electrical probe; and determining the presence of at least one polar impurity based on the monitoring. 22. The method as recited in claim 21, wherein the electrical probe is also useable for determining a level of static electricity of solids in the bulk material. 23. The method as recited in claim 22, further comprising using the electrical probe for determining a level of static electricity of solids in the bulk material. 24. The method as recited in claim 21, wherein monitoring the electrical probe includes monitoring a voltage or current flow between the electrical probe and a ground. 25. The method as recited in claim 24, wherein no external electrical signal is applied to the electrical probe, the voltage or current flow being generated by the electrical probe contacting the bulk material. 26. The method as recited in claim 21, wherein monitoring the electrical probe includes detecting a voltage differential between the probe and a ground. 27. A method for determining a source of at least one impurity in a moving bulk material that includes gaseous and solid phase materials in a gas phase polymerization reactor, wherein the pressure in the reactor is in the range of from about 100 psig to about 600 psig, comprising: contacting at least one electrical probe with a moving bulk material; monitoring the electrical probe; determining whether at least one impurity is present based on the monitoring; altering a flow rate of at least one feed stream; and determining whether the altering of the flow rate of the at least one feed stream affects the determination of whether an impurity is present. 28. The method as recited in claim 27, wherein the altering the flow rate of the at least one feed stream includes reducing the flow rate. 29. The method as recited in claim 27, wherein the altering the flow rate of the at least one feed stream includes stopping the flow rate. 30. The method as recited in claim 27, wherein flow rates of multiple feed streams are altered sequentially. 31. The method as recited in claim 27, wherein flow rates of all feed streams are altered sequentially. 32. The method as recited in claim 27, wherein flow rates of multiple feed streams are altered concurrently. 33. A method for determining a source of at least one impurity in a moving bulk material that includes gaseous and solid phase materials in a gas phase polymerization reactor, wherein the pressure in the reactor is in the range of from about 100 psig to about 600 psig, comprising: contacting at least one electrical probe with a moving bulk material; monitoring the electrical probe; determining whether at least one impurity is present based on the monitoring; altering a source of at least one feed stream; and determining whether the altering the source of the at least one feed stream affects the determination of whether an impurity is present. 34. The method as recited in claim 33, wherein sources of multiple feed streams are altered sequentially. 35. The method as recited in claim 33, wherein sources of all feed streams are altered sequentially. 36. The method as recited in claim 33, wherein sources of multiple feed streams are altered concurrently. 37. A gas-phase polymerization reactor system, comprising: at least one reactor vessel having an inner diameter of at least two feet between internal points thereof positioned farthest apart and is capable of being operated at pressures in the range of from about 100 psig to about 600 psig; and at least one electrical probe in contact with a bulk material that includes gaseous and solid phase materials inside the reactor system; and a processing unit that is in electrical communication with the at least one electrical probe in contact with the bulk material, which monitors the at least one electrical probe to determine the presence of at least one impurity in the bulk material. 38. The reactor system as recited in claim 37, wherein the electrical probe is also useable for determining a level of static electricity of solids in the bulk material. 39. The reactor system as recited in claim 37, wherein the bulk material consists essentially of nonpolar materials. 40. The reactor system as recited in claim 39, wherein the impurity is a polar material. 41. The reactor system as recited in claim 37, wherein the impurity is a gaseous material. 42. The reactor system as recited in claim 37, further comprising at least one feed stream for injecting feedstock into the reactor system, wherein a flow rate of the at least one feed stream into the reactor system is altered for determining whether the altering of the flow rate of the at least one feed stream affects the determination of the presence of the impurity. 43. The reactor system as recited in claim 37, wherein the electrical probe is positioned in the reactor vessel of the reactor system. 44. The reactor system as recited in claim 43, further comprising a distributor plate in the reactor vessel, wherein the electrical probe is positioned above the distributor plate of the reactor system. 45. The reactor system as recited in claim 44, wherein the electrical probe is positioned above a hole in the distributor plate of the reactor vessel. 46. The reactor system as recited in claim 43, further comprising a distributor plate in the reactor vessel, wherein the electrical probe is positioned between a feedstock inlet and the distributor plate of the reactor system. 47. The reactor system as recited in claim 46, wherein the feedstock consists essentially of a nonpolar material. 48. The reactor system as recited in claim 46, further comprising a recycle line, wherein the feedstock inlet is located in the recycle line. 49. The reactor system as recited in claim 37, further comprising a distributor plate in the reactor vessel, wherein the electrical probe is positioned between a feedstock inlet and a distributor plate of the reactor system. 50. The reactor system as recited in claim 49, wherein the feedstock consists essentially of a nonpolar material. 51. The reactor system as recited in claim 49, further comprising a recycle line, wherein the feedstock inlet is located in the recycle line. 52. The reactor system as recited in claim 37, wherein the electrical probe is positioned in a recycle line of the reactor system. 53. The reactor system as recited in claim 37, wherein monitoring the electrical probe includes monitoring a voltage or current flow between the electrical probe and a ground. 54. The reactor system as recited in claim 53, wherein no external electrical signal is applied to the electrical probe, the voltage or current flow being generated by the electrical probe contacting the bulk material. 55. The reactor system as recited in claim 54, wherein the ground is the reactor vessel of the reactor system. 56. The reactor system as recited in claim 37, wherein monitoring the electrical probe includes detecting a voltage differential between the probe and a ground. 57. The reactor system as recited in claim 56, wherein the ground is the reactor vessel of the reactor system.
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