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Top layers of metal for high performance IC's 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-027/10
출원번호 US-0203154 (2008-09-03)
등록번호 US7863654 (2010-12-20)
발명자 / 주소
  • Lin, Mou-Shiung
출원인 / 주소
  • Megica Corporation
대리인 / 주소
    McDermott Will & Emery LLP
인용정보 피인용 횟수 : 8  인용 특허 : 502

초록

A method of closely interconnecting integrated circuits contained within a semiconductor wafer to electrical circuits surrounding the semiconductor wafer. Electrical interconnects are held to a minimum in length by making efficient use of polyimide or polymer as an inter-metal dielectric thus enabli

대표청구항

What is claimed is: 1. An integrated circuit chip comprising:a silicon substrate;a transistor in and on said silicon substrate;a first dielectric layer over said silicon substrate;a first metallization structure over said first dielectric layer, wherein said first metallization structure comprises a

이 특허에 인용된 특허 (502)

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  184. Tsai Lih-Shyng (Hsin-Chu TWX) Lin Jiunn-Jyi (Hsin-Chu TWX) Lin Kwang-Ming (Hsin-Chu TWX) Ying Shu-Lan (Pan-Chiau TWX), Method for field inversion free multiple layer metallurgy VLSI processing.
  185. Wakabayashi Takeshi (Hidaka JPX) Suzuki Akira (Musashino JPX) Yokoyama Shigeru (Chofu JPX), Method for forming a bump electrode for a semiconductor device.
  186. Boyd Melissa D. (Corvallis OR), Method for forming a conductive pattern on an integrated circuit.
  187. Braeckelmann Gregor ; Venkatraman Ramnath ; Herrick Matthew Thomas ; Simpson Cindy R. ; Fiordalice Robert W. ; Denning Dean J. ; Jain Ajay ; Capasso Cristiano, Method for forming a semiconductor device.
  188. Mehta Sunil D. ; Li Xiao-Yu, Method for forming a semiconductor device having high reliability passivation overlying a multi-level interconnect.
  189. Lee Jia-Sheng,TWX, Method for forming a thin-film resistor.
  190. Elenius Peter ; Hollack Harry, Method for forming chip scale package.
  191. Singh Abha R. ; Balasinski Artur P. ; Li Ming M., Method for forming controlled voids in interlevel dielectric.
  192. Farrar Paul A. (South Burlington VT) Geffken Robert M. (Burlington VT) Kroll Charles T. (Raleigh NC), Method for forming dense multilevel interconnection metallurgy for semiconductor devices.
  193. Lin Mou-Shiung,TWX, Method for forming high performance system-on-chip using post passivation process.
  194. Yoo Chue-San,TWX ; Lee Jin-Yuan,TWX, Method for forming vias in multi-level integrated circuits, for use with multi-level metallizations.
  195. Leu, Jihperng; Wu, Chih-I; Zhou, Ying; Kloster, Grant M., Method for improving nucleation and adhesion of CVD and ALD films deposited onto low-dielectric-constant dielectrics.
  196. Cole ; Jr. Herbert S. (Burnt Hills NY) Sitnik-Nieters Theresa A. (Rexford NY), Method for making an electronics module having air bridge protection without large area ablation.
  197. Farrar Paul A. ; Forbes Leonard, Method for making high-Q inductive elements.
  198. Frye Robert C. (Piscataway NJ) Tai King L. (Berkeley Heights NJ), Method for making multichip circuits using active semiconductor substrates.
  199. DeHaven Robert Keith (Austin TX) Wenzel James F. (Austin TX), Method for manufacturing a stimulus wafer for use in a wafer-to-wafer testing system to test integrated circuits located.
  200. Gansauge Peter (Boeblingen DEX) Kreuter Volker (Schoenaich DEX) Schettler Helmut (Dettenhausen DEX), Method for manufacturing an integrated circuit chip bump electrode using a polymer layer and a photoresist layer.
  201. Matsuki Hirohisa,JPX ; Kado Kenichi,JPX ; Watanabe Eiji,JPX ; Imamura Kazuyuki,JPX ; Yurino Takahiro,JPX, Method for manufacturing semiconductor device with pad structure.
  202. Matumoto Akira,JPX, Method for manufacturing semiconductor devices having dual damascene structure.
  203. Cadet, Bernard, Method for marking integrated circuits with a laser.
  204. Hendel Rudi (26 Ridge Rd. Summit NJ 07901) Levinstein Hyman (132 Robbins Ave. Berkeley Heights NJ 07974), Method for planarization of submicron vias and the manufacture of semiconductor integrated circuits.
