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An organic electronic device. The device includes a first electrode to inject or extract hole, the first electrode including a conductive layer and an n-type organic compound layer disposed on the conductive layer, a second electrode to inject or extract electron, a p-type organic compound layer dis

An organic electronic device. The device includes a first electrode to inject or extract hole, the first electrode including a conductive layer and an n-type organic compound layer disposed on the conductive layer, a second electrode to inject or extract electron, a p-type organic compound layer disposed between the n-type organic compound layer and the second electrode. The p-type organic compound layer forms an NP junction between the n-type organic compound layer and the p-type organic compound layer. The energy difference between a lowest unoccupied molecular orbital (LUMO) energy of the n-type organic compound layer and a Fermi energy of the conductive layer is about 2 eV or less, and the energy difference between the LUMO energy of the n-type organic compound layer and a highest unoccupied molecular orbital (HOMO) energy of the p-type organic compound layer is about 1 eV or less.

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What is claimed is: 1. An organic transistor comprising: a source electrode; a drain electrode; a gate; an insulating layer disposed on the gate; a p-type organic compound layer disposed on the insulating layer; and an n-type organic compound layer disposed between the source electrode or the drain

What is claimed is: 1. An organic transistor comprising: a source electrode; a drain electrode; a gate; an insulating layer disposed on the gate; a p-type organic compound layer disposed on the insulating layer; and an n-type organic compound layer disposed between the source electrode or the drain electrode and the p-type organic compound layer, an NP junction being formed between the n-type organic compound layer and the p-type organic compound layer, wherein an energy difference between a LUMO energy of the n-type organic compound layer and a Fermi energy of the source electrode or the drain electrode is about 2 eV or less and the LUMO energy of the n-type organic compound layer is greater than the Fermi energy of the source electrode or the drain electrode; and wherein an energy difference between the LUMO energy of the n-type organic compound layer and HOMO energy of the p-type organic compound layer is about 1 eV or less, wherein the n-type organic compound layer comprises fluoro-substituted 3,4,9,10-perylenetetracarboxylic dianhydride (PTCDA), cyano-substituted PTCDA, naphthalene-tetracaboxylic-dianhydride (NTCDA), fluoro-substituted NTCDA, cyano-substituted NTCDA, or hexanitrile hexaazatriphenylene (HAT).