  205. Carlos J. Sambucetti ; Daniel C. Edelstein ; John G. Gaudiello ; Judith M. Rubino ; George Walker, Method for preparing a conductive pad for electrical connection and conductive pad formed.
  206. Wu Kun-Lin,TWX ; Lu Horng-Bor,TWX, Method for preventing poisoned vias and trenches.
  207. Koblinger Otto (Korntal-Munchingen DEX) Trumpp Hans-Joachim (Filderstadt DEX), Method for producing an integrated circuit structure with a dense multilayer metallization pattern.
  208. Agarwala Birendra N. ; Dalal Hormazdyar M. ; Nguyen Du B. ; Rathore Hazara S., Method for providing electrically fusible links in copper interconnection.
  209. Zhu Min,SGX ; Shao Kai,SGX ; Chu Shao-Fu Sanford,SGX, Method for reducing substrate capacitive coupling of a thin film inductor by reverse P/N junctions.
  210. Leung Pak K.,CAX ; Emesh Ismail T.,CAX, Method of adding on chip capacitors to an integrated circuit.
  211. Gaul Stephen Joseph (Melbourne FL), Method of bonding wafers having vias including conductive material.
  212. Chang Mark S. (Los Altos CA) Cheung Robin W. (Cupertino CA), Method of decreased interlayer dielectric constant in a multilayer interconnect structure to increase device speed perfo.
  213. Robl, Werner; Goebel, Thomas; Brintzinger, Axel Christoph; Friese, Gerald, Method of eliminating back-end rerouting in ball grid array packaging.
  214. Ilderem Vida (Puyallup WA) Iranmanesh Ali A. (Federal Way WA) Solheim Alan G. (Puyallup WA) Blair Christopher S. (Puyallup WA) Jerome Rick C. (Puyallup WA) Lahri Rajeeva (Puyallup WA) Biswal Madan (P, Method of fabricating BiCMOS device.
  215. Tehrani Saied N. ; Chen Eugene ; Durlam Mark ; Zhu Xiaodong T. ; Tracy Clarence J., Method of fabricating GMR devices.
  216. Gardner Donald S., Method of fabricating a barrier against metal diffusion.
  217. F. Scott Johnson, Method of fabricating a miniaturized integrated circuit inductor and transformer fabrication.
  218. Yamaguchi, Yoshihide; Tenmei, Hiroyuki; Hozoji, Hiroshi; Kanda, Naoya, Method of fabricating a wafer level chip size package utilizing a maskless exposure.
  219. Benjamin N. Eldridge ; Gary W. Grube ; Igor Y. Khandros ; Gaetan L. Mathieu, Method of fabricating an interconnection element.
  220. Sakamoto, Tatsuya, Method of fabricating semiconductor device.
  221. Geffken Robert M. ; Luce Stephen E., Method of forming a self-aligned copper diffusion barrier in vias.
  222. Wetzel Jeffrey T. ; Stankus John J., Method of forming a semiconductor device having dual inlaid structure.
  223. Alford Ronald C. ; Stengel Robert E. ; Weisman Douglas H. ; Marlin George W., Method of forming a three-dimensional integrated inductor.
  224. Hanazono Masanobu (Hitachi JA) Asai Osamu (Hitachi JA) Tamura Katsumi (Hitachi JA), Method of forming deposition films for use in multi-layer metallization.
  225. Wang Fei ; Cheng Jerry, Method of forming dual damascene arrangement for metal interconnection with low k dielectric constant materials and oxide middle etch stop layer.
  226. Efland Taylor R. ; Mai Quang X. ; Williams Charles E. ; Keller Stephen A., Method of forming improved thick plated copper interconnect and associated auxiliary metal interconnect.
  227. Mario Napolitano IT, Method of forming interconnectings in semiconductor devices.
  228. Lee Jin-Yuan,TWX ; Wang Chen-Jong,TWX, Method of forming metal interconnect structures and metal via structures using photolithographic and electroplating or electro-less plating procedures.
  229. Feldner Klaus,DEX ; Grewal Virinder,DEX ; Vollmer Bernd ; Schnabel Rainer Florian, Method of forming multi-level coplanar metal/insulator films using dual damascene with sacrificial flowable oxide.
  230. Buynoski Matthew S. ; Lin Ming-Ren, Method of forming multiple levels of patterned metallization.
  231. Barr, Alexander L.; Venkatesan, Suresh; Clegg, David B.; Cole, Rebecca G.; Adetutu, Olubunmi; Greer, Stuart E.; Anthony, Brian G.; Venkatraman, Ramnath; Braeckelmann, Gregor; Reber, Douglas M.; Crown, Method of forming semiconductor device including interconnect barrier layers.
  232. Akram, Salman, Method of improving copper interconnects of semiconductor devices for bonding.
  233. Bahrle Dieter (Schoenaich DEX) Frasch Peter (Boeblingen DEX) Konig Wilfried (Gaertringen DEX) Schwerdt Friedrich (Sindelfingen DEX) Thelen Ursula (Sindelfingen DEX) Vogtmann Theodor (Holzgerlingen DE, Method of improving the adherence of metallic conductive lines on polyimide layers.
  234. Kanehachi Kaoru (Tokyo JPX), Method of making a combined semiconductor device and inductor.
  235. Zhao Bin ; Vasudev Prahalad K. ; Horwath Ronald S. ; Seidel Thomas E. ; Zeitzoff Peter M., Method of making a dual damascene interconnect structure using low dielectric constant material for an inter-level dielectric layer.
  236. Naoteru Matsubara JP; Hideki Mizuhara JP, Method of making a dual damascene structure with modified insulation.
  237. Chang Kenneth (Hopewell Junction NY) Czornyj George (Poughkeepsie NY) Farooq Mukta S. (Hopewell Junction NY) Kumar Ananda H. (Hopewell Junction NY) Pitler Marvin S. (late of Poughkeepsie NY by Peter , Method of making a multilayer thin film structure.
  238. Pomante, Louis N., Method of making a semiconductor device with a seal.
  239. Dow Stephen (Chandler AZ) Maass Eric C. (Scottsdale AZ) Marlin Bill (Phoenix AZ), Method of making an electronic device having an integrated inductor.
  240. Bandyopadhyay Basab ; Fulford ; Jr. H. Jim ; Dawson Robert ; Hause Fred N. ; Michael Mark W. ; Brennan William S., Method of making an integrated circuit which uses an etch stop for producing staggered interconnect lines.
  241. Givens John H., Method of making an interconnect structure.
  242. Reisman Arnold (Raleigh NC) Turlik Iwona (Raleigh NC), Method of making high density semiconductor structure.
  243. Anatoly Feygenson ; Dean P. Kossives ; Ashraf W. Lotfi ; Lynn F. Schneemeyer ; Michael L. Steigerwald ; R. Bruce Van Dover, Method of making integrated circuit having a micromagnetic device.
  244. Chu Shau-Fu Sanford,SGX ; Chew Kok Wai Johnny,SGX ; Chua Chee Tee,SGX ; Cha Cher Liang,SGX, Method of making spiral-type RF inductors having a high quality factor (Q).
  245. Chikawa Yasunori (Nara JPX) Sasaki Shigeyuki (Nara JPX) Mori Katsunobu (Nara JPX) Maeda Takamichi (Nara JPX) Hayakawa Masao (Kyoto JPX), Method of manufacturing a bump electrode.
  246. Tokushige, Ryoji; Takai, Nobuyuki; Shinogi, Hiroyuki; Ono, Seiichi, Method of manufacturing a semiconductor device.
  247. Yamada Yoshiaki,JPX, Method of manufacturing a semiconductor device using a silicon fluoride oxide film.
  248. Peters Johannes S. (Nijmegen NLX), Method of manufacturing a semiconductor device, in which a metallization with a thick connection electrode is provided o.
  249. Brandli Gerold (Aarau CHX) Bachmann Guido (Sempach CHX), Method of manufacturing multi-layer thin film circuits containing integrated thin film resistors.
  250. Tsuboi Atsushi,JPX, Method of manufacturing semiconductor device having multilevel interconnection.
  251. Naik Mehul ; Broydo Samuel, Method of producing an interconnect structure for an integrated circuit.
  252. Ito Daisuke,JPX ; Kitahara Yuichi,JPX, Method of producing semiconductor device comprising insulation layer having improved resistance and semiconductor device produced thereby.
  253. Ho Paul Kwok Keung,SGX ; Zhou Mei Sheng,SGX ; Gupta Subhash,SGX, Method to create a controllable and reproducible dual copper damascene structure.
  254. Shih, Tsu, Method to eliminate via poison effect.
  255. Tsai Chao-Chieh,TWX, Method to fabricate high Q inductor by redistribution layer when flip-chip package is employed.
  256. Smoak, Richard C., Method to improve the reliability of thermosonic gold to aluminum wire bonds.
  257. Chan Lap ; Chew Johnny Kok Wai,SGX ; Cha Cher Liang,SGX ; Chua Chee Tee,SGX, Method to trap air at the silicon substrate for improving the quality factor of RF inductors in CMOS technology.
  258. Costrini Gregory ; Goldblatt Ronald Dean ; Heidenreich ; III John Edward ; McDevitt Thomas Leddy, Method/structure for creating aluminum wirebound pad on copper BEOL.
  259. Kie Y. Ahn ; Leonard Forbes, Methods and apparatus for making integrated-circuit wiring from copper, silver, gold, and other metals.
  260. Osann ; Jr. Robert ; Eltoukhy Shafy, Methods and apparatuses for binning partially completed integrated circuits based upon test results.
  261. Xia Li-Qun ; Yieh Ellie ; Nemani Srinivas, Methods for depositing premetal dielectric layer at sub-atmospheric and high temperature conditions.
  262. Lien Chuen-Der, Methods for fabricating a bonding pad having improved adhesion to an underlying structure.
  263. Desaigoudar Chan M. (Los Gatos CA) Gupta Suren (San Jose CA), Methods for fabrication of thin film inductors, inductor networks and integration with other passive and active devices.
  264. Wu Zhiqiang ; Jiang Tongbi ; Akram Salman, Methods for forming conductive micro-bumps and recessed contacts for flip-chip technology and method of flip-chip assembly.
  265. Zhao Bin, Methods for forming high-performing dual-damascene interconnect structures.
  266. Zhao Ji ; Teng Chih Sieh, Methods for making VLSI capacitors and high Q VLSI inductors using metal-filled via plugs.
  267. Ahn,Kie Y.; Forbes,Leonard, Methods for making copper and other metal interconnections in integrated circuits.
  268. Valery Dubin, Methods for making interconnects and diffusion barriers in integrated circuits.
  269. Marcinkiewicz Walter M., Methods for packaging integrated circuit devices including cavities adjacent active regions.
  270. Cronin John Edward (Milton VT) Howell Wayne John (Williston VT) Kalter Howard Leo (Colchester VT) Marmillion Patricia Ellen (Colchester VT) Palagonia Anthony (Underhill VT) Pierson Bernadette Ann (So, Methods for precise definition of integrated circuit chip edges.
  271. Lin, Mou-Shiung; Ting, Tah-Kang Joseph, Methods of IC rerouting option for multiple package system applications.
  272. Averkiou George ; Trask Philip A., Methods of fabricating an HDMI decal chip scale package.
  273. Mu Xiao-Chun (Saratoga CA) Sivaram Srinivasan (San Jose CA) Gardner Donald S. (Mountain View CA) Fraser David B. (Danville CA), Methods of forming an interconnect on a semiconductor substrate.
  274. Donado Rafael A. (Chicago IL) Ong Estela T. (Chicago IL), Methods of making anodes for high temperature fuel cells.
  275. Kim, Sarah E.; Lee, Kevin J.; George, Anna M., Methods of processing thick ILD layers using spray coating or lamination for C4 wafer level thick metal integrated flow.
  276. Jean-Michel Karam FR; Laurent Basteres FR; Ahmed Mhani FR; Catherine Charrier FR; Eric Bouchon FR; Guy Imbert FR; Patrick Martin FR; Fran.cedilla.ois Valentin FR, Microcomponents of the microinductor or microtransformer type and process for fabricating such microcomponents.
  277. Stratton, Thomas G.; Gardner, Gary R.; Rahn, Curtis H., Microelectromechanical device with integrated conductive shield.
  278. Licari James J. (Whittier CA) Smith Deborah J. (Fountain Valley CA), Microelectronic circuit substrate structure including photoimageable epoxy dielectric layers.
  279. Naoko Ono JP; Yuji Iseki JP; Keiichi Yamaguchi JP; Junko Onomura JP; Eiji Takagi JP, Microwave semiconductor device having coplanar waveguide and micro-strip line.
  280. Nguyen Chanh N. ; Nguyen Nguyen Xuan ; Le Minh V., Modulation-doped field-effect transistors and fabrication processes.
  281. Jacobs Scott L. (Peekskill NY) Nihal Perwaiz (Hopewell Junction NY) Ozmat Burhan (Peekskill NY) Schnurmann Henri D. (Monsey NY) Zingher Arthur R. (White Plains NY), Module for packaging semiconductor integrated circuit chips on a base substrate.
  282. Costa Julio C. (Phoenix AZ) Burger Wayne R. (Phoenix AZ) Camilleri Natalino (Tempe AZ) Dragon Christopher P. (Tempe AZ) Lamey Daniel J. (Phoenix AZ) Lovelace David K. (Chandler AZ) Ngo David Q. (Phoe, Monolithic high frequency integrated circuit structure having a grounded source configuration.
  283. Laurent Basteres FR; Ahmed Mhani FR; Fran.cedilla.ois Valentin FR; Jean-Michel Karam FR, Monolithic integrated circuit incorporating an inductive component and process for fabricating such an integrated circuit.
  284. Abidi Asad A. (Los Angeles CA) Chang James Y.-C. (Los Angeles CA), Monolithic passive component.
  285. Jin Sang-Hun,KRX, Mounting coordinate input method and apparatus for surface mount device.
  286. Bissey Lucien J., Multi-capacitance lead frame decoupling device.
  287. Massingill, Thomas J.; McCormack, Mark Thomas; Wang, Wen-Chou Vincent, Multi-chip module and method for forming and method for deplating defective capacitors.
  288. Oda, Noriaki, Multi-layer interconnection structure in semiconductor device and method for fabricating same.
  289. Yano Kousaku,JPX ; Ueda Tetsuya,JPX, Multi-layer wiring structure having varying-sized cutouts.
  290. Ping Liou TW, Multi-level spiral inductor structure having high inductance (L) and high quality factor (Q).
  291. Shue Shau-Lin,TWX ; Tsai Ming-Hsing,TWX ; Tsai Wen-Jye,TWX ; Yu Chen-Hua,TWX, Multi-step electrochemical copper deposition process with improved filling capability.
  292. Liu Yowjuang William, Multilayer floating gate field effect transistor structure for use in integrated circuit devices.
  293. Mototsugu Okushima JP, Multilayer wiring structure and semiconductor device having the same, and manufacturing method therefor.
  294. Choudhury Ratan K. ; Kapoor Ashok K. ; Menon Satish, Multilevel metallization structure for integrated circuit I/O lines for increased current capacity and ESD protection.
  295. Cole ; Jr. Herbert S. (Scotia NY) Rose James W. (Delmar NY) Eichelberger Charles W. (Schenectady NY) Wojnarowski Robert J. (Ballston Lake NY), Mutliple lamination high density interconnect process and structure employing thermoplastic adhesives having sequentiall.
  296. Worley Eugene Robert ; Mann Richard Arthur, Optional on chip power supply bypass capacitor.
  297. Hsuan Min-Chih,TWX ; Liou Fu-Tai,TWX, Package-free bonding pad structure.
  298. Degani Yinon (Highland Park NJ) Dudderar Thomas D. (Chatham NJ) Han Byung J. (Scotch Plains NJ) Lyons Alan M. (New Providence NJ) Tai King L. (Berkeley Heights NJ), Packaging multi-chip modules without wire-bond interconnection.
  299. Cronin John E. (Milton) Farrar ; Sr. Paul A. (South Burlington) Linde Harold G. (Richmond) Previti-Kelly Rosemary A. (Richmond VT), Passivation of metal in metal/polyimide structure.
  300. Bohr, Mark T., Passivation structure for an integrated circuit.
  301. Geffken Robert Michael ; Motsiff William Thomas ; Uttecht Ronald R., Personalization structure for semiconductor devices.
  302. Smith Donald L. ; Thornton Robert L. ; Chua Christopher L. ; Fork David K., Photolithographically patterned spring contact and apparatus and methods for electrically contacting devices.
  303. Tung, Francisca, Pillar connections for semiconductor chips and method of manufacture.
  304. Seshan Krishna ; Mielke Neal R., Planar guard ring.
  305. Wu Andrew L. (Shrewsbury MA), Planar interconnect for integrated circuits.
  306. Lou Chine-Gie,TWX, Planarization method for intermetal dielectrics between multilevel interconnections on integrated circuits.
  307. Chia-Shiun Tsai TW; Chao-Cheng Chen TW; Hun-Jan Tao TW, Plasma etch method for forming patterned oxygen containing plasma etchable layer.
  308. Ting Chiu ; Dubin Valery, Plated copper interconnect structure.
  309. Jao Kuo-Hao,TWX ; Chen Yung-Shun,TWX, Poly-load resistor for SRAM cell.
  310. Bertin Claude L. (South Burlington VT) Farrar ; Sr. Paul A. (South Burlington VT) Howell Wayne J. (South Burlington VT) Miller Christopher P. (Underhill VT) Perlman David J. (Wappingers Falls NY), Polyimide-insulated cube package of stacked semiconductor device chips.
  311. Mastrangelo Carlos H. ; Man Piu F. ; Webster James R., Polymer-based micromachining for microfluidic devices.
  312. Lee Virgil J. (La Verne CA), Polyquinazolines and methods for their preparation.
  313. Tseng Horng-Huei (Hsin Chu TWX), Polysilicon contact stud process.
  314. Mou-Shiung Lin TW; Jin-Yuan Lee TW, Post passivation interconnection schemes on top of the IC chips.
  315. Lin, Mou-Shiung; Lei, Ming-Ta; Lee, Jin-Yuan; Huang, Ching-Cheng, Post passivation metal scheme for high-performance integrated circuit devices.
  316. Chen Chao-Cheng,TWX, Post via etch plasma treatment method for forming with attenuated lateral etching a residue free via through a silsesqu.
  317. Fukuyama Shun-ichi (Atsugi JPX) Yoneda Yasuhiro (Machida JPX) Miyagawa Masashi (Isehara JPX) Nishii Kota (Isehara JPX) Matsuura Azuma (Atsugi JPX), Preparation of lower alkyl polysilsesquioxane and formation of insulating layer of silylated polymer on electronic circu.
  318. E. Henry Stevens, Process and manufacturing tool architecture for use in the manufacturing of one or more protected metallization structures on a workpiece.
  319. Rao Raman K. (Palo Alto CA), Process enhancement using molybdenum plugs in fabricating integrated circuits.
  320. Lin Yung-Fa,TWX, Process for creating vias using pillar technology.
  321. Nanda Madan M. (Reston VA) Peterman Steven L. (Manassas VA) Stanasolovich David (Manassas VA), Process for defining vias through silicon nitride and polyimide.
  322. Vivian W. Ryan, Process for fabricating copper interconnect for ULSI integrated circuits.
  323. Misawa Nobuhiro (Kawasaki JPX), Process for fabricating integrated circuit devices.
  324. Cronin John E. (Milton VT) Lee Pei-ing P. (Williston VT), Process for fabricating multi-level integrated circuit wiring structure from a single metal deposit.
  325. Hall Mark D. ; Ferguson Gregory Steven ; Mitchell Joel Patrick ; Suryanata Johanes P. D., Process for forming a semiconductor device.
  326. Jain Ajay, Process for forming a semiconductor device.
  327. Waldo Whit G., Process for forming a semiconductor device.
  328. Sun Shih-Wei (Austin TX) Kosa Yasunobu (Austin TX) Yeargain John R. (Austin TX), Process for forming a structure which electrically shields conductors.
  329. Flynn Todd M. ; Argento Christopher W. ; Larsen Larry J., Process for forming an electrical device.
  330. Cronin John E. (Milton VT) Kaanta Carter W. (Colchester VT) Previti-Kelly Rosemary A. (Richmond VT) Ryan James G. (Essex Junction VT), Process for forming multi-level coplanar conductor/insulator films employing photosensitive polyimide polymer compositio.
  331. Akagawa Masatoshi,JPX ; Higashi Mitsutoshi,JPX ; Iizuka Hajime,JPX ; Arai Takehiko,JPX, Process for making a chip sized semiconductor device.
  332. Chunlin Liang ; Larry E. Mosley ; Xiao Chun Mu, Process for making active interposer for high performance packaging applications.
  333. Bothra Subhas ; Haskell Jacob, Process for making self-aligned conductive via structures.
  334. Seppala Bryan R. (Apple Valley MN) Backer Todd G. (Apple Valley MN) Maier Lothar (Eden Prairie MN), Process for manufacturing a semiconductor device bump electrode using a rapid thermal anneal.
  335. Ikeda Osamu,JPX ; Nakamura Yoshio,JPX, Process for producing electrode for semiconductor element and semiconductor device having the electrode.
  336. Dureseti Chidambarrao ; Ronald G. Filippi ; Robert Rosenberg ; Thomas M. Shaw ; Timothy D. Sullivan ; Richard A. Wachnik, Process for producing metal interconnections and product produced thereby.
  337. Kelly Kimberley A. ; Malhotra Ashwani K. ; Perfecto Eric D. ; Yu Roy, Process for releasing a thin-film structure from a substrate.
  338. Sanders Josef (Cologne DEX) Dieterich Dieter (Leverkusen DEX), Process for the preparation of N,N-disubstituted mono- and oligourethanes.
  339. Scheifele Fredy,CHX, Process for the production of a multi-chamber packaging tube.
  340. Sachdev Krishna G. (Hopewell Junction NY) Kellner Benedikt M. J. (Wappingers Falls NY) McGuire Kathleen M. (Wallkill NY) Sorce Peter J. (Poughkeepsie NY), Process for thin film interconnect.
  341. Quinn ; Daniel J. (Carrollton TX) Mulholland Wayne A. (Plano TX) Bond Robert H. (Carrollton TX) Olla Michael A. (Flower Mound TX) Cupples Jerry S. (Carrollton TX) Tsitovsky Ilya L. (Farmers Branch TX, Process of forming integrated circuits with contact pads in a standard array.
  342. Chang Sung Chul ; Khandros Igor Y. ; Smith William D., Process of mounting spring contacts to semiconductor devices.
  343. Stephen L. Skala ; Subhas Bothra, Programmable integrated circuit structures and methods for making the same.
  344. Dangelo Carlos (Los Gatos CA), Programmable microsystems in silicon.
  345. Subhas Bothra, Programmable semiconductor device structures and methods for making the same.
  346. Leibovitz Jacques ; Yu Park-Kee ; Zhu Ya Yun ; Cobarruviaz Maria L. ; Swindlehurst Susan J. ; Chang Cheng-Cheng ; Scholz Kenneth D., Redistribution layer and under bump material structure for converting periphery conductive pads to an array of solder bumps.
  347. Anand Yoginder ; Chinoy Percy Bomi, Reduced parasitic capacitance semiconductor devices.
  348. Moore Paul McKayCTY Burlingame, Reflectance enhancing thin film stack in which pairs of dielectric layers are on a reflector and liquid crystal is on the dielectric layers.
  349. Galloway Terry R., Removal of extended bond pads using intermetallics.
  350. Subhash Gupta SG; Mei-Sheng Zhou SG; Simon Chooi SG; Sangki Hong SG, Reversed damascene process for multiple level metal interconnects.
  351. Cole ; Jr. Herbert S. (Burnt Hills NY) Sitnik-Nieters Theresa A. (Scotia NY) Wojnarowski Robert J. (Ballston Lake NY) Lupinski John H. (Vienna VA), Reworkable high density interconnect structure incorporating a release layer.
  352. Ikeda Shuji,JPX ; Meguro Satoshi,JPX ; Hashiba Soichiro,JPX ; Kuramoto Isamu,JPX ; Koike Atsuyoshi,JPX ; Sasaki Katsuro,JPX ; Ishibashi Koichiro,JPX ; Yamanaka Toshiaki,JPX ; Hashimoto Naotaka,JPX ; , SRAM having load transistor formed above driver transistor.
  353. Liu Meng-Chang,TWX, Self-aligned connection to underlayer metal lines through unlanded via holes.
  354. Takagi Mariko,JPX, Semiconductor apparatus and manufacturing method therefor.
  355. Kumamoto, Nobuhisa; Samejima, Katsumi, Semiconductor chip and production process therefor.
  356. Yamaha Takahisa,JPX ; Inoue Yushi,JPX ; Naito Masaru,JPX, Semiconductor chip capable of supressing cracks in insulating layer.
  357. Heo Young Wook,KRX, Semiconductor chip scale package and method of producing such.
  358. Lauvray Olivier J. ; Rodriguez David, Semiconductor component comprising an electrostatic-discharge protection device.
  359. Hiatt, William M.; Farnworth, Warren M.; Watkins, Charles M.; Sinha, Nishant, Semiconductor component having encapsulated, bonded, interconnect contacts.
  360. Abercrombie David A. ; Brownson Rickey S. ; Cherniawski Michael R., Semiconductor component with multi-level interconnect system and method of manufacture.
  361. Hajime Iizuka JP, Semiconductor device.
  362. Koyama,Jun; Ohtani,Hisashi; Ogata,Yasushi; Yamazaki,Shunpei, Semiconductor device.
  363. Tanaka, Kazuo, Semiconductor device and a method for making the same that provide arrangement of a connecting region for an external connecting terminal.
  364. Nishiyama Akira,JPX, Semiconductor device and a method of manufacturing the same.
  365. Shigeru Harada JP; Takeru Matsuoka JP; Hiroki Takewaka JP, Semiconductor device and fabrication process therefor.
  366. Ito Kazunori,JPX ; Irinoda Mitsugu,JPX ; Ueno Kaichi,JPX ; Ishida Mamoru,JPX ; Kuroda Takahiko,JPX, Semiconductor device and manufacturing method for the same.
  367. Shimizu, Hironobu; Fujimoto, Koji; Horio, Masahiro, Semiconductor device and manufacturing method thereof.
  368. Kikuchi, Hidekazu, Semiconductor device and method for manufacturing.
  369. Yoshizawa Shunichi,JPX, Semiconductor device and method for manufacturing the same.
  370. Yanagida, Toshiharu, Semiconductor device and method of fabricating the same.
  371. Hashimoto Nobuaki,JPX, Semiconductor device and method of making the same, circuit board, and electronic instrument.
  372. Wada, Junichi; Sakata, Atsuko; Katata, Tomio; Usui, Takamasa; Hasunuma, Masahiko; Shibata, Hideki; Kaneko, Hisashi; Hayasaka, Nobuo; Okumura, Katsuya, Semiconductor device and method of manufacturing the same.
  373. Tongbi Jiang, Semiconductor device for attachment to a semiconductor substrate.
  374. Ahn, Hokyun; Mun, Jae Kyoung; Kim, Haecheon, Semiconductor device having T-shaped gate electrode and method of manufacturing the same.
  375. Sasaki Keiichi,JPX ; Kunishima Iwao,JPX, Semiconductor device having WNF film and method of manufacturing such a device.
  376. Aoki, Yutaki; Mihara, Ichiro; Wakabayashi, Takeshi; Watanabe, Katsumi, Semiconductor device having a barrier layer.
  377. Yong, Lois E.; Harper, Peter R.; Tran, Tu Anh; Metz, Jeffrey W.; Leal, George R.; Dinh, Dieu Van, Semiconductor device having a bond pad and method therefor.
  378. Hosomi Eiichi,JPX ; Takubo Chiaki,JPX ; Tazawa Hiroshi,JPX ; Shibasaki Koji,JPX, Semiconductor device having a bump electrode connected to an inner lead.
  379. Kim Seong Jin,KRX, Semiconductor device having a bump structure and test electrode.
  380. Aoki, Yutaka, Semiconductor device having a chip size package including a passive element.
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  428. Owada Nobuo (Ohme JPX) Akimori Hiroyuki (Ohme JPX) Nitta Takahisa (Fuchuu JPX) Kobayashi Tohru (Iruma JPX) Sasabe Shunji (Iruma JPX) Kawaji Mikinori (Hino JPX) Kasahara Osamu (Hinode JPX), Semiconductor integrated circuit device and method of manufacturing the same.
  429. Tokunaga,Shinya; Furuya,Shigeki; Hinatsu,Yuuji, Semiconductor integrated circuit device and method of producing the same.
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  432. Owada Nobuo (Ohme JPX) Oogaya Kaoru (Ohme JPX) Kobayashi Tohru (Iruma JPX) Kawaji Mikinori (Hino JPX), Semiconductor integrated circuit device in which a semiconductor chip is mounted with solder bumps for mounting to a wir.
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  446. Yu Sun-il,KRX ; Kang Woo-tag,KRX, Semiconductor-on-insulator devices having insulating layers therein with self-aligned openings.
  447. Matloubian Mishel (Dallas TX), Sidewall channel stop process.
  448. Flagello Donis G. (Ridgefield CT) Wilczynski Janusz S. (Ossining NY) Witman David F. (Pleasantville NY), Simultaneous multiple level interconnection process.
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  450. Cederbaum Carl (Paris FRX) Chanclou Roland (Perthes FRX) Combes Myriam (Evry FRX) Mone Patrick (Ponthierry FRX), Stacked conductive resistive polysilicon lands in multilevel semiconductor chips.
  451. Ling Peiching (San Jose CA), Structure and fabrication process of inductors on semiconductor chip.
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  453. Lien Chuen-Der, Structure for fabricating a bonding pad having improved adhesion to an underlying structure.
  454. Schroeder Jack A. ; Monroe Conrad S., Structure having flip-chip connected substrates.
  455. Hsu Chen-Chung,TWX, Structure of manufacturing an electrostatic discharge protective circuit for SRAM.
  456. Gaul Stephen Joseph ; Delgado Jose Avelino, Surface mount die by handle replacement.
  457. Schaefer William Jeffrey ; Kao Pai-Hsiang ; Kelkar Nikhil Vishwanath, Surface mount die: wafer level chip-scale package and process for making the same.
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  489. Getselis Arkady (Staten Island NY) Tufano Anthony (North Massapequa NY), Turn knob lampholder.
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  2. Fontana, Jr., Robert E.; Herget, Philipp; O'Sullivan, Eugene J.; Romankiw, Lubomyr T.; Wang, Naigang; Webb, Bucknell C., Inductor with stacked conductors.
  3. Koch, Stefan; Merkle, Thomas, Integrated semiconductor device.
  4. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  5. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  6. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  7. Tang, Yu-Po; Chang, Shih-Ming; Hsieh, Ken-Hsien; Liu, Ru-Gun, Via-free interconnect structure with self-aligned metal line interconnections.
  8. Ho, Dominique; Fouquet, Julie, Widebody coil isolators.
